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Use of a Bacterial Gene Expression System for Mutation Repairing (umu system) to evaluate Damage in DNA Molecules Resulting from Exposure to an Extra Low Frequency Magnetic Field

Research Project

Project/Area Number 10837015
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field 電磁場環境
Research InstitutionTohoku Gakuin University

Principal Investigator

HAGA Akira  Faculty of Engineering, Tohoku Gakuin University, Professor, 工学部, 教授 (20048820)

Co-Investigator(Kenkyū-buntansha) MATSUKI Hidetoshi  Faculty of Engineering, Tohoku University, Professor, 工学部, 教授 (70134020)
ENDO Ginro  Faculty of Engineering, Tohoku Gakuin University, Professor, 工学部, 教授 (80194033)
Project Period (FY) 1998 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥3,200,000 (Direct Cost: ¥3,200,000)
Fiscal Year 2000: ¥900,000 (Direct Cost: ¥900,000)
Fiscal Year 1999: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 1998: ¥1,300,000 (Direct Cost: ¥1,300,000)
Keywordsumu operon / damage of DNA / extremely low frequency magnetic field / Salmonella typhimirium TA1535 / mutation repairing gene / チフス菌 / 磁界周波数の影響
Research Abstract

Though there are many affirmative or negative reports on affect vicious of extremely low frequency magnetic field (ELFMF) exposure to human body, especially on the effect to oncogenesis, its conclusion has not been reached yet. Cells, which constitute the human body, suffer damage of DNA, and mutation is caused by mutagenic substances or phenomena. It is well known that mutation becomes a direct cause of cancer-developing, and there is a close relation between the oncogenesis of cells and molecular damage of DNA.In a meantime, genetic engineering has been developed remarkably, the experimental technique in DNA analysis has generally been adopted to the many fields of sciences. Therefore the gene level research of the import of the ELFMF exposure to the living cell can also be dove using molecular biological technique. When DNA of bacteria is damaged by some causes, SOS repairing genetic systems, for instance umu operon and recA genes, which intend to restore the damage, are expressed. In this study, the possibility of applying expression system of a SOS regulon by umu assay method, which clarifies the impact of a magnetic field exposure for gene mutation by a damage in DNA molecule, was examined. We exposed bacterium Salmonella typhimurium TA153(pSK1002) (a derivative strain whose pathogenicity was deleted) to ELFMF, and the intensity of the expression of an enzymatic activity of β-galactosidase which is the product of lacZ gene located downstream of the umu SOS gene operon, was examined by umu assay method with a non-exposure control. The experimental results showed that the umu assay could be effectively applied to the evaluation of damage in DNA molecules by exposure to an ELFMF.However, no significant differences were observed in the umu gene expression intensity under experimental condition.

Report

(4 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • 1998 Annual Research Report
  • Research Products

    (9 results)

All Other

All Publications (9 results)

  • [Publications] 芳賀昭,遠藤銀朗,塩谷和輝,松木英敏: "細菌の突然変異修復遺伝子発現システム(umuシステム)を用いた極低周波磁界によるDNA損傷の評価、"日本応用磁気学会誌. 23. 2018-2022 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] A.Haga,Y.Kumagai G.Endou:: "Use of a Bacterial Gene Expression System for Mutation Repairing (umu System) to Evaluate Damage in DNA Molecules Resulting from Exposure to extremely Low Frequency Magnetic Field"European Symmposium on Electromagnetic Compatibility Proceedings. 35-40 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Akira Haga, Ginro Endo, , Kazuki Shioya, and Hidetoshi Matsuki: "Use of a Bacterial Gene Expression System for Mutation Repairing (umu system) to evaluate Damage in DNA Molecules Resulting from Exposure to an extremely Low Frequency Magnetic Field"Journal of the Magnetics Society of Japan. Vol.23, No.2. 2018-2022 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Akira Haga, Yasushi Kumagai, Ginro Endou: "Use of a Bacterial Gene Expression System for Mutation Repairing (umu System) to Evaluate Damage in DNA Molecules Resulting from Exposure to extremely Low Frequency Magnetic Field"European Symmposium on Electromagnetic Compatibility Proceedings. 35-40 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Akira Haga,Yasushi Kumagai,Ginro Endou: "Use of a Bacterial Gene Expression System for Mutation Repairing (umu System) to Evaluate Damage in DNA Molecules Resulting from Exposure to extremely Low Frequency Magnetic Field,"European Symmposium on Electromagnetic Compatibility Proceedings. 35-40 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 芳賀 昭 他3名: "細菌の突然変異修復遺伝子発現システム(umuシステム)を用いた極低周波磁界によるDNA損傷の評価"日本応用磁気学会誌. Vol.23,No.10. 2018-2022 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 芳賀昭 他 3名: "umu assyを用いた低周波磁界曝露による突然変異誘発に関する研究" 電気関係学東北支部連合大会講演論文集. 179 (1988)

    • Related Report
      1998 Annual Research Report
  • [Publications] 芳賀昭 他3名: "細菌の突然変異修復遺伝子発現システム(umuシステム)を用いた低周波磁界によるDNA損傷の評価" 電気学会マグネティックス研究会. 47-52 (1988)

    • Related Report
      1998 Annual Research Report
  • [Publications] 芳賀昭 他 3名: "umu asyを用いた低周波磁界曝露によるDNA損傷の評価" 〓北大学電気通信研究所スピニクス研究会. 25 (1998)

    • Related Report
      1998 Annual Research Report

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Published: 1998-04-01   Modified: 2016-04-21  

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