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MATERIAL SCIENCE AND APPLICATION OF ALLOY NITRIC SEMICONDUCTORS

Research Project

Project/Area Number 11102005
Research Category

Grant-in-Aid for Specially Promoted Research

Allocation TypeSingle-year Grants
Review Section Physics
Research InstitutionTOKUSHIMA UNIVERSITY

Principal Investigator

SAKAI Shiro  TOKUSHIMA UNIVERSITY, FACULTY OF ENGINEERING, PROFESSOR, 工学部, 教授 (20135411)

Co-Investigator(Kenkyū-buntansha) NISHINO Katsushi  TOKUSHIMA UNIVERSITY, FACULTY OF ENGINEERING, LECTURER, 工学部, 講師 (70284312)
NAOI Yoshiki  TOKUSHIMA UNIVERSITY, FACULTY OF ENGINEERING, ASSOCIATE PROFESSOR, 工学部, 助教授 (90253228)
中島 貞之丞  徳島大学, 工学部, 講師 (20207781)
LIU Yuhuai  S?VBL, 非常勤研究員
LACROIX Yves  徳島大学, 窒化物半導体研究所, 非常勤研究員
TOA Wang  サテライト・ベンチャー・ビジネス・ラボラトリー, 非常勤研究員
MOHAMED Lachab  サテライト・ベンチャー・ビジネス・ラボラトリー, 非常勤研究員
Project Period (FY) 1999 – 2003
Project Status Completed (Fiscal Year 2003)
Budget Amount *help
¥233,600,000 (Direct Cost: ¥224,000,000、Indirect Cost: ¥9,600,000)
Fiscal Year 2003: ¥11,700,000 (Direct Cost: ¥9,000,000、Indirect Cost: ¥2,700,000)
Fiscal Year 2002: ¥11,700,000 (Direct Cost: ¥9,000,000、Indirect Cost: ¥2,700,000)
Fiscal Year 2001: ¥18,200,000 (Direct Cost: ¥14,000,000、Indirect Cost: ¥4,200,000)
Fiscal Year 2000: ¥45,000,000 (Direct Cost: ¥45,000,000)
Fiscal Year 1999: ¥147,000,000 (Direct Cost: ¥147,000,000)
KeywordsInNAs / Nitride / Narrow gap semiconductor / MOCVD / Plasma / Wide gap semiconductor / GaN / Material properties / 窒化III-V族混晶
Research Abstract

Among III-V group, Nitrogen that is included in the second rank in the periodic table and the rest of the group V elements can produce special features. Purposes of this research are the growth of III-V-nitride and the method of utilizing this structure.
A GaNP grown on sapphire is a good example, and it is the method that utilizes this porosity. The dislocation dies when they meet the other one and the total dislocation is the sum of the alive. The dislocation in the grown films can be minimized and can be as low as 10^8 cm^2. Using this approach, AlGaInN LEDs with 3 % and 6 % external efficacy are obtained for 365 nm and 370 nm wavelengths, respectively.
If we consider the same approach to AlN, a bad thing can happen. The AlN is three dimensional growth modes and it cannot ridge grow. AlN can be grown under AlN/Al. By doing this, the 340 nm LEDs is developed.
As long wavelength application, we considered In(As, Sb)N. A temperature used for the growth is not so good for NH_3, we used di-methly-hydrazine. As a precaution, we grow cubic GaN and InN on GaAs. InNAs was found to shrinks with its bang gap energy with the N elements by FTIR. InNSb is more difficult due to the difference in Sb and N.

Report

(6 results)
  • 2003 Annual Research Report   Final Research Report Summary
  • 2002 Annual Research Report
  • 2001 Annual Research Report
  • 2000 Annual Research Report
  • 1999 Annual Research Report
  • Research Products

    (149 results)

All Other

All Publications (149 results)

  • [Publications] Kazunori Aoyama: "A Novel Method of Building Compositional Non-Uniformity in an InGaN Layer Grown on Sapphire Substrate by Metalorganic Chemical Vapor Deposition"Jpn.J.Appl.Phys. Part2. 42・3B. L270-L272 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Hiroyuki Naoi: "Growth of InAs on GaAs(100) by low-pressure metalorganic chemical vapor deposition employing in situ generated arsine radicals"Journal of Crystal Growth. 250. 290-297 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Jin-Ping AO: "AlGaN/GaN High Electron Mobility Transistor with Thin Buffer Layers"Jpn.J.Appl.Phys. Part1. 42・4A. 1588-1589 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] H.D.Li: "Interactions between inversion domains and InGaN/GaN multiple quantum wells investigated by transmission electron microscopy"Journal of Crystal Growth. 247. 28-34 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "GaN growth using a low-temperature GaNP buffer on sapphire by metalorganic chemical vapor deposition"Applied Physics Letter. 82・6. 919-921 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "Dislocation reduction in GaN layer by introducing GaN-rich GaNP intermediate layers"Jpn.J.Appl.Phys.. 42・4A. 1514-1516 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] K.Nishino: "Effects of Surface Nitridation of Sapphire on MOCVD-AIN"First Asia-Pacific Workshop on Widegap Semiconductors. P104. 248 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Jin-Ping Ao: "Investigation of Copper Schottky Contact on n-GaN Grown on Sapphire Substrate"First Asia-Pacific Workshop on Widegap Semiconductors. P108. 258 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] H.X.Wang: "Effect of barrier composition symmetrization on emission mechanism of light emitting diode with single quantum well active layer"First Asia-Pacific Workshop on Widegap Semiconductors. Tdv03. 199 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Hisao Sato: "High efficiency AlGaInN-based light-emitting diode in 360-380nm wavelength"phys.stat.sol.(a). 200,No.1. 102-105 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Young-Bae Lee: "High efficiency GaN light-emitting diode with high resistance p-pad region using plasma su treatment"phys.stat.sol.(a). 200,No.1. 87-90 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] I.L.Maksimov: "Cracks and dislocation structures in AlGaN systems"phys.stat.sol.(c). 0 No.7. 2432-2435 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Y.Naoi: "Growth and evaluation of GaN with SiN interlayer by MOCVD"The Fifth International Conference on Nitride Semiconductors. 2077-2081 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Kazunori Aoyama: "MOCVD growth of InGaN with an artificial compositional distribution"The Fifth International Conference on Nitride Semiconductors. 223 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "The influence of a low temperature GaNP buffer on GaN growth by metalorganic chemical vapor deposotion"phys.stat.sol.(c). 0 No.7. 2757-2760 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "XPS MEASUREMENT OF InNAs"The Fifth International Conference on Nitride Semiconductors. 487 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] R.Aleksiejunas: "Determination of free carrier bipolar diffusion coefficient and surface recombination velocity of undoped GaN epilayer"APPLIEDPHYSICSLETTERS. 83,6. 1159-1159 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] J.Vaitkus: "Semi-insulating GaN and its evaluation for particle detection"Nuclear Instruments and Methods in Physics Research Section A. 509,1. 60-64 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] J.Vaitkus: "Space charge effects, carrier capture transient behaviour and particle detection in semi-insulating GaN"Nuclear Instruments and Methods in Physics Research Section A. 514,1. 141-145 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] J.P.Ao: "Copper gate AlGaN/GaN HEMT with low gate leakage current"IEEE Electron Device Letters. 24,8. 500-502 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] A.Sasakia: "Radiative carrier recombination dependent on temperature and well width of InGaN/GaN single quantum well"Solid State Communications. 129. 31-35 (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Kazunori Aoyama: "A Novel Method of Building Compositional Non-Uniformity in an InGaN Layer Grown on Sapphire Substrate by Metalorganic Chemical Vapor Deposition"Jpn.J.Appl.Phys.. Part2, 423B. L270-L272 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Hiroyuki Naoi: "Growth of InAs on GaAs (100) by low-pressure metalorganic chemical vapor deposition employing in situ generated arsine radicals"Journal of Crystal Growth. 260. 290-297 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Jin-Ping AO: "AlGaN/GaN High Electron Mobility Transistor with Thin Buffer Layers"Jpn.J.Appl.Phys.. Part1, 424A. 1588-1589 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] H.D.Li: "Interactions between inversion domains and InGaN/GaN multiple quantum wells investigated by transmission electron microscopy"Journal of Crystal Growth. 247. 28-34 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "GaN growth using a low-temperature GaNP buffer on sapphire by metalorganic chemical vapor deposition"Applied Physics Letter. 82・6. 919-921 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "Dislocation reduction in GaN layer by introducing GaN-rich GaNP intermediate layers"Jpn.J.Appl.Phys.. 424A. 1514-1516 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] K.Nishino: "Effects of Surface Nitridation of Sapphire on MOCVD-AlN"First Asia-Pacific Workshop on Widegap Semiconductors. P104. 248 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Jin-Ping Ao: "Investigation of Copper Schottky Contact on n-GaN Grown on Sapphire Substrate"First Asia-Pacific Workshop on Widegap Semiconductors. P108. 258 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] H.X.Wang: "Effect of barrier composition symmetrization on emission mechanism of light emitting diode with single quantum well active layer"First Asia-Pacific Workshop on Widegap Semiconductors. Tdv03. 199 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Hisao Sato: "High efficiency AlGaInN-based light-emitting diode in 360-380 nm wavelength"phys.stat.sol.(a). 200, No.1. 102-105 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Young-Bae Lee: "High efficiency GaN light-emitting diode with high resistance p-pad region using plasma surface treatment"phys.stat.sol.(a). 200, No.1. 87-90 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] I.L.Maksimov: "Cracks and dislocation structures in AlGaN Systems"phys.stat.sol.(c). 0 No.7. 2432-2435 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Y.Naoi: "Growth and evaluation of GaN with SiN interlayer by MOCVD"The Fifth International Conference on Nitride Semiconductors. 2077-2081 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Kazunori Aoyama: "MOCVD growth of InGaN with an artificial compositional distribution"The Fifth International Conference on Nitride Semiconductors. 223 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "The influence of a low temperature GaNP buffer on GaN growth by metalorganic chemical vapor deposotion"phys.stat.sol.(c). 0 No.7. 2757-2760 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Tsukihara: "XPS MEASUREMENT OF InNAs"The Fifth International Conference on Nitride Semiconductors. 487 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] R.Aleksiejunas: "Determination of free carrier bipolar diffusion coefficient and surface recombination velocity of undoped GaN epilayer"APPLIEDPHYSICSLETTERS. 83,6. 1159-1159 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] J.Vaitkus: "Semi-insulating GaN and its evaluation for particle detection"Nuclear Instruments and Methods in Physics Research Section A. 509,1. 60-64 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] J.Vaitkus: "Space charge effects, carrier capture transient behaviour and particle detection in semi-insulating GaN"Nuclear Instruments and Methods in Physics Research Section A. 514,1. 141-145 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] J.P.Ao: "Copper gate AlGaN/GaN HEMT with low gate leakage current"IEEE Electron Device Letters. 24,8. 500-502 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] A.Sasakia: "Radiative carrier recombination dependent on temperature and well width of InGaN/GaN single quantum well"Solid State Communications. 129. 31-35 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Kazunori Aoyama: "A Novel Method of Building Compositional Non-Uniformity in an InGaN Layer Grown on Sapphire Substrate by Metalorganic Chemical Vapor Deposition"Jpn.J.Appl.Phys.Part2. 42・3B. L270-L272 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hiroyuki Naoi: "Growth of InAs on GaAs(1 0 0) by low-pressure metalorganic chemical vapor deposition employing in situ generated arsine radicals"Journal of Crystal Growth. 250. 290-297 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Jin-Ping AO: "AlGaN/GaN High Electron Mobility Transistor with Thin Buffer Layers"Jpn.J.Appl.Phys.Part 1. 42・4A. 1588-1589 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] H.D.Li: "Interactions between inversion domains and InGaN/GaN multiple quantum wells investigated by transmission electron microscopy"Journal of Crystal Growth. 247. 28-34 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Tsukihara: "GaN growth using a low-temperature GaNP buffer on sapphire by metalorganic chemical vapor deposition"Applied Physics Letter. 82・6. 919-921 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Tsukihara: "Dislocation reduction in GaN layer by introducing GaN-rich GaNP intermediate layers"Jpn.J.Appl.Phys.. 42・4A. 1514-1516 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] K.Nishino: "Effects of Surface Nitridation of Sapphire on MOCVD-AlN"First Asia-Pacific Workshop on Widegap Semiconductors. P104. 248 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Jin-Ping Ao: "Investigation of Copper Schottky Contact on n-GaN Grown on Sapphire Substrate"First Asia-Pacific Workshop on Widegap Semiconductors. P108. 258 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] H.X.Wang: "Effect of barrier composition symmetrization on emission mechanism of light emitting diode with single quantum well active layer"First Asia-Pacific Workshop on Widegap Semiconductors. Tdv03. 199 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hisao Sato: "High efficiency AlGaInN-based light-emitting diode in 360-380 nm wavelength"phys.stat.sol.(a). 200, No.1. 102-105 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Young-Bae Lee: "High efficiency GaN light-emitting diode with high resistance p-pad region using plasma su treatment"phys.stat.sol.(a). 200, No.1. 87-90 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] L.L.Maksimov: "Cracks and dislocation structures in AlGaN systems"phys.stat.sol.(c). 0 No.7. 2432-2435 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Y.Naoi: "Growth and evaluation of GaN with SiN interlayer by MOCVD"The Fifth International Conference on Nitride Semiconductors. 2077-2081 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Kazunori Aoyama: "MOCVD growth of InGaN with an artificial compositional distribution"The Fifth International Conference on Nitride Semiconductors. 223 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Tsukihara: "The influence of a low temperature GaNP buffer on GaN growth by metalorganic chemical vapor deposotion"phys.stat.sol.(c). 0 No.7. 2757-2760 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Tsukihara: "XPS MEASUREMENT OF InNAs"The Fifth International Conference on Nitride Semiconductors. 487 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] R.Aleksiejunas: "Determination of free carrier bipolar diffusion coefficient and surface recombination velocity of undoped GaN epilayer"APPLIEDPHYSICSLETTERS. 83, 6. 1159-11159 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] J.Vaitkus: "Semi-insulating GaN and its evaluation for particle detection"Nuclear Instruments and Methods in Physics Research Section A. 509, 1. 60-64 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] J.Vaitkus: "Space charge effects, carrier capture transient behaviour and particle detection in semi-insulating GaN"Nuclear Instruments and Methods in Physics Research Section A. 514, 1. 141-145 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] J.P.Ao: "Copper gate AlGaN/GaN HEMT with low gate leakage current"IEEE Electron Device Letters. 24, 8. 500-502 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] A.Sasakia: "Radiative carrier recombination dependent on temperature and well width of InGaN/GaN single quantum well"Solid State Communications. 129. 31-35 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] H.X.Wang: "Influence of rotation speed of substrate on the growth mechanism of InGaN/GaN multiple quantum wells grown by six-wafer metal organic chemical vapor deposition system"J. Crystal Growth. 235. 177-182 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.X.Wang: "The development of a novel three-flow six-wafer reactor of metal-organic chemical vapor deposition system for GaN-based structure"J. Cryst. Growth. 235. 173-176 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 塩島: "金属/p-GaN電極界面の電流輸送機構の理解"応用物理. 71・3. 340-341 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.D.Li: "V-Shaped Defects in AlGaN/GaN Superlattices Grown on Thin Undoped-GaN Layers on Sapphire Substrate"Jpn. J. Appl. Phys. Part2. 41・6B. L732-L735 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Young-Bae Lee: "High-Performance 348 nm AlGaN/GaN-Based Ultraviolet-Light-Emitting Diode with a SiN Buffer Layer"Jpn. J. Appl. Phys. Part1. 41・7A. 4450-4453 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Young-Bae Lee: "Fabrication of High-Output-Power AlGaN/GaN-Based UV-Light-Emitting Diode Using a Ga Droplet Layer"Jpn. J. Appl. Phys. Part2. 41・10A. L1037-L1039 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Wang: "1 mW AlInGaN-based untraviolet light-emitting diode with an emission wavelenght of 348 nm grown on sapphire substrate"Appl. Phys. Lett.. 81・14. 2508-2510 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Jie Bai: "Influence of Pyramidal Defects on Photoluminescence of Mg-doped AlGaN/GaN Superlattice Structures"Jpn. J. Appl. Phys. Part1. 41・10. 5909-5911 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.D.Li: "Dislocation Reduction in GaN Epilayers Grown on a GaNP Buffer on Sapphire Substrate by Metalorganic Chemical Vapor Deposition"Jpn. J. Appl. Phys. Part2. 41・11B. L1332-L1335 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Sawada: "Characterization of metal/GaN Schottky interfaces based on I-V-T characteristics"Applied Surface Science. 190. 326-329 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Kenji Shiojima: "ICTS measurement for p-GaN Schottky contacts"Applied Surface Science. 190. 318-321 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Katsushi Nishino: "Bulk GaN growth by direct synthesis method"Journal of Crystal Growth. 237-239. 922-925 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Jin-Ping Ao: "Monolithic Blue LED Series Arrays for High-Voltage AC Operation"physica status solidi (a). 194・2. 376-379 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Kazunori Aoyama: "A Novel Method of Building Compositional Non-Uniformity in an InGaN Layer Grown on Sapphire Substrate by Metalorganic Chemical Vapor Deposition"Jpn. J. Appl. Phys. Part2. 42・3B. L270-L272 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] Hiroyuki Naoi: "Growth of InAs on GaAs(100) by low-pressure metalorganic chemical vapor deposition employing in situ generated arsine radicals"Journal of Crystal Growth. 250. 290-297 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] Jin-Ping AO: "AlGaN/GaN High Electron Mobility Transistor with Thin Buffer Layers"Jpn. J. Appl. Phys. Part1. 42・4A(4月号掲載予定). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.D.Li: "Interactions between inversion domains and InGaN/Gan multiple quantum wells investigated by transmission electron microscopy"Journal of Crystal Growth. 247. 28-34 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Tsukihara: "GaN growth using a low-temperature GaNP buffer on sapphire by metalorganic chemical vapor deposition"Applied Physics Letter. 82・6. 919-921 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Tsukihara: "Dislocation reduction in GaN layer by introducing GaN-rich GaNP intermediate layers"Jpn. J. Appl. Phys.. 42・4A(4月号掲載予定). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] S.Sakai: "Efficient AlGaInN-based UV-LEDs in 350-370 nm wavelength(Invited)"1st Photonic Semiconductor Industrial Technology Workshop. (2002)

    • Related Report
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  • [Publications] Jin-Ping Ao: "Monolithic Blue LED Series Arrays for High-Voltage AC Operation"The international workshop on Nitride Semiconductors. (2002)

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      2002 Annual Research Report
  • [Publications] K.Nishino: "Effects of Surface Nitridation of Sapphire on MOCVD-AIN"First Asia-Pacific Workshop on Widegap Semiconductors. P104. 248 (2003)

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  • [Publications] Jin-Ping Ao: "Investigation of Copper Schottky Contact on n-GaN Grown on Sapphire Substrate"First Asia-Pacific Workshop on Widegap Semiconductors. P108. 258 (2003)

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  • [Publications] H.X.Wang: "Effect of barrier composition symmetrization on emission mechanism of light emitting diode with single quantum well active layer"First Asia-Pacific Workshop on Widegap Semiconductors. Tdv03. 199 (2003)

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  • [Publications] Hisao Sato: "High efficiency AlGaInN-based light-emitting diode in 360-380 nm wavelength"The Fifth International Conference on Nitride Semiconductors. (発表予定). (2003)

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  • [Publications] Young-Bae Lee: "High efficiency GaN light-emitting diode with high resistance p-pad region using plasma surface treatment"The Fifth International Conference on Nitride Semiconductors. (発表予定). (2003)

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  • [Publications] I.L.Maksimov: "Cracks and dislocation structures in AlGaN systems"The Fifth International Conference on Nitride Semiconductors. (発表予定). (2003)

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  • [Publications] T.Tada: "Growth and evaluation of GaN with SiN interlayer by MOCVD"The Fifth International Conference on Nitride Semiconductors. (発表予定). (2003)

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  • [Publications] Kazunori Aoyama: "MOCVD growth of InGaN with an artificial compositional distribution"The Fifth International Conference on Nitride Semiconductors. (発表予定). (2003)

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  • [Publications] M.Tsukihara: "Cathodoluminescence and TEM study of GaN films grown with GaNP buffer layer by MOCVD"The Fifth International Conference on Nitride Semiconductors. (発表予定). (2003)

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  • [Publications] M.Tsukihara: "XPS MEASUREMENT OF InNAs"The Fifth International Conference on Nitride Semiconductors. (発表予定). (2003)

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  • [Publications] H.Naoi: "Growth of InNAs by low pressure metalorganic chemical vapor deposition employing microwave-cracked nitrogen and in-situ generated arsine radicals"J.Crystal Growth. 222. 511-517 (2001)

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  • [Publications] H.X.Wang: "Influence of carrier gas on the morphology and structure of GaN layers grown on sapphire substrate by six-wafer metal organic chemical vapor deposition system"J.Cryst.Growth. 233. 681-686 (2001)

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  • [Publications] J.Bai: "(0001) oriented GaN epilayer grown on (11-20) sapphire by MOCVD"Journal of Crystal Growth. 231. 41-47 (2001)

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  • [Publications] J.Bai: "Photoluminescence study on InGaN/GaN quantum-well structure grown on (11-20) sapphire substrate"Jpn.J.Appl.Phys.. 40,Part 1,No.7. 4445-4449 (2001)

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  • [Publications] J.Bai: "Investigation of the strain-relaxation in InGaN/GaN multiple-quantum-well structures"J.Appl.Phys.. 90 4. 1740-1744 (2001)

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  • [Publications] J.Bai: "A Study of dislocations in InGaN/GaN multiple-quantum-well structure grownon (11-20) sapphire substrate"Journal of Crystal Growth. 223. 61-68 (2001)

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  • [Publications] J.J.Harris: "Relationship between classical and quantum lifetimes in AlGaN/GaN heterostructures"Semiconductor Science and Technology. 16. 402-405 (2001)

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  • [Publications] J.J.Harris: "Phase giagram for the quantum Hall effect in a high-mobility AlGaN/GaN heterostructure"J.Phys.:Condens.Matter. 13. L175-L181 (2001)

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  • [Publications] Lacroix Y: "Cracking of GaN on sapphire from etch-process-induced nonuniformity in residual thermal stress"J APPL PHYS. 89 11. 6033-6036 (2001)

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  • [Publications] Lee KJ: "Investigation of phonon emission processes in an AlGaN/GaN heterostructure at low temperatures"APPL PHYS LETT. 78 19. 2893-2895 (2001)

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  • [Publications] T.Wang: "Influence of InGaN/GaN quantum-well structure on the performance of light-emitting diodes and laser diodes grown on sapphire substrate"Journal of Crystal Growth. 224. 5-10 (2001)

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  • [Publications] T.Wang: "Modulation-doping influence on the photoluminescence from the two-dimensional electron gas of AlGaN/GaN heterostructures"Phys.Rev.B. 63. 205320 (2001)

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  • [Publications] T.Wang: "Investigation of the emission mechanism in InGaN/GaN-based light-emitting diodes"Appl.Phys.Lett. 78 18. 2617-2619 (2001)

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  • [Publications] J.Bai: "Study of the strain relaxation in InGaN/GaN multiple quantum well atructures"J.Appl.Phys.. 90 4. 1740-1744 (2001)

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  • [Publications] T.Wang: "A HIGH OUTPUT POWER AlGaN/GaN-BASED ULTRA-VIOLET LIGHT-EMITTING DIODES WITH A 350nm EMISSION LENGTH"J.Crystal Growth. 235. 177-182 (2001)

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  • [Publications] T.Wang: "A new method for a great reduction of dislocation density in a GaN layer on a sapphire substrate"J.Crystal Growth. 213. 188-192 (2000)

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  • [Publications] T.Wang: "The influence of buffer layer and growth temperature on the quality of undoped GaN layer grown on sapphire substrate by MOCVD"Appl.Phys.Lett. 76・16. 2220-2222 (2000)

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  • [Publications] T.Wang: "Magneto-transport studies of AlGaN/GaN heterostructures grown on sapphire substrates : Effective mass and scattering time"Appl.Phys.Lett. 76・19. 1-3 (2000)

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  • [Publications] T.Wang: "Effect of silicon-doping on the optical and transport properties of InGaN/GaN multiple quantum well structures"Appl.Phys.Lett. 76・13. 1737-1739 (2000)

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  • [Publications] S.H.Chung: "The effect of oxygen on the activation of Mg acceptor in GaN epilayers grown by MOCVD"Jpn.J.Appl.Phys.. 39・8. 4749-4750 (2000)

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  • [Publications] R.S.Qhalid Fareed: "Structural studies on MOCVD grown GaN and AlGaN using atomic force microscopy"Mater.Chem.& Phys. 64. 260-264 (2000)

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  • [Publications] M.Lachab: "Selective Fabrication of InGaN Nanostructures by the Focused Ion Beam/Metalorganic Chemical Vapor Deposition Process"J.Appl.Phys.. 87・2. 1374-1378 (2000)

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  • [Publications] M.Lachab: "Characterization of Mg-doped GaN Grown by Metaloragnic Chemical Vapor deposition"Solid State Electr. 44. 1669-1677 (2000)

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  • [Publications] D.Basak: "Reactive ion etching of GaN using BCl3, BCl3/Ar and BCl3/N2 gas plasmas"Solid-state Electronics. 44. 725-728 (2000)

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  • [Publications] D.Basak: "Characterization of RIE etched surface of GaN using methane gas with chlorine plasma"J.Vac.Sci.Technol.B. 18・5. 2491-2494 (2000)

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  • [Publications] H.Naoi,: "Heteroepitaxial growth of InAs by low-pressure metalorganic chemical vapor deposition employing in situ generated arsine radicals"Journal of Crystal Growth. 219. 481-484 (2000)

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  • [Publications] J.Bai: "Influence of the quantum-well thickness on the radiative recombination of InGaN/GaN quantum well structures"J.Apl.Phys.. 88・8. 4729-4733 (2000)

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  • [Publications] S.Sakai: "A New Method of Reducing Dislocation Density in GaN Layer Grown on Sapphire Substrate by MOVPE"J.Crystal Growth. 221. 334-337 (2000)

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  • [Publications] 酒井: "LEDの動作原理と材料"デスプレイアンドイメージング. 8. 103-113 (2000)

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  • [Publications] S.Juodkazis: "Annealing of GaN-InGaN multi-quantum wells : Correlation between the bandgap and yellow photoluminescence"Jpn.J.Appl.Phys.. 39・2A. 393-396 (2000)

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  • [Publications] 酒井: "GaN系結晶のバルクおよびエピタキシャル成長"日本結晶成長学会誌. 27・4. 194-202 (2000)

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  • [Publications] Y.Yamada: "Optical properties of bound excitons and biexcitons in GaN (Invited)"IEICE Trans.Electron.. E83-C,No.4. 605-611 (2000)

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  • [Publications] T.Sugahara: "Role of dislocation in InGaN/GaN quantum wells grown on bulk GaN and sapphire substrates (Invited)"IEICE Trans.Electron.. E83-C,No.4. 598-604 (2000)

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  • [Publications] T.Sawada: "Electrical properties of metal/GaN and SiO2/GaN interfaces and effects of thermal annealing"Appl.Surface Sci.. 159-160. 449-455 (2000)

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  • [Publications] S.Sakai: "Indium silicon co-doping in AlGaN/GaN multiple quantum wells"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 637-639 (2000)

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  • [Publications] Y.Lacroix: "In-Situ Etch-Layer Monitoring of GaN Based Laser Diode Structure"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 782-785 (2000)

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  • [Publications] T.Wang: "The Investigation on the Emission Mechanism of InGaN/GaN Quantum Well Structure"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 524-527 (2000)

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  • [Publications] T.Sawada: "Influence of Inhomogeneous Barrier on I-V Characteristics of Metal/GaN Schottky Diode"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 801-804 (2000)

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  • [Publications] Y.Lacroix: "Cracking of GaN on Sapphire from Induced Non-Uniformity in Residual Stress"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 479-481 (2000)

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  • [Publications] T.Wang: "Comparison of the Optical Properties in InGaN/GaN Quantum Well Structures Grown on (0001) and (11-20) Sapphire Substrates"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 382-385 (2000)

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  • [Publications] K.Shiojima: "Large Schottky Barriers and Memory Capability for Ni Contacts Formed on Low Mg-Doped p-GaN"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 829-832 (2000)

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  • [Publications] Y.Nakanishi: "Photoluminescence Properties of Eu-doped GaN by Ion Implantation"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 486-489 (2000)

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  • [Publications] H.X.Wang: "The Influence of the Low-Temperature Buffer-Layer on Substrate-Induced Biaxial Compressive Stress in a GaN Film on a Sapphire Substrate"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 144-146 (2000)

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  • [Publications] S.Nakajima: "Electronic Structures of GaNP and InNAs Ordered Alloys Calculated by the Pseudopotential Method"IPAP Conf.Ser., Proc.Of Int.Conf.On Nitride Semiconductors. 1. 441-443 (2000)

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  • [Publications] J J Harris: "Phase diagram for the quantum Hall effect in a high mobility GaN/AlGaN heterojunction"J Phys Cond.Matt. 13. L1-L6 (2001)

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      2000 Annual Research Report
  • [Publications] K W Lee: "Investigation of phonon emission processes in an AlGaN/GaN heterostructureat low temperature"Appl.Phys.Lett. (in press). (2001)

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      2000 Annual Research Report
  • [Publications] K W Lee: "Relationship between classical and quantum lifetimes in AlGaN/GaN heterojunctions"Semicond Sci Technol. (in press). (2001)

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      2000 Annual Research Report
  • [Publications] 酒井 他: "III族窒化物半導体"倍風館. 313 (1999)

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  • [Publications] S.Sakai, et al.: "Comparison of InGaN/GaN QWs grown on sapphire and bulk GaN substrates"Physica status solidi(b). 216. 273-277 (1999)

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      1999 Annual Research Report
  • [Publications] S.Sakai, et al.: "Optical investigation of InGaN/GaN multiple quantum wells"Appl.Phys.Lett. 74. 3128-3130 (1999)

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      1999 Annual Research Report
  • [Publications] S.Sakai, et al.: "Investigation of optical properties in InGaN/GaN mutiple quantum well and single quantum well"Physica status solidi(b). 216. 279-285 (1999)

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      1999 Annual Research Report
  • [Publications] S.Sakai, et al.: "Effect of Reactive Ion Etching of Yellow Luminescence of GaN"Appl.Phys.Lett.. 75. 3710-3712 (1999)

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      1999 Annual Research Report
  • [Publications] S.Sakai, et al.: "Infra-red properties of bulk GaN"Appl.Phys.Lett. 74. 2788-2790 (1999)

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      1999 Annual Research Report
  • [Publications] S.Sakai, et al.: "Surface morphology studies on sublimation grown GaN by atomic force microscopy"J.Crystal Growth. 200. 348-352 (1999)

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  • [Publications] 酒井、他: "III族窒化物半導体"倍風館. 313 (1999)

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      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2018-03-28  

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