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超高分解能原子間力プローブ法による原子の力学的分光と制御

Research Project

Project/Area Number 11226204
Research Category

Grant-in-Aid for Scientific Research on Priority Areas

Allocation TypeSingle-year Grants
Review Section Science and Engineering
Research InstitutionOsaka University

Principal Investigator

森田 清三  大阪大学, 大学院・工学研究科, 教授 (50091757)

Co-Investigator(Kenkyū-buntansha) 菅原 康弘  大阪大学, 大学院・工学研究科, 教授 (40206404)
富取 正彦 (冨取 正彦)  北陸先端科学技術大学院大学, 材料科学研究科, 助教授 (10188790)
武笠 幸一  北海道大学, 大学院・工学研究科, 教授 (00001280)
西 竜治  大阪大学, 大学院・工学研究科, 助手 (40243183)
Project Period (FY) 1999 – 2002
Project Status Completed (Fiscal Year 2002)
Budget Amount *help
¥182,600,000 (Direct Cost: ¥182,600,000)
Fiscal Year 2002: ¥32,900,000 (Direct Cost: ¥32,900,000)
Fiscal Year 2001: ¥45,500,000 (Direct Cost: ¥45,500,000)
Fiscal Year 2000: ¥51,000,000 (Direct Cost: ¥51,000,000)
Fiscal Year 1999: ¥53,200,000 (Direct Cost: ¥53,200,000)
Keywords非接触原子間力顕微鏡 / 原子分解能 / 原子の力学的識別 / 原子の力学的操作 / ダンピングエネルギー / ピラーの形成 / 磁気相互作用力 / 交換相互作用力顕微法 / 原子間力顕微鏡 / 非接触 / 原子間力の判別 / 原子の力学的同定 / 交換力顕微法 / 原子位置の力学的制御 / 極低温 / 原子間力 / 原子間力分光 / フォース・マッピング / 探針先鋭化 / 探針清浄化
Research Abstract

1)Si/Sn混在表面での原子の力学的識別:相分離したγ-Sn/Si(111)-(【square root】3x【square root】3)R30°モザイク相とSi_xSn_<1-x>/Si(111)7x7相で、混在するSi原子とSn原子の力学的識別に成功した。
2)si(111)【square root】3×【square root】3-AgIET構造のAg原子直接画化:熱揺らぎの無い極低温非接触AFM測定ではAg原子が直接画像化可能との理論班の予言を実証した。
3)Ge原子の力学的垂直引き抜き・水平移動:Ge(111)C(2x8)表面でGe原子の力学的垂直および水平原子操作に成功した。
4)Siアダトム欠陥の修理:Si(111)7x7表面で、Siアダトム原子の力学的垂直引き抜き後、その欠陥の力学的修理に成功した。
5)ケルビンプローブ力顕微鏡による原子識別:清浄なSi探針で測定したSi(111)5【square root】3×5【square root】3-Sb接触電位差(CPD)像でSiとSb原子の識別に成功した。
6)ダンピングエネルギーの解析:Si(111)やGe蒸着した試料で、ダンピングエネルギー(DA)像を得、探針-試料間距離変化を調べた。探針-試料間電圧に対する応答も調べ、DAの変化が探針試料間容量振動の変位電流によるジュール発熱が一因であると結論した。
7)深針先端へのピラー形成:高分解能像を得るためにSi探針先端に突起を形成した。SEMの電子ビームをSi探針に照射して炭素ピラーを形成し、またSiピラーの形成条件を探った。
8)磁気相互作用力の原子分解能測定:スピン分解能を持つ新しい交換相互作用力顕微法の確立を目的とし、磁性体探針による反強磁性体表面のNC-AFM観察を行い、原子分解能で磁気相互作用力の測定が可能であることを実験的に示した。
9)磁気的相互作用力の性質の理論的解明:ab initio計算を用いた理論的研究を行い、強磁性体探針と反強磁性体表面との間に働く磁気的相互作用力の性質を明らかにした。

Report

(4 results)
  • 2002 Annual Research Report
  • 2001 Annual Research Report
  • 2000 Annual Research Report
  • 1999 Annual Research Report
  • Research Products

    (105 results)

All Other

All Publications (105 results)

  • [Publications] H.Matsumoto et al.: "Restoration of Scanning Tounneling Microscopy Images by means of Two-Dimensional Maximun Entropy Method"Jpn.J.Appl.Phys.. Vol.41, No.5A. 3092-3098 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Gauthier et al.: "Interplay between nonlinearity, scan speed, damping, and electronics in freqiuency modulation atomic force microscopy"Phys. Rev. Lett.. Vol.89, No.14. 146104-1-146104-4 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Arai, M.Tomitori: "Germanium islands grown on a Si(111)7x7 surface observed by noncontact atomic force microscopy with simultaneous imaging on damping"Appl. Surf. Sci.. Vol.188, Nos.3-4. 292-300 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Arai et al.: "DNA molecules sticking on a vicinal Si(111) surface observed by noncontact atomic force microscopy"Appl. Surf. Sci.. Vol.188, Nos.3-4. 474-480 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] S.Araragi et al.: "Atomic resolution imaging of Si(100)1x1:2H dihydride surface with noncontact atomic force microscopy(NC-AFM)"Appl. Surf. Sci.. Vol.188, Nos.3-4. 272-278 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Uozumi et al.: "Observation of Si(100) surface with noncontact atomic force microscope at 5 K"Appl. Surf. Sci.. Vol.188, Nos.3-4. 279-284 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Y.Sugawara et al.: "Atom manipulation and image artifact on Si(111)7x7 surface using a low temperature noncontact atomic force microscope"Appl. Surf. Sci.. Vol.188, Nos.3-4. 285-291 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] K.Okamoto et al.: "The elimination of the 'artifact' in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope"Appl. Surf. Sci.. Vol.188, Nos.3-4. 381-385 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] S.Morita, Y.Sugawara: "Atomically Resolved Imaging of Si(100)2x1, 2x1:H and 1x1:2H Surfaces with Noncontact Atomic Force Microscopy"Jpn.J.Appl.Phys.. Vol.41, No.7B. 4857-4862 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] S.Morita, Y.Sugawara: "Mapping and Control of Atomic Force on Si(111)√3×√3-Ag Surface Using Noncontact Atomic Force Microscope"Ultramicroscopy. Vol.91. 89-96 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 森田清三, 菅原康弘: "非接触原子間力顕微鏡で半導体の何がどこまで見えるか?"表面科学. Vol.23, No.3. 132-140 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 森田清三, 菅原康弘: "走査プローブ顕微鏡による複合極限場での原子イメージング"まてりあ. Vol.41, Vol.9. 604-609 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 森田清三, 菅原康弘: "走査プローブ顕微鏡によるナノ加工と評価"電子情報通信学会誌. Vol.85, No.11. 858-865 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 森田清三他: "1.非接触原子間力顕微鏡による静電気力観察"まてりあ. Vol.41、No.12. 840-841 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 細井浩貴他: "交換相互作用力顕微鏡による表面ナノ磁性の観測"まてりあ. Vol.41. 862-863 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 細井浩貴他: "NC-AFMによる磁性体表面観察の現状と可能性"表面科学. Vol.23. 158-165 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] S.Morita et al.: "Noncontact Atomic Force Microscopy"Springer. 439(75) (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 森田清三分担執筆: "大学改革とナノテクノロジーの未来"(阪大フロンティア研究機構編)大阪大学出版会. 201(14) (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 森田清三, 菅原康弘分担執筆: "ナノテクノロジーのための走査プローブ顕微鏡"(日本表面科学会編)丸善(株). 257(38) (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 森田清三他: "原子・分子のナノ力学"丸善(株). 200(65) (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Y.Sugawara et al.: "Noncontact AFM imaging on a Si(111)2x1-Sb surface with occupied lone-pair orbitals"Appl.Phys.A. Vol.72. S11-S14 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] H.Hosoi et al.: "Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip"Appl.Phys.A. Vol.72. S23-S26 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Arai, M.Tomitori: "Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultrahigh vacuum"Appl.Phys.A. Vol.72. S51-S54 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] R.Nishi et al.: "A noncontact atomic force microscope in air using a quartz resonator and the FM detection method"Appl.Phys.A. Vol.72. S93-S95 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] N.Suehira et al.: "Artifact and Fact of Si(111)7x7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM)"Jpn.J.Appl.Phys. 40・3B. L292-L294 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] M.Ashino et al.: "ATOMIC RESOLUTION NONCONTACT ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPY OF TiO2[110]-[1x1] AND -[1x2]:SIMULTANEOUS IMAGING OF SURFACE STRUCTURE AND ELECTRONIC STATES"Phys.Rev.Lett.. 86・19. 4334-4337 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] N.Suehira et al.: "Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism"Review of Scientific Instruments. 72・7. 2971-2976 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] S.Morita, Y.Sugawara: "Microscopic contact charging and dissipation"Thin Solid Films. Vol.393. 310-318 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] S.Fujisawa et al.: "Load dependence of sticking-domain distribution in two-dimensional atomic scale friction of NaF(100) surface"Tribology Letters. No.9. 69-72 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] M.Komiyama et al.: "Molecular orbital interpretation of thymine/graphite nc-AFM images"SURFACE AND INTERFACE ANALYSIS. VOl.32. 53-56 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] S.Morita, Y.Sugawara: "Mapping and Control of Atomic Force on Si(111)√<3>×√<3>-Ag Surface Using Noncontact Atomic Force Microscope"Ultramicroscopy. (in press). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Arai, M.Tomitori: "Germanium Islands Grown on a Si(111)7x7 Surface Observed by Noncontact Atomic Force Microscopy with Simultaneous Imaging on Damning"Appl.Surf.Sci.. (in press). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Arai et al.: "DNA Molecules Sticking on a Vicinal Si(111) Surface Observed by Noncontact Atomic Force Microscopy"Appl.Surf.Sci.. (in press). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] S.Araragi et al.: "Atomic resolution imaging of Si(100)1x1:2H dihydride surface with noncontact atomic force microscopy(NC-AFM)"Appl.Surf.Sci.. (in press). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Uozumi et al.: "Observation of Si(100) surface with noncontact atomic force microscope at 5 K"Appl.Surf.Sci.. (in press). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] Y.Sugawara et al.: "Atom manipulation and image artifact on Si(111)7x7 surface using a low temperature noncontact atomic force microscope"Appl.Surf.Sci.. (in press). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] K.Okamoto et al.: "The elimination of the 'artifact' in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope"Appl.Surf.Sci.. (in press). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 森田清三, 菅原康弘: "21世紀の原子分子ナノテクノロジー"大阪大学低温センターだより. No.113. 5-9 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 森田清三, 菅原康弘: "走査プローブ顕微鏡によるナノテクノロジー"応用物理. 70・10. 1155-1164 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 菅原康弘, 森田清三: "ノーベル賞と分光学 IV.走査型トンネル顕微鏡と原子間力顕微鏡"分光研究. 50・3. 284-293 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 細井浩貴他: "交換相互作用力顕微鏡の開発と現状"日本応用磁気学会誌. Vol.25. 1507-1515 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 新井豊子: "NC-AFM像の印加電圧依存性と画像化技術"応用物理. 70・10. 1205-1207 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 森田清三: "21世紀のナノテクノロジーへの期待"応用物理学会薄膜・表面物理分科会NEWS LETTER. No.113. 1-2 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 森田清三, 菅原康弘: "非接触原子間力顕微鏡で半導体の何がどこまで見えるか?"表面科学. 23・3(印刷中). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 森田清三: "ナノ構造を観察する -走査型プローブ顕微鏡"日本の科学者. 37・2. 60-67 (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 森田清三: "はじめてのナノプローブ技術 (ビギナーズブックス18)"株式会社 工業調査会. 194 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 森田清三分担執筆: "日経先端技術"ナノテク要覧""日本経済新聞社/日経産業消費研究所. 252(6) (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 川合知二監修: "図解・ナノテクノロジーのすべて"株式会社 工業調査会. 287(4) (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] B.Bhushan(Editor): "Fundamentals of Tribology and Bridging the Gap Between the Macro-and Micro/Nanoscales"Kluwer Academic Publishers. 963(37) (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] M.Ohtsu(Editor): "Optical and Electronic Process of Nano-Matters"KTK Scientific Publishers/Tokyo. 334(42) (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] K.Yokoyama et.al.: "Optical beam deflection noncontact atomic force microscope with three -dimensional beam adjustment mechanism"Rev.Sci.Instrum.. 71・1. 128-132 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] K.Yokoyama et.al.: "Atomic Resolution Imaging on Si(100)2x1 and Si(100)2x1 : H Surfaces with Noncontact Atomic Force Microscopy"Jpn.J.Appl.Phys.. 39・2A. L113-L115 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Uchihashi et.al.: "Identification of B-Form DNA in an Ultrahigh Vacuum by Noncontact -Mode Atomic Force Microscopy"Langmuir. 16・3. 1349-1353 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] S.Morita et.al.: "Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy"Journal of Crystal Growth. Vol.210. 408-415 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] S.Morita et.al.: "Correlation of frequency shift discontinuity to atomic positions on a Si(111)7x7 surface by noncontact atomic force microscopy"Nanotechnology. Vol.11. 120-123 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Arai and M.Tomitori: "Atomic force microscope tip sharpening and evaluation by electric field confinement using a metal grid approached to the tip"J.Vac.Sci.Technol.B. 18・2. 648-652 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] Y.Sugawara et.al.: "Noncontact AFM imaging on Al -adsorbed Si(111) surface with an empty orbital"Appl.Surf.Sci.. 157・4. 239-243 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Uchihashi et.al.: "High-resolution imaging of organic monolayers using noncontact AFM"Appl.Surf.Sci.. 157・4. 244-250 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.Suehira et.al.: "Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever"Appl.Surf.Sci.. 157・4. 343-348 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] R.Nishi et.al.: "Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy."Appl.Surf.Sci.. 157・4. 332-336 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Ashino et.al.: "Atomic-scale structure on a non-stoichiometric TiO_2(110) surface studied by noncontact AFM"Appl.Surf.Sci.. 157・4. 212-217 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Arai and M.Tomitori: "Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy"Appl.Surf.Sci.. 157・4. 207-211 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Arai and M.Tomitori: "Simultaneous Imaging of Tunneling Current Variation by Noncontact Atomic Force Microscopy in Ultrahigh Vacuum"Jpn.J.Appl.Phys.. 39・6B. 3753-3757 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Ashino et.al.: "Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy"Jpn.J.Appl.Phys.. 39・6B. 3765-3768 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Uchihashi et.al.: "Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy"Jpn.J.Appl.Phys.. 39・8B. L887-L889 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Ashino et.al.: "STM and atomic-resolution noncontact AFM of an oxygen-deficient TiO_2(110) surface"Phys.Rev.B. 61・20. 13955-13959 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] Y.Sugawara et.al.: "Noncontact AFM imaging on a Si(111)2x1-Sb surface with occupied lone-pair orbitals"Appl.Phys.A. Vol.71(In press). (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] R.Nishi et.al.: "A noncontact atomic force microscope in air using a quartz resonator and the FM detection method"Appl.Phys.A. Vol.71(In press). (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Arai and M.Tomitori: "Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultrahigh vacuum"Appl.Phys.A. Vol.71(In press). (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] S.Morita and Y.Sugawara: "Microscopic Contact Charging and Dissipation"Thin Solid Films. (In press). (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] 森田清三,菅原康弘: "ナノ力学に基づいた原子分子技術"生産と技術. 52・2. 9-14 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 森田清三,菅原康弘: "原子間力顕微鏡による帯電素過程の研究"静電気学会誌. 24・1. 8-14 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 森田清三: "21世紀のナノテクノロジー"KAST Report[(財)神奈川科学技術アカデミー]. 12・1. 2-7 (2000)

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      2000 Annual Research Report
  • [Publications] 富取正彦,新井豊子: "<トンネル顕微鏡技術の基礎>装置・手法としての可能性と限界"応用物理. 69・4. 435-438 (2000)

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      2000 Annual Research Report
  • [Publications] 森田清三: "次世代ナノテクノロジー"大阪大学工業会誌「テクノネット」. No.511. 24-27 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 森田清三,菅原康弘: "非接触原子間力顕微鏡と原子分子のナノ力学"学術月報. 53・12. 1319-1324 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 森田清三 編著 他: "走査型プローブ顕微鏡-基礎と未来予測-"丸善株式会社. 181 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 森田清三: "はじめてのナノプローブ技術(ビギナーズブックス18)"株式会社 工業調査会. 194 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] S. Morita and Y. Sugawara: "Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy"Appl. Surf. Sci.. 140・3-4. 406-410 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T. Minobe et. al.: "Distance dependence of noncontact -AFM image contrast on Si(111) √<3>x√<3>-Ag structure"Appl. Surf. Sci.. 140・3-4. 298-303 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] S. Orisaka et. al.: "The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope"Appl. Surf. Sci.. 140・3-4. 243-246 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T. Uchihashi et. al.: "Imaging of chemical reactivity and buckled dimers on Si(100) 2x1 reconstructed surface with noncontact AFM"Appl. Sur. Sci.. 140・3-4. 304-308 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Y. Sugawara et. al.: "True atomic resolution imaging of surface structure and surface charge on the GaAs(110)"Appl. Sur. Sci.. 140・3-4. 371-375 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M. Tomitori and T. Arai: "Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuum"Appl. Sur. Sci.. 140・3-4. 432-438 (1999)

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      1999 Annual Research Report
  • [Publications] Y. Sugawara et. al.: "Non-contact AFM Images Measured on Si(111) √<3>x√<3>-Ag and Ag(111) Surfaces"Surface and Interface Analysis. 27・5-6. 456-461 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T. Uchihashi et al.: "Self-Assembled Monolayer of Adenine Base on Graphite Studied by Noncontact Atomic Force Microscopy"Phys. Rev. B. 60・11. 8309-8313 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] S. Morita et. al.: "Missing Ag Atom on Si(111) √<3>x√<3>-Ag Surface Observed Noncontact Atomic Force Microscopy"Jpn. J. Appl. Phys.. 38・11B. L1342-L1344 (1999)

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      1999 Annual Research Report
  • [Publications] K. Yokoyama et. al.: "Atomically Resolved Silver Imaging on the Si(111) -(√<3>x√<3>)-Ag Surface Using a Noncontact Atomic Force Microscope"Phys. Rev. Lett.. 83・24. 5023-5026 (1999)

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      1999 Annual Research Report
  • [Publications] K. Yokoyama et. al.: "Optical beam deflection noncontact atomic force microscope with three -dimensional beam adjustment mechanism"Rev. Sci. Instrum.. 71・1. 128-132 (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] K. Yokoyama et. al.: "Atomic Resolution Imaging on Si(100)2x1 and Si(100)2x1 : H Surfaces with Noncontact Atomic Force microscopy"Jpn. J. Appl. Phys.. 39・2A. L113-L115 (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] T. Uchihashi et. al.: "Identification of B-Form DNA in an Ultrahigh Vacuum by Noncontact -Mode Atomic Force Microscopy"Langmuir. 16・3. 1349-1353 (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] S. Morita et. al.: "Defects and Its Charge Imaging on Semiconductor Surfaces by Noncontact Atomic Force Microscopy and Spectroscopy"Journal of Crystal Growth. (In press). (2000)

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      1999 Annual Research Report
  • [Publications] S. Morita et. al.: "Correlation of frequency shift discontinuity to atomic positions on a Si(111) 7x7 surface by noncontact atomic force microscopy"Nanotechnology. Vol. 11 (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] T. Arai and M. Tomitori: "AFM tip sharpening and evaluation by electric field confinement using a metal grid approached to the tip"J. Vac. Sci. Technol. A. (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] Y. Sugawara et. al.: "Noncontact AFM imaging on A1-adsorbed Si(111) surface with an empty orbital"Appl. Surf. Sci.. (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] T. Uchihashi et. al.: "High-resolution imaging of organic monolayers using noncontact AFM"Appl. Surf. Sci.. (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] N. Suehira et. al.: "Development of low temperature ultrahigh vacuum noncontact atomic force microscope with PZT cantilever"Appl. Surf. Sci.. (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] R. Nishi et. al.: "Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy"Appl. Surf. Sci.. (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] M. Ashino et. al.: "Atomic-scale structure on a non-stoichiometric TiO_2(110) surface studied by noncontact AFM"Appl. Ashino et. al.. (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] T. Arai and M. Tomitori: "Bias dependence of Si(111) 7x7 images observed by noncontact atomic force microscopy"Appl. Surf. Sci.. (In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] 森田清三、菅原康弘: "AFMの現状と展開"表面科学. 20・5. 352-357 (1999)

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      1999 Annual Research Report
  • [Publications] 菅原康弘、森田清三: "非接触原子間力顕微鏡による単一分子解析"蛋白質 核酸 酵素. 44・14. 2119-2123 (1999)

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      1999 Annual Research Report
  • [Publications] 森田清三、菅原康弘: "原子間力顕微鏡による原子レベルの物性評価と計測"電気学会論文誌C. 119-C・10. 1109-1112 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 森田清三、菅原康弘: "ナノカ学に基づいた原子分子技術"生産と技術. 52・2(In press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] 森田清三編著他: "走査型プローブ顕微鏡-基礎と未来予測-"丸善株式会社. 181 (2000)

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      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2018-03-28  

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