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DEVELOPMENT OF SOFT X-RAY INTERFEROMETRY WITH SYNTHETIC MULTILAYERS AND APPLICATION TO WAVEFRONT MEASUREMENTS AND CONTROL OF PRECISION IMAGING MIRRORS

Research Project

Project/Area Number 11305009
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Applied optics/Quantum optical engineering
Research InstitutionTOHOKU UNIVERSITY

Principal Investigator

YAMAMOTO Masaki  Tohoku University, Institute of Multidisciplinary Research for Advanced Materials, Professor, 多元物質科学研究所, 教授 (00137887)

Co-Investigator(Kenkyū-buntansha) HATANO Tadashi  Tohoku University, Institute of Multidisciplinary Research for Advanced Materials, Research Associate, 多元物質科学研究所, 助手 (90302223)
YAMAGIHARA Mihiro  Tohoku University, Institute of Multidisciplinary Research for Advanced Materials, Associate Professor, 多元物質科学研究所, 助教授 (40174552)
Project Period (FY) 1999 – 2001
Project Status Completed (Fiscal Year 2001)
Budget Amount *help
¥41,430,000 (Direct Cost: ¥38,700,000、Indirect Cost: ¥2,730,000)
Fiscal Year 2001: ¥11,830,000 (Direct Cost: ¥9,100,000、Indirect Cost: ¥2,730,000)
Fiscal Year 2000: ¥10,100,000 (Direct Cost: ¥10,100,000)
Fiscal Year 1999: ¥19,500,000 (Direct Cost: ¥19,500,000)
KeywordsSOFT X-RAY / INTERFEROMETRY / SYNTHETIC MULTILAYERS / MULTILAYER MIRROR / PRECISION IMAGING-MIRROR / WAVEFRONT ERROR / WAVEFRONT ERROR CORRECTION / DEBRIS REGECTION / 多層膜 / ビームスプリッタ / 干渉計 / 波面計測 / 結像光学系
Research Abstract

This research aims development of precision imaging mirrors for normal incidence optics at a wavelength of 13 nm with our fabrication expertise of soft X-ray multilayers. Methodology of precise wavefront measurement and correction has been investigated with development of soft X-ray interferometry of high accuracy better than 1 nm, needed for high quality imaging. In the development process, in addition to the interferometer optics with alignment system enabling nm accuracy measurement, basic compositions for general imaging systems are developed. These include a soft X-ray light source of a YAG-laser produced plasma free from debris contamination to optics, as well as a 2-dimensional detector with a data handling and analysis system for soft X-ray interferogram detection.
In this fiscal year, continuing effort leads to successful development of the basic compositions, i.e., the light source, interferometry optics, and the detector.
As for the light source assembly, a bright source has b … More een developed enabling soft X-ray interferogram recording by one shot of the YAG laser pulse. In this assembly, a multilayer condenser mirror of 10 cm in diameter is set at 0.2 NA configuration, effectively collecting soft X-ray of a solid Sn target locating 21 cm away from the mirror. A mechanical debris stopper designed and constructed removes the debris of the target. With the debris stopper, the life of the source are elongated to 40000 shots by 10 times with removal of debris particles forming 90 % of total debris mass.
As for the optics, accuracy of the multilayer period distribution over the substrate of the precision imaging mirror has been improved from last year's 2 % to within 1 %. For this control, a new mechanical shutter system has been constructed with a function controlling speed of the open and close movements.
As for the detector, imaging plates for Tr were investigated in respect to the sensitivity and detection linearity for the soft X-ray with use of our spectro-reflectometer. At around 13 nm wavelengths, high sensitivity of 100000 photons / mm^2 and good linearity over 4 orders of magnitudes were confirmed. Less

Report

(4 results)
  • 2001 Annual Research Report   Final Research Report Summary
  • 2000 Annual Research Report
  • 1999 Annual Research Report
  • Research Products

    (20 results)

All Other

All Publications (20 results)

  • [Publications] 山本正樹: "軟X線多層膜光学"光学. 30・9. 613-621 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] Masaki Yamamoto: "Present Status of EUV Interferometer Development at the Research Center for Soft X-ray Microscopy"Optics and Precision Engineering. 9. 405-410 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] Masaki Yamamoto: "Sub-nm figure error correction of an EUV multilayer mirror by its surface milling"Nucl. Instrum. Methods A. 467-8. 1282-1285 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] MASAKI YAMAMOTO: "SOFT X-RAY MULTILAYER OPTICS (IN JAPANESE)"JAPAN. J. OPTICS. 30-9. 613-621 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] MASAKI YAMAMOTO: "Present Status of EUV Interferometer Development at the Research Center for Soft X-ray Microscopy"Optics and Precision Engineering. 9. 405-410 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] MASAKI YAMAMOTO: "Sub-nm figure error correction of an EUV multilayer mirror by its surface milling"Nucl. Instrum. Methods A. 467-8. 1282-1285 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 山本正樹: "軟X線多層膜光学"光学. 30・9. 613-621 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] Masaki Yamamoto: "Present Status of EUV interferometer Development at the Research Center for Soft X-ray Microscopy"Optics and Preci sion Engineering. 9. 405-410 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] Masaki Yamamoto: "Sub-nm figure error correction of an EUV multilayer mirror by its surface milling"Nucl. Instrum. Methods A. 467-8. 1282-1285 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Hatano: "Versatile Shutter control of Radial Thickness Distribution for Figured Multilayer Fabrication"Prog.Abstr.5th Int.Conf.Phys.X-Ray Mult.Strue.. 5、6 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Yamamoto: "Reflection wave-front error compensation by surface milling at a Layer prepared on top of an EUV multilayer mirror"Prog.Abstr.5th Int.Conf.Phys.X-Ray Mult.Strue.. 15、2 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Yamamoto: "Compact debris shutter design of a laser-prodiccel plasma source for high NA application"Proc.SPIE. 4146. 128-131 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Hatano: "Sensitivity and Linearity of imaging plates for EUV Light"Book of Abstr. 7th Int-Conf.Syn.Rad.Instrum.. POS1-209 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Hatano: "Material selection for high reflectance muetilayer mirror at 400 eV"Book of Abstr. 7th Int Conf.Syn.Rad.Instrum.. POS2-080 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Yamamoto: "Sub-nm frgure error correction of an EUV multilayer mirror by its surface milling"Book of Abstr.7th.Int.Conf.Syn.Rad.Instrum.. POS2-188 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] K.Sakano: "Development of soft X-ray multilyer mirrors for a wavelength of 3 nm"Proc. SPIE. 3767. 238-241 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M.Yamamoto: "Sensitivity and Linearity of EUV Image Datection with an Imaging plate"Abstr. Int. Workshop on Extr. Ultraviolet Lithography. B-15 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T.Hatano: "Imaging plates for uses with EUV imaging optics"XEL'99 Digest of Papers. 2-2-4 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M.Yamamoto: "EUV reflection phase correction at a multilayer surface"XEL'99 Digest of Papers. 2-2-5 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T.Hatano: "Precision Science and Technology for Perfect Surfaces"JSPE Publication. 1067 292-297 (1999)

    • Related Report
      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2016-04-21  

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