| Project/Area Number |
11305011
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| Research Category |
Grant-in-Aid for Scientific Research (A)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied physics, general
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| Research Institution | University of Tsukuba |
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Principal Investigator |
AOKI Sadao Institute of Applied Physics, Professor, 物理工学系, 教授 (50016804)
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| Co-Investigator(Kenkyū-buntansha) |
WATANABE Norio Institute of Applied Physics, Lecture, 物理工学系, 講師 (80241793)
青田 達也 筑波大学, 物理工学系, 助手 (20292526)
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| Project Period (FY) |
1999 – 2001
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| Project Status |
Completed (Fiscal Year 2001)
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| Budget Amount *help |
¥40,410,000 (Direct Cost: ¥39,000,000、Indirect Cost: ¥1,410,000)
Fiscal Year 2001: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
Fiscal Year 2000: ¥9,500,000 (Direct Cost: ¥9,500,000)
Fiscal Year 1999: ¥24,800,000 (Direct Cost: ¥24,800,000)
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| Keywords | x-ray fluorescence / x-ray microscope / Wolter mirror / analysis / imaging / CCD camera / synchrotron radiation / 3-dimensional image / x線顕微鏡 / 結像型 / 元素分析 / 3次元 / マッピング / 顕微鏡 / アンジュレーター |
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| Research Abstract |
X-ray fluorescence has been used to investigate the composition of materials. The spectrum of x-ray fluorescence defines a specific element. So far, being the lack of x-ray imaging device 3-dimensional element mapping was very difficult. A Wolter mirror which has been developed in the University of Tsukuba enables us to image x-ray fluorescence directly. The x-ray fluorescence imaging microscope(XFIM) consists of an x-ray source (synchrotron radiation), an objective mirror(Wolter mirror) and an x-ray area detector(CCD camera).
Synchrotron radiation facilities we used were the Photon Factory(BL3C2) and the Spring-8(BL39XU). We could obtained x-ray fluorescence images whose atomic numbers are from 20(Ca) to 30(Zn). 3-dimensional element mapping was succeeded from fifty x-ray fluorescence images which were recorded with a CCD camera by rotating a sample. The magnification of the Wolter mirror was 10 and it can image x-ray fluorescence up to 12 keV. The resolving power of the mirror is better than 10 μm. The detection sensitivity of the x-ray fluorescence imaging microscope was better than 1 pg/pixel. Test samples of Fe, Cu and Ni wires were recorded and reconstructed. The inclusions of a synthesized diamond were also recorded and 3-dimensional distribution of Fe, Co and Ni could be obtained.
Dynamical observation of Cu deposition at copper sulfate electrolysis was succeeded, which demonstrated that the microscope has a relatively large depth of view. Many other applications of non-destructive observation will be possible by using an x-ray fluorescence imaging microscope.
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