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Establishment of Ceramic Coating System for Improving Resisting Function of Thin Film Coating from the Environmental Attack

Research Project

Project/Area Number 11450048
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section一般
Research Field Materials/Mechanics of materials
Research InstitutionKogakuin UNIVERSITY

Principal Investigator

KIMURA Yuji  Kogakuin Univ., Faculty of Engineering, Professor, 工学部, 教授 (90107160)

Co-Investigator(Kenkyū-buntansha) FUJIWARA Yukio  Kogakuin Univ., Faculty of Engineering, Associate Professor, 工学部, 助教授 (80100361)
TAKANO Ichiro  Kogakuin Univ., Faculty of Engineering, Associate Professor, 工学部, 助教授 (70226801)
Project Period (FY) 1999 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥10,700,000 (Direct Cost: ¥10,700,000)
Fiscal Year 2000: ¥3,200,000 (Direct Cost: ¥3,200,000)
Fiscal Year 1999: ¥7,500,000 (Direct Cost: ¥7,500,000)
KeywordsCVD & IM coatings / Corrosion resistance / EAFM in situ observation / Corrosion behavior / Electrochemical measurement / CPCD method / Pinhole defect ratio / Adhesion strength
Research Abstract

Thin film coatings toward various types of materials such as metal and organic compound have been used for protecting substrate surface from harsh environment or adding a lot of functions to them. However, nanometric defects and cracks were always existed in coated thin film from the initial stage. In actual environment, degradation was generated as a result of the corrosive solution going into substrate through the nanometric defect of coating. Therefore, various investigations were conducted from the view points of (a) improvement of corrosion resistance of substrate metal through N^+ ion implantation, (b) Improvement of adhesion strength by optimizing thin film formation condition by Dynamic Ion Mixing (DIM) method and (c) protection of thin film coated specimen from corrosion by photo-catalytic effect of coated TiO_2 film.
Results obtained are summarized as follows ;
(1) The adhesion characteristic of TiN films, which was coated by plasma CVD, was investigated by the scratch test. Th … More en, through investigating the relationship between temperature condition of TiN film formation and critical load of Lc obtained by scratch test, the adhesive strength between TiN film and substrate was evaluated. Also, through evaluating the substrate materials dependency upon adhesive strength, the applicable range of the CPCD test was made clear for the defect ratio evaluation of TiN films with various film thickness and adhesion strength. In addition, some improvements in CPCD test method for avoiding the overestimation of defect in film were discussed.
(2) Because of the better understanding of correlation between localized corrosion progress and defect morphology of thin film coating, in situ observation in aqueous solution together with electrochemical measurement was needed. Therefore, in situ observation of defect morphology and nm or μm orders localized corrosion generated in 3% NaCl aqueous solution was conducted by Electrochemical Atomic Force Microscopy (EAFM) newly established by present authors.
(3) Formation and characterization of TiO_2 thin film made on 304 stainless steel by Ion-beam-mixing method were conducted. Therefore, TiO_2 thin film made by Ion-beam-mixing method have superior adhesive characteristics and graded microstructure. Then, examination of the compositions and crystal structure of deposited thin films were conducted by XRD and ESCA.And also, it was confirmed that the 0.15mm thick TiO_2 thin film could have cathodic protection performance in 0.3wt% NaCl aqueous solution at room temperature. Less

Report

(3 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • Research Products

    (14 results)

All Other

All Publications (14 results)

  • [Publications] 木村雄二: "ドライコーティング膜の欠陥評価試験法"材料試験技術. 44巻. 71-76 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Yuji KIMURA: "Standardization and some application of the evaluation method of defects in the ceramic coatings"Proc.of Fourth Int.Conf.on Surface Treatment. 23-31 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 白戸竜也,木村雄二: "プラズマCVD法により作製されたTiN薄膜の欠陥面積率に対するCPCD法の適用の検討"材料. 49巻2号. 227-233 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.KIMURA and T.SHIRATO: "Correlation between Interfacial State of Plasma CVD Coated TiN Film/Substrate and Pinhole Defect Ratio Evaluation by CPCD Method"Proc.of The 13th Euro.Conf.on Fracture. CD Vol.Ceramics.8. 1-8 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.OHATA and Y.KIMURA: "In Situ Observation on Localized Corrosion Morphology of TiN Thin Film Coating by Electrochemical AFM"Proc.of The 13th Euro.Conf.on Fracture. CD Vol.Env.Assis Crack2. 1-8 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Yuji KIMURA: "Evaluation of Defects in Ceramic Coating Films Made by Dry Processing"Journal of Material Testing Research Association of Japan. Vol. 44, No. 2. 71-76 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Yuji KIMURA: "Standardization and some application of the evaluation method of defects in the ceramic coatings"Proc.of Fourth Int.Conf.on Surface Treatment. 23-31 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Yuji KIMURA and Tatsuya SHIRATO: "Evaluation of Defect Ratio in Thin Film Made by Plasma CVD"Journal of The Society of Materials Science of Japan. Vol. 49, No. 2. 227-233 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Yuji KIMURA and Tatsuya SHIRATO: "Correlation between Interfacial State of Plasma CVD Coated TiN Film/Substrate and Pinhole Defect Ratio Evaluation by CPCD Method"Proc.of The 13th Euro.Conf.on Fracture, CD Volume, Ceramics. Paper No. 8. 1-8 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Michio OHATA and Yuji KIMURA: "In Situ Observation on Localized Corrosion Morphology of TiN Thin Film Coating by Electrochemical AFM"Proc.of The 13th Euro.Conf.on Fracture CD volume, Environmentally Assisted Cracking. Paper No. 2. 1-8 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.KIMURA and T.SHIRATO: "Correlation between Interfacial State of Plasma CVD Coated TiN Film/Substrate and Pinhole Defect Ratio Evaluation by CPCD Method"Proc.of The 13th Euro.Conf.on Fracture. CD Vol.Ceram.No.8. 1-6 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.OHATA and Y.KIMURA: "In Situ Observation on Localized Corrosion Morphology of TiN Thin Film Coating by Electrochemical AFM"Proc.of The 13th Euro.Conf.on Fracture. CD Vol.Envir.No.2. 1-6 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] Y.KIMURA: "Standardization and some application of the evaluation method of defects in the ceramic coatings"Proc. of Fourth Int. Conf. on Sruface Treatment. 23-31 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 白戸竜也、木村雄二: "プラズマCVD法により作製されたTiN薄膜の欠陥面積率に対するCPCD法の適用の検討"材料. 49巻・2号. 227-233 (2000)

    • Related Report
      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2016-04-21  

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