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Development of Virtual Experiment System for Growth Process of Functional Crystals

Research Project

Project/Area Number 11555035
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field Materials/Mechanics of materials
Research InstitutionKyushu University

Principal Investigator

MIYAZAKI Noriyuki  Kyushu University, Graduate School of Engineering, Professor, 大学院・工学研究院, 教授 (10166150)

Co-Investigator(Kenkyū-buntansha) WATANABE Takayuki  CRC Solutions Corp., Nuclear Engineering Department, Senior Staff, 技術担当部長
IKEDA Toru  Kyushu University, Graduate School of Engineering, Associate Professor, 大学院・工学研究院, 助教授 (40243894)
Project Period (FY) 1999 – 2001
Project Status Completed (Fiscal Year 2001)
Budget Amount *help
¥7,500,000 (Direct Cost: ¥7,500,000)
Fiscal Year 2001: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 2000: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 1999: ¥4,700,000 (Direct Cost: ¥4,700,000)
KeywordsSingle Crystal Growth / Semiconductor / Oxide / Thermal Stress / Dislocation Density / Cracking / Crystal Anisotropy / Finite Element Method / 機能性単結晶 / 転位 / 伝熱解析 / 熱応力解析 / 転位密度評価 / 可視化
Research Abstract

The following are results of the present research.
(1) We developed an axisymmetric computer code for dislocation density evaluation during crystal growth process, in which a bulk single crystal is assumed to be isotropic. Dislocation density analyses were performed for semiconductor single crystals such as Si, GaAs and InP by using this computer code.
(2) We developed an axisymmetric computer code for dislocation density evaluation during crystal growth process, in which crystal anisotropy in elastic constants and specific slip directions are approximately considered. That is, the crystal anisotropy is averaged along the azimuthal direction. Such approximation enables axisymmetric finite element modeling. The effect of growth direction on the dislocation density was made clear for GaAs and InP single crystals by using this computer code.
(3) We developed a prototype version of a three-dimensional computer code for dislocation density evaluation during crystal growth process, in which the crystal anisotropy is exactly taken into account.
(4) We developed an axisymmetric computer code for dislocation density evaluation during ingot annealing process, in which a bulk single crystal is assumed to be isotropic. Dislocation density analyses were performed for a GaAs ingot by using this computer code.
(5) We developed a prototype version of a three-dimensional computer code for dislocation density evaluation during ingot annealing process, in which the crystal anisotropy is exactly taken into account.
(6) We developed computer codes that can be applied to thermal stress analyses for various kinds of single crystals. These computer codes were integrated into a thermal stress analysis system for the growth of a bulk single crystal, together with a pre- and post-processor.

Report

(4 results)
  • 2001 Annual Research Report   Final Research Report Summary
  • 2000 Annual Research Report
  • 1999 Annual Research Report
  • Research Products

    (38 results)

All Other

All Publications (38 results)

  • [Publications] 宮崎則幸: "バルク単結晶CZ育成過程の転位密度シミュレーション"結晶成長学会誌. 26巻. 131-138 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Dislocation Density Analysis of Bulk Semiconductor Single Crystal during CZ Growth Process (Effects Crystal Anisotropy)"JSME International Journal. Vol.46. 485-491 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Cracking of GSO Single Crystal Induced by Thermal Stress"Computer Modeling in Engineering & Sciences. Vol.1. 101-107 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 宮崎則幸: "単結晶インゴットアニール過程の転位密度解析コードの開発"日本機械学会論文集(A編). 66巻. 442-447 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Development of Dislocation Density Analysis Code for Annealing Process of Single Crystal Ingot"Journal of Crystal Growth. Vol.216. 6-14 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Dislocation Density Analysis of GaAs Single Crystal during CZ Growth Process"Advances in Computational Engineering & Sciences. Vol.I. 296-301 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Dislocation Density Analyses of GaAs Bulk Single Crystal during Growth Process (Effect of Crystal Anisotropy)"Journal of Crystal Growth. Vol.218. 221-231 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Dislocation Density Simulations for Bulk Single Crystal Growth Process Using Dislocation Kinetics Model"IUTAM Symposium on Creep in Structures. 115-124 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Development of Thermal Stress Analysis System for Single Crystal Growth Process"Advances in Computational Engineering & Sciences. Paper ID205 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 宮崎則幸: "単結晶インゴットアニール過程の三次元転位密度解析コードの開発"日本機械学会論文集(A編). 67巻. 1603-1608 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 宮崎則幸: "斜方晶系単結晶の熱応力解析-BAO単結晶を例として-"シミュレーション. 20巻. 274-278 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 宮崎則幸: "半導体バルク単結晶CZ育成過程における転位密度の三次元解析"日本機械学会論文集(A編). 68巻. 21-25 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Development of Thermal Stress Analysis System for Anisotropic Single Crystal Growth"Journal of Crystal Growth. (未定). (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Dislocation Density Simulation for Bulk Single Crystal during CZ Growth (in Japanese)"Journal of the Japanese Association for Crystal growth. Vol. 26. 131-138 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Dislocation Density Analysis of Bulk Semiconductor Single Crystal during CZ Growth Process (Effects of Crystal Anisotropy)"JSME International Journal (Series A). Vol. 46. 485-491 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Cracking of GSO Single Crystal Induced by Thermal Stress"Computer Modeling in Engineering & Sciences. Vol. 1. 101-107 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Development of Dislocation Density Analysis Code for Annealing Process of Single Crystal Ingot (in Japanese)"Transactions of the Japan Society of Mechanical Engineers (series A). Vol. 66. 442-447 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Development of Dislocation Density Analysis Code for Annealing Process of Single Crystal Ingot"Journal of Crystal Growth. Vol. 216. 6-14 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Dislocation Density Analysis of GaAs Single Crystal during CZ Growth Process"Advances in Computational Engineering & Sciences. Vol. I. 296-301 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Dislocation Density Analyses of GaAs Bulk Single Crystal during Growth Process (Effect of Crystal Anisotropy)"Journal of Crystal Growth. Vol. 218. 221-231 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Dislocation Density Simulations for Bulk Single Crystal Growth Process Using Dislocation Kinetics Model"IUTAM Symposium on Creep in Structures. 115-124

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Development of Thermal Stress Analysis System for Single Crystal Growth Process"Advances in Computational Engineering & Sciences, Paper ID 205..

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Development of Three-Dimensional Dislocation Density Analysis Code for Annealing Process of Single Crystal Ingot (in Japanese)"Transactions of the Japan Society of Mechanical Engineers (Series A). Vol. 67. 1603-1608 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Thermal Stress Analysis of Orthorhombic Single Crystal - BAO Single Crystal -"Journal of the Japan Society for Simulation Technology. Vol. 20. 274-278 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Three-Dimensional Dislocation Density Analysis of Bulk Semiconductor Single Crystal during CZ Growth Process (in Japanese)"Transactions of the Japan Society of Mechanical Engineers (Series A). Vol. 68. 21-25 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N. MIYAZAKI: "Development of a Thermal Stress Analysis Code for Anisotropic Single Crystal Growth"Journal of Crystal Growth. (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] N.MIYAZAKI: "Development of Thermal Stress Analysis System for Single Crystal Growth Process"Advances in Computational Engineering & Sciences. 205 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 宮崎則幸: "単結晶インゴットアニール過程の三次元転位密度評価解析コードの開発"日本機械学会論文集(A編). 67巻662号. 1603-1608 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 宮崎則幸: "斜方晶系単結晶の熱応力解析"シミュレーシヨン. 20巻4号. 274-278 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 宮崎則幸: "半導体バルク単結晶CZ育成過程における転位密度の三次元解析"日本機械学会論文集(A編). 68巻665号. 21-25 (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] N.MIYAZAKI: "Development of a Thermal Stress Analysis System for Anisotropic Single Crystal Growth"Journal of Crystal Growthに印刷中. (未定). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 宮崎則幸 他: "単結晶インゴットアニール過程の転位密度解析コードの開発"日本機械学会論文集(A編). 66・643. 442-447 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.MIYAZAKI, et al.: "Development of Dislocation Density Analysis Code for Annealing Process of Single-Crystal Ingot"Journal of Crystal Growth. 216. 6-14 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.MIYAZAKI, et al.: "Dislocation Density Analysis of GaAs Single Crystal during CZ Growth Process"Advances in Computational Engineering & Sciences. 1. 296-301 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.MIYAZAKI, et al.: "Dislocation Density Analyses of GaAs Bulk Single Crystal during Growth Process (Effects of Crystal Anisotropy)"Journal of Crystal Growth. 218. 221-231 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.MIYAZAKI,: "Dislocation Density Simulations for Bulk Single Crystal Growth Process Using Dislocation Kinetics Model"IUTAM Symposium on Creep in Structures. 115-124 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] N. MIYAZAKI: "Dislocation Density Analyses of Bulk Semiconductor Single Crystal during CZ Growth Process (Effects of Crystal Anisotropy)"JSME International Journal. 42・4. 485-491 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] N. MIYAZAKI: "Cracking of GSO Single Crystal Induced by Thermal Stress"Computer Modeling in Engineering and Science. 1・1. 101-107 (2000)

    • Related Report
      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2016-04-21  

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