| Project/Area Number |
11555165
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| Research Category |
Grant-in-Aid for Scientific Research (B).
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| Allocation Type | Single-year Grants |
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| Section | 展開研究 |
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| Research Field |
Inorganic materials/Physical properties
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| Research Institution | Tokyo Institute of Technology |
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Principal Investigator |
FUNAKUBO Hiroshi Tokyo Instituite of Technology Professor, 大学院・総合理工学研究科, 助教授 (90219080)
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| Co-Investigator(Kenkyū-buntansha) |
SHINOZAKI Kazuo Tokyo Institute of Technology Associate Professor, 大学院・理工学研究科, 助教授 (00196388)
MIZUTANI Nobuyasu Tokyo Insitute of Technology Professor, 大学院・理工学研究科, 教授 (60016558)
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| Project Period (FY) |
1999 – 2000
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| Project Status |
Completed (Fiscal Year 2000)
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| Budget Amount *help |
¥7,000,000 (Direct Cost: ¥7,000,000)
Fiscal Year 2000: ¥2,100,000 (Direct Cost: ¥2,100,000)
Fiscal Year 1999: ¥4,900,000 (Direct Cost: ¥4,900,000)
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| Keywords | MOCVD / Strain-induced / Ferroerectlicity / Pb (Zr, Ti) O_3 |
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| Research Abstract |
Strain effect on the ferroelectricity of the film was investigated. The degree of c-axis orientation increased when Nb content increased in Pb (Ti, Nb) O_3 film deposited on (100) MgO substrates. Lattice parameter ratio of c- to a-axis (c/a) decreased with increasing Nb content. Increase of the degree of c-axis orientation with decreasing c/a ratio which was commonly observed for Pb (Ti, Nb) O_3, Pb (Ti, Al) O_3 and Pb (Zr, Ti) O_3 films. These can be explained by the stress applied to the film.
Effect of the orientation of the Pb (Zr, Ti) O_3 films on the ferroerectricity was also observed. Polar-axis oriented film, (001) tetragonal-PZT and (111) rhombohedral PZT, showed the largest remnant polarization (Pr). However, the other oriented films, (101) and (111)-oriented tetragonal PZT and (110) and (100)-oriented rhombohedral PZT, showed large Pr value compared with the expected value from the calculation. This phenomena can be explained by the domain structure induced by the stress applied to the film.
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