• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Development of nano-scale three-dimensional analytical apparatus for industrial material using an ultra fine focused ion beam

Research Project

Project/Area Number 11555226
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section展開研究
Research Field 工業分析化学
Research InstitutionUniversity of Tokyo

Principal Investigator

NIHEI Yoshimasa  Institute of Industrial Science, University of Tokyo Professor, 生産技術研究所, 教授 (10011016)

Co-Investigator(Kenkyū-buntansha) ISHII Hideshi  Institute of Industrial Science, University of Tokyo Research Associate, 生産技術研究所, 助手 (30251466)
SAKAMOTO Tetsuo  Environmental Science Center, University of Tokyo Associate Professor, 環境安全研究センター, 助教授 (20313067)
Project Period (FY) 1999 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥13,800,000 (Direct Cost: ¥13,800,000)
Fiscal Year 2000: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 1999: ¥12,400,000 (Direct Cost: ¥12,400,000)
KeywordsUltra fine ion beam / Gallium focused ion beam / Secondary ion mass spectrometry / Nano-scale tree-dimensional analysis / Elemental analysis with high spatial resolution / Multi-elements detection / Analytical reliability / High accurate cross-sectioning of sample / 機能性工業材料 / 機能性粉体材料 / 環境微粒子
Research Abstract

In this project, we tried the development of analytical technique and apparatus, for a nano-scale three-dimensional analysis. For this development, it is needed to develop and make clear the several items as follows ;
(1) Development of an ultra fine ion beam (primary ion beam), whose diameter is several nano-meter,
(2) Development of a stability beam scanning technique during long time measurements,
(3) Development of a high accurate data system for three-dimensional analysis,
(4) Clarify the shape and chemical composition of the cross-section by a gallium focused ion beam (Ga-FIB)
Items of 1 and 2 : We developed the ultra fine ion beam (primary ion beam) and a stability beam scanning system. By using the developed secondary ion mass spectrometry (SIMS) apparatus, we obtained the ion induced secondary electron image of a vacuum-evaporation gold film on a carbon prate. Judging from these results, it was clear that the lateral resolution of this system was less than 10 nm. Thus, we can concl … More ude that the three-dimensional analysis with high spatial resolution was realized by using this apparatus.
Item of 3 : The high accurate data system is very important for the tree-dimensional analysis as a destructive local analysis. We have investigated the cause of an uncertainty in the SIMS analysis. From the experiments, the uncertainty based on a single-channel detection system, which was the composite uncertainty based on the reproducibility of the magnetic field and the changes of the analyzed surface with time, was calculated to be 12.1%〜19.1%. Thus, we conclude that the multi-elements measurement system improves the analytical reliability by 12.1%〜19.1%.
Item of 4 : In order to clarify the shape of a cross-section by using a Ga-FIB, the computer simulations of cross-sectioning process were performed. The simulation revealed that the shape depend on a beam diameter and current density, and the cross-sectioning speed. We conclude that an ultra fine ion beam is effective for obtaining the accurate cross-section. Less

Report

(3 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • Research Products

    (26 results)

All Other

All Publications (26 results)

  • [Publications] 冨安,逆瀬川,鳥羽,尾張,二瓶: "サブミクロンSIMS法におけるshave-off深さ方向分解能の向上"表面科学. 20・8. 523-529 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 野島,冨安,柴田,尾張,二瓶: "ナノスケールFIB SIMS装置の試作"表面科学. 21・8. 511-516 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 冨安,尾張,二瓶: "破壊的局所分析法の多元素同時測定による定量精度の向上"分析化学. 49・8. 593-598 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] B.Tomiyasu,S.Sakasegawa,T.Toba,M.Owari and Y.Nihei: "Shave-off depth profiling of multi-layer samples using a gallium focu ion beam SIMS"Secondary ion mass spectrometry SIMS XII. 473-476 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Nojima,B.Tomiyasu,T.Shibata,M.Owari and Y.Nihei: "Development of nano-scale FIB SIMS apparatus"Proceeding of international union of microbeam analysis societies IUMAS 2000. 343-344 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] B.Tomiyasu,M.Owari and Y.Nihei: "Highly reliable quantitative analysis with Ga-FIB SIMS measurement by simultane multi-element detection system"Proceeding of international union of microbeam analysis societies IUMAS 2000. 345-346 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] B.Tomiyasu, S.Sakasegawa, T.Toba, M.Owari, Y.Nihei: ""Improvement on the shave-off depth resolution in a submicron SIMS analysis" (in Japanese)"Journal of the surface science society of Japan. 20 (8). 523-529 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Nojima, B.Tomiyasu, T.Shibata, M.Owari, Y.Nihei: ""Development of nano-scale FIB SIMS apparatus" (in Japanese)"Journal of the surface science society of Japan. 21 (8). 511-516 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] B.Tomiyasu, M.Owari, Y.Nihei: ""Improvement on the analytical reliability of a destructive local analysis by a simultaneous multi-elements measurement" (in Japanese)"Bunseki kagaku. 49 (2). 593-598 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] B.Tomiyasu, S.Sakasegawa, T.Toba, M.Owari and Y.Nihei: "Shave-off depth profiling of multi-layer samples using a gallium focused ion beam SIMS"Secondary ion mass spectrometry SIMS XII. 473-476 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Nojima, B.Tomiyasu, T.Shibata, M.Owari and Y.Nihei: "Development of nano-scale FIB SIMS apparatus"Proceeding of international union of microbeam analysis societies IUMAS 2000. 343-344 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] B.Tomiyasu, M.Owari and Y.Nihei: "Highly reliable quantitative analysis with Ga-FIB SIMS measurement by simultaneous multi-element detection system"Proceeding of international union of microbeam analysis societies IUMAS 2000. 345-346 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 冨安,逆瀬川,鳥羽,尾張,二瓶: "サブミクロンSIMS法におけるshave-off深さ方向分解能の向上"表面科学. 20・8. 523-529 (1999)

    • Related Report
      2000 Annual Research Report
  • [Publications] 野島,冨安,柴田,尾張,二瓶: "ナノスケールFIB SIMS装置の試作"表面科学. 21・8. 511-516 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 冨安,尾張,二瓶: "破壊的局所分析法の多元素同時測定による定量精度の向上"分析化学. 49・8. 593-598 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] B.Tomiyasu,S.Sakasegawa,T.Toba,M.Owari and Y.Nihei: "Shave-off depth profiling of multi-layer samples using a gallium focused ion beam SIMS"Secondary ion mass spectrometry SIMS XII. 473-476 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Nojima,B.Tomiyasu,T.Shibata,M.Owari and Y.Nihei: "Development of nano-scale FIB SIMS apparatus"Proceeding of international union of microbeam analysis societies IUMAS 2000. 343-344 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] B.Tomiyasu,M.Owari and Y.Nihei: "Highly reliable quantitative analysis with Ga-FIB SIMS measurement by simultaneous multi-element detection system"Proceeding of international union of microbeam analysis societies IUMAS 2000. 345-346 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 冨安,逆瀬川,鳥羽,尾張,二瓶: "サブミクロンSIMS法におけるshave-off深さ方向分解能ま向上"表面科学. 20・8. 523-529 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] B.Tomiyasu,S.Sakasegawa,T.Toba,M.Owari and Y.Nihei: "Shave-off depth profiling of multi-layer samples using a gallium focused ion beam SIMS"Secondary ion mass spectrometry SIMS XII. (in press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] B.Tomiyasu,M.Owari and Y.Nihei: "Improvement on analytical reliability of destructive local analysis by simultaneous multi-element measurement"Proceeding of co-operation on international traceability in analytical chemistru CITAC'99. 112 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M.Nojima,B.Tomiyasu,M.Owari and Y.Nihei: "Development of nano-scale FIB SIMS apparatus"Proceeding of international union of microbeam analysis societies IUMAS 2000. (in press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] B.Tomiyasu,M.Owari and Y.Nihei: "Highly reliable quantitative analysis with Ga-FIB SIMS measurement by simultaneous multi-element detection system"Proceeding of international union of microbeam analysis societies IUMAS 2000. (in press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] 冨安,野島,坂本,尾張,二瓶: "ガリウム収束イオンビーム二次イオン質量分析法を用いた材料分析"第3回分析化学東京シンポジウム分析機器展招待ポスター講演要旨集. 194 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 野島,冨安,柴田,二瓶: "ナノスケールFIB-SIMS装置の試作研究"第19回表面科学講演大会講演要旨集. 99 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 野島,冨安,柴田,尾張,二瓶: "ナノスケールFIB-SIMS装置の試作研究"第47回応用物理学関係連合講演会講演予稿集. (in press). (2000)

    • Related Report
      1999 Annual Research Report

URL: 

Published: 1999-04-01   Modified: 2016-04-21  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi