Study of Surface Structure by means of Correlated Thermal Diffuse Scattering.
| Project/Area Number |
11640305
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
固体物性Ⅰ(光物性・半導体・誘電体)
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| Research Institution | Tohoku University |
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Principal Investigator |
ABUKAWA Tadashi Research Institute for Scientific Measurements, Tohoku University, Research Associates, 科学計測研究所, 助手 (20241581)
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| Project Period (FY) |
1999 – 2000
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| Project Status |
Completed (Fiscal Year 2000)
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| Budget Amount *help |
¥3,600,000 (Direct Cost: ¥3,600,000)
Fiscal Year 2000: ¥700,000 (Direct Cost: ¥700,000)
Fiscal Year 1999: ¥2,900,000 (Direct Cost: ¥2,900,000)
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| Keywords | Thermal Diffuse Scattering / Electron Diffraction / Surface Structure / Patterson Functin / Direct Method / Solid Surface |
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| Research Abstract |
The purpose of this research project is the accurate surface structure investigation using a recently developed technique, the correlated thermal diffuse scattering (CTDS). Characteristics and weak points of the methods have been investigated to improve the performance. Then the new two-dimensional detection system for diffraction patterns has been constructed. The system consists of a chilled CCD video camera, a high dynamic range video frame grabber and a personal computer. The new detection system speeds up the data acquisition time more than 8 times of those using the previous system, and enables to access a large volume of the diffraction data, which is crucial for the accurate structural investigation. Si (001) 2x1 surface and Si (111) root3 x root3 surface have been investigated by the CTDS using the new detection system The surface structures of both surfaces are clearly reconstructed by CTDS, and the results are consistent with those for previous studies by other methods. The comparison between the present and previous indicates the high structural accuracy, which is about 0.1A, of the present CTDS.
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Report
(3 results)
Research Products
(6 results)
