| Project/Area Number |
11650019
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied materials science/Crystal engineering
|
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| Research Institution | Kyushu Institute of Technology |
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Principal Investigator |
CHIKAURA Yoshinori Kyushu Institute of Technology, Department of Materials Science, Professor, 工学部, 教授 (40016168)
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| Co-Investigator(Kenkyū-buntansha) |
SUZUKI Yoshifumi Kyushu Institute of Technology, Department of Materials Science, Associate Professor, 工学部, 助教授 (10206550)
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| Project Period (FY) |
1999 – 2001
|
| Project Status |
Completed (Fiscal Year 2001)
|
| Budget Amount *help |
¥3,700,000 (Direct Cost: ¥3,700,000)
Fiscal Year 2001: ¥300,000 (Direct Cost: ¥300,000)
Fiscal Year 2000: ¥900,000 (Direct Cost: ¥900,000)
Fiscal Year 1999: ¥2,500,000 (Direct Cost: ¥2,500,000)
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| Keywords | X-Ray topography / Microbeam / syncrotoron radiation / X-Ray scattering topography / High enery white and parallel microbeam / 表面トポグラフィ |
|---|
| Research Abstract |
Scanning type X-ray scattering topography system using high energy white and parallel microbeam which was successfully formed by a very small diaphragm (microhole). The observation of a Germanium single crystal clearly revealed dislocations with better contrast and resolution than in a conventional white beam topograph. The present research has shown advantages of a high energy white and parallel microbeam in materials-imaging by X-ray scattering topography. Besides the imaging system equipped with an energy sensitive multi-channel detecting system has provided a function of local spectroscopy simultaneously.
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