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Preparation of Thermoelectric Material by Reactive Diffusion Method

Research Project

Project/Area Number 11695053
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section一般
Research Field Physical properties of metals
Research InstitutionKyushu Institute of Technology

Principal Investigator

SHIMOZAKI Toshitada  Kyushu Institute of Technology, Center for Instrumental Analysis, Assistant Professor., 機器分析センター, 助教授 (00093964)

Co-Investigator(Kenkyū-buntansha) 篠崎 信也  九州工業大学, 工学部, 助教授 (00136524)
Project Period (FY) 1999 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥2,500,000 (Direct Cost: ¥2,500,000)
Fiscal Year 2000: ¥1,300,000 (Direct Cost: ¥1,300,000)
Fiscal Year 1999: ¥1,200,000 (Direct Cost: ¥1,200,000)
KeywordsTHERMOELECTRIC MATERIAL / CoSb3 / FeSi2 / POROUS MATERIAL / THERMAL CONDUCTIVITY / KIRKENDALL VOIDS / 鉄-珪素系 / 鉄シリサイド / Co-Sb系 / CoSb3 / 固体-気体反応 / 固体-液体反応
Research Abstract

As important characters of intermetallic compounds formed by reaction diffusion, we can pick up the followings, i.e., they do not include any needless phases, they can be prepared without contamination from crucible or air, they have clean phase boundary interface and they can have orientated grains. When we can apply this method practically, there are possibilities to prepare more excellent thermoelectric materials than that so far.
It has been well known that the thermoelectric properties of FeSi2 are not affected by the purity of iron and Si. However, iron plates used up to the present were less than 99.99% and they might have been contaminated during the preparing process. Further there is no study in which high purity iron and silicon were used. A purpose of this work is to make thermoelectric material by using ultra high purity starting materials taking the contamination due to melting into account and to study the thermoelectric properties. For the purpose we use reaction diffusion method using high purity Fe, Co, Si and Sb materials.
Fe-Si, Co-Si and Co-Sb binary systems have been studied. It has been clarified by this work that main diffusion layer formed in the Fe-Si diffusion couples is Fe3Si. The growth rate of Fe3Si depends significantly on the purity of iron. Oxygen in iron slows down the growth rate of Fe3Si.
In the Co-Si binary systems we have clarified the growth kinetics of CoSi and CoSi2. Both FeSi2 and CoSi or CoSi2 are difficult to make them by the reactive diffusion method. We have tried to make CoSb3 in Co-Sb binary system by using various kinds of diffusion couples such as S-Co/S-Sb diffusion couples, S-Co/L-Sb diffusion couples and S-Co/V-Sb diffusion couples. By this technique we could make CoSb3 including many small voids. The existence of voids is expected to decrease thermal conductivity of CoSb3 so the thermoelectric properties will also be expected to be improved.

Report

(3 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • Research Products

    (18 results)

All Other

All Publications (18 results)

  • [Publications] T.Shimozaki: "The Role of Iron in Ti on The Growth of Ti Siliciler in Bulk Ti/Si Dittusion Couple"Mater.Trans.JIM. 40・7. 612-617 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.Okino: "Thermal equilibrium concentrations and Dittusinoty of intrinsic point detects in Silicon"Physica B. 273-274. 509-511 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] K.Fujiwara: "Measurement of Intrinsic coefficients in Ni_3Al"The JAPAN INSTITUTE of METALS PROCEEDING. 12. 481-484 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 金槿銖: "Co/Siバルク拡散対における反応拡散"日本金属学会誌. 64.6. 771-775 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.Shimozaki: "Reactine Dittusion Between Ultra High Purity Iron and Silicon Water"Mater.Trans. 42・4. 15-20 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Toshitada Shimozaki: "The Role of Iron on the Growth of Ti Silicides in Bulk Ti/Si Diffusion Couple"Trans.JIM.. Vol.40, No.7. 612-617 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Toshitada Shimozaki: "Oxidation of GaAlAs Red LED Surface Due to Light irradiation"1998 IEEE Semi-conducting and Insulating Materials Conference, Institute of Electrical and Electronics Engineers, Inc.. 214-217 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] K.Fujiwara: "Measurements of Intrinsic Diffusion Coefficients in Ni3Al"THE JAPAN INSTITUTE OF METALS PROCEEDINGS, Solid-Solid Phase Transformations, Edited by M.Koiwa K.Otsuka T.Miyazaki. VOLUME 12 (JIMIC-3). 481-484 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Keun-Soo Kim: "Reactive Diffusion in Co-Si Bulk Diffusion couple."J.Japan Inst.Met.. vol.64. 771-775 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.Shimozaki: "Reactive Diffusion Between Ultra High Purity Iron and Silicon Wafer"Mater.Trans.. Vol.42, No.4. 15-20 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.Shimogalai: "The Role of Iron in Ti on The Growth of Ti Silicidesin Bulk Ti/Si Diffusion Couple"Mater.Trano.JIM. 40・7. 612-617 (1999)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Okino: "Thermal equilibrium Concentrations and Diffusion of intrinsic point detects in Silicon"Physica B. 273〜274. 509-511 (1999)

    • Related Report
      2000 Annual Research Report
  • [Publications] K.Fujiwara: "Measurement of Intrinsic Coefficients in Ni_3Al"The JAPAN INSTITUTE of METALS PROCEEDING. 12. 481-484 (1999)

    • Related Report
      2000 Annual Research Report
  • [Publications] 金槿銖: "Co/Siバルク拡散対における反応拡散"日本金属学会誌. 64・6. 771-775 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Shimozaki: "Reactive Diffusion Between Ultra High Purity Iron and Silicon Water"Mater.Trans.. 42・4. 15-20 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] Takahisa Okino: "Analysis of Dopant Diffusion in Si with stacking faults,"Mater.Trans.JIM.,. Vol.40. 474-478 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Toshitada Shimozaki: "The Role of Iron in Ti on The Growth of Ti Silicides in Bulk Ti/Si Diffusion Couples"Mater.Trans.JIM.. Vol.40,No.7,. 612-617 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Toshitada Shimozaki: "Oxidation of GaAlAs Red LED Surface Due to Light irradiation"Processings of SIMC-X,. 214-217 (1999)

    • Related Report
      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2016-04-21  

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