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新しく提唱したX線計測原理の実証とこれを用いた新電子温度測定法の着想の実証と確立

Research Project

Project/Area Number 11780353
Research Category

Grant-in-Aid for Encouragement of Young Scientists (A)

Allocation TypeSingle-year Grants
Research Field Nuclear fusion studies
Research InstitutionUniversity of Tsukuba

Principal Investigator

小波蔵 純子  筑波大学, 物理学系, 助手 (60302345)

Project Period (FY) 1999 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥2,200,000 (Direct Cost: ¥2,200,000)
Fiscal Year 2000: ¥700,000 (Direct Cost: ¥700,000)
Fiscal Year 1999: ¥1,500,000 (Direct Cost: ¥1,500,000)
Keywordsプラズマ計測 / X線計測 / 半導体計測器 / プラズマ電子温度 / 電子温度計測 / 拡散電荷
Research Abstract

本方式の独創的な点である、半導体空乏層内のX線生成電荷(電子温度Te,密度n,有効電荷zeffに複雑に依存)を用いる定説的手法を覆し、空乏層を「X線吸収体」として用いる新着想(従来用いられた事の無い、無電場基板領域でのTeのみに分布形状が依存するX線生成三次元拡散電荷を用いる)の有効性検証として、昨年度までに以下の配位で拡散電荷分布の形成を確認した。即ち、計測器の空乏層厚d∝V_<1/2>(Vは外部印加電圧)をVの時間掃引により時間変化させ、空乏層での吸収X線を変化させると空乏層を通り抜け空乏層の背後の無電場領域まで到達できるX線のエネルギーが変化する。また、無電場領域内の深さ方向のX線生成電荷分布形状は、無電場領域でのX線減衰分布形状(X線エネルギーに依存)で決まる。これら、X線エネルギーに依り生成分布が異なる電荷が、無電場領域で三次元拡散し、X線入射の無い隣接チャンネルに拡散し、入射エネルギーに特有の拡散電荷分布を形作る。今年度は更に異なる種々のエネルギーでの計測を行った。一方で、このような実験配位に於ける、拡散分布形状のエネルギー依存性を、我々が提唱した新感度理論を用いて計算し求めた。これら実験値と計算値とを比較した結果、入射X線のエネルギーを導出することができた。これより、温度、密度、有効電荷に複雑に依存する空乏層を用いた、従来のX線計測の原理的困難を解決する、我々の独創に基づくX線エネルギー、延いては電子温度計測の新原理を実証した。

Report

(2 results)
  • 2000 Annual Research Report
  • 1999 Annual Research Report
  • Research Products

    (11 results)

All Other

All Publications (11 results)

  • [Publications] J.Kohagura: "Investigation of X-ray-Energy Responses of Semiconductor Detectors under Deuterium-Tritium Fusion-Produced Neutron Irradiation"Review of Scientific Instruments. 72. 805-808 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] J.Kohagura: "Characterization of X-Ray-Energy Responses of Semiconductor Detectors After Fusion Produced Neutron Exposure"Transactions of Fusion Technology. 39. 159-162 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Cho: "Summarized Scaling Laws of Potential Confined Plasmas in the GAMMA 10 Tandem Mirror"Transactions of Fusion Technology. 39. 33-40 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Hirata: "Development of Novel Ion-Energy Spectrometer Using a Semiconductor Detector Collector Under a Circumstance of Simultaneously Incident Ions and Electrons with X rays"Transactions of Fusion Technology. 39. 281-284 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] T.Numakura: "Simultaneous Measurements of Spatial Profiles of Ion and Electron Temperatures Using a Semiconductor Detector Array"Transactions of Fusion Technology. 39. 277-280 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] R.Minami: "Simultaneous Observations of Temporally and Spatially Resolved Electron Temperatures of Both Circular Central-Cell and Elliptical Anchor Region Plasmas in GAMMA 10"Review of Scientific Instruments. 72. 1193-1196 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] J.Kohagura et al.: "Newly Developed Matrix-Type Semiconductor Detector for Temporally and Spatially Resolved X-Ray Analyses Ranging Down to a Few Tens eV Using a Single Plasma Shot"Review of Scientific Instruments. 70,No.1. 633-636 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T.Cho et al.: "Investigations of Electron Behavior in the GAMMA10 Tandem Mirror on the Basis of X-ray Analyses Using a Novel Theory on Semiconductor Detector Response"Transactions of Fusion Technology. 35,No.1T. 151-155 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T.Cho et al.: "A New Principle in Plasma Electron-Temperature Diagnostics Using a Semiconductor X-ray Detector"Plasma Devices and Operations. 7,No.2. 85-92 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T.Cho et al.: "Effects of Neutrons on Semiconductor X-Ray Detectors Including n-Type Joint European Torus and p-Type GAMMA10 Tomography Detectors"Review of Scientific Instruments. 70,No.1. 577-580 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] T.Numakura et al.: "A Diagnostic Method for Both Plasma Ion and Electron Temperatures under Simultaneous Incidence of Charge-Exhange Particles and X Rays into a Semiconductor Detector Array"Applied Physics Letters. 76,No.2. 146-148 (2000)

    • Related Report
      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2016-04-21  

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