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MOCVD法による高品質強誘電体薄膜の作製と物性評価

Research Project

Project/Area Number 12134207
Research Category

Grant-in-Aid for Scientific Research on Priority Areas

Allocation TypeSingle-year Grants
Review Section Science and Engineering
Research InstitutionHimeji Institute of Technology

Principal Investigator

清水 勝  姫路工業大学, 工学研究科, 助教授 (30154305)

Co-Investigator(Kenkyū-buntansha) 安達 正利  富山県立大学, 工学部, 教授 (90026287)
藤沢 浩訓  姫路工業大学, 工学研究科, 助手 (30285340)
丹生 博彦  姫路工業大学, 工学研究科, 教授 (40047618)
Project Period (FY) 2000 – 2003
Project Status Completed (Fiscal Year 2003)
Budget Amount *help
¥42,700,000 (Direct Cost: ¥42,700,000)
Fiscal Year 2003: ¥14,000,000 (Direct Cost: ¥14,000,000)
Fiscal Year 2002: ¥14,200,000 (Direct Cost: ¥14,200,000)
Fiscal Year 2001: ¥14,500,000 (Direct Cost: ¥14,500,000)
KeywordsMOCVD法 / 強誘電体 / Pb(Zr,Ti)O_3 / 極薄膜 / ナノ構造 / 自己集合 / エピタキシャル成長 / 圧電応答顕微鏡 / MOCVD / 高品質強誘電体薄膜 / 強誘電性 / 三次元キャパシタ / Volmer-Waber成長 / Stranski-Krastanov成長 / 低温成長 / Ir薄膜 / 立体構造PZTキャパシタ / 島状核 / 成長機構 / 二段階成長法 / 圧電振動応答
Research Abstract

当該年度は、メモリ素子の低電圧駆動や高集積化を目指した強誘電体PZT極薄膜や自己集合ナノ構造について研究を進めた結果、以下の成果が得られた。
1.原子レベルで平坦化したSrTiO_3基板上に、平坦なテラスとステップ構造を有するSrRuO_3下部電極膜を得ることができた。また、SrRuO_3の組成によりテラス幅とステップ高さが変化することが分かった。この、SrRuO_3/SrTiO_3基板上に厚さ15-20nmという薄さながら強誘電性を示すPZT極薄膜を再現性良く得ることができた。
2.SrTiO_3基板上へSrTi_xRu_<1-x>O_3薄膜の成長を行った結果、非常に平坦なテラス(最大高低差:0.4nm)とステップ構造を有する薄膜が得られ、PZT極薄膜成長用下部電極として有望であること分かった。
3.圧電応答顕微鏡法によりPZT極薄膜の圧電性、強誘電性を調べたところ、膜厚10nm以下のPZT極薄膜が強誘電性を示すことが観察された。
4.MOCVD法により強誘電体PbTiO_3やPZT自己集合ナノ島構造をSrTiO_3及びMgO単結晶基板上に形成することができた。Pt(111)/SrTiO_3(111)上にはピラミッド状,Pt(110)/SrTiO_3(110)上には三角柱状、Pt(100)/SrTiO_3(100)上にはシート状のナノ構造が形成された。
5.各々のナノ構造の形状や面内方位は揃っており、エピタキシャル関係を利用することで、形状や方位などの構造制御が行えることが分かった。
6.各基板上に得られたナノ構造を圧電応答顕微鏡法により調べたところ、得られたナノ構造が圧電性、強誘電性を有することが分かった。
7.MOCVD用新規Ir原料であるIr(EtCp)(CHD)を用いIr膜の作製・評価を行なったところ、PZTキャパシタ電極用原料として優れた性質を持つことが分かった。

Report

(4 results)
  • 2003 Annual Research Report
  • 2002 Annual Research Report
  • 2001 Annual Research Report
  • 2000 Annual Research Report
  • Research Products

    (44 results)

All Other

All Publications (44 results)

  • [Publications] Masaru Shimizu: "Self-Assembled PbTiO_3 Nanoislands Prepared by MOCVD"Integrated Ferroelectrics. 未定. (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] Masaru Shimizu: "Ferroelectric Properties of Pb(Zr,Ti)O_3 Thin Films Prepared by Low-Temperature MOCVD Using PbTiO_3 Seeds"J.Eur.Ceram.Soc.. 24. 1625-1628 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hironori Fujisawa: "Ferroelectricity of the 1.7nm-High and 38nm-Wide Self-Assembled PbTiO_3 Island"J.Eur.Ceram.Soc.. 24. 1641-1645 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hajime Nonomura: "Self-Assembled PbTiO_3 Nano-Islands Prepared on SrTiO_3 by Metalorganic Chemical Vapor Deposition"Jpn.J.Appl.Phys.. 24. 5918-5921 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Akira Shibuya: "Natural-Superlattice-Structured Bi_4Ti_3O_<12>-SrBi_4Ti_4O_<15> Ferroelectric Thin Films"Appl.Phys.Lett.. 82. 784-786 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Masaru Shimizu: "Characterization of PZT Capacitors with Ir Electrodes Prepared Solely by Low-Temperature MOCVD"J.Korean Phys.Soc.. 42. S1203-S1206 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hironori Fujisawa: "Characterization of MOCVD-TiO_2 and ZrO_2 Insulating Layers in MFIS Structures by DLTS and ICTS Methods"J.Korean Phys.Soc.. 42. S1354-S1356 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hajime Nonomura: "Ferroelectric Properties of 15-2Onm-Tick PZT Ultrathin Films Prepared by MOCVD"Mat.Res.Soc.Symp.Proc.. 748. 81-86 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hironori Fujisawa: "Investigation of Domain Wall Velocity and Nucleation Rate in Polarization Switching of Epitaxial Pb(Zr,Ti)O_3 Thin Films Using Piezoresponse Scanning Microscopy"Mat.Res.Soc.Symp.Proc.. 748. 255-260 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 清水 勝: "圧電応答顕微鏡による強誘電体薄膜の観察と評価"セラミックス. 10月号. 791-794 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 岡庭 守: "MOCVD法によるPb(Zr,Ti)O_3薄膜の低温成長と特性の改善"信学技報. 103. 1-6 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hironori Fujisawa: "Ir Thin Films for PZT Capacitors Prepared by MOCVD Using a New Ir Precursor"Mat.Res.Soc.Symp.Proc.. 764(未定). (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] Hironori Fujisawa: "Nanoscale Phenomena in Ferroelectric Thin Films"Kluwer Academic Publishers. 288 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Shimizu: "Growth of Ferroelectric PbZr_xTi_<1-x>O_3 Thin Films by Metalorganic Chemical Vapor Deposition"Journal of Crystal Growth. 237-239(P1). 448-454 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Fujisawa: "Observations of Initial Growth Stage of Epitaxial Pb(Zr, Ti)O_3 Thin Films on SrTiO_3(100) Substrate by MOCVD"Journal of Crystal Growth. 237-239(P1). 459-463 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Shimizu: "Low Temperature Growth of Pb(Zr, Ti)O_3 Thin Films by Two Step MOCVD Using Seeds"Ferroelectrics. 271. 217-222 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Fujisawa: "Investigation of Polarization Switching Processes in Pb(Zr, Ti)O_3 Capacitors Using Piezoresponse Imaging"Ferroelectrics. 269. 21-26 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Nonomura: "Epitaxial Growth and Ferroelectric Properties of the 20-nm-thick Pb(Zr, Ti)O_3 Film on SrTiO_3(100) with an Atomically Flat Surface by Metalorganic Chemical Vapor Deposition"Japanese Jouranl of Applied Physics. 41. 6682-6685 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Shimizu: "Crystalline and Ferroelectric Properties of Low-temperature Grown Pb(Zr, Ti)O_3 Thin Films by Metalorganic Chemical Vapor Deposition"Japanese Jouranl of Applied Physics. 41. 6686-6689 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Fujisawa: "Domain Motions in Epitaxial Pb(Zr, Ti)O_3 Thin Film Capacitors by Piezoresponse Scanning Force Microscopy"Proceedings of the 2002 13th IEEE International Symposium on Applications of Ferroelectrics. (印刷中).

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Shimizu: "Characterization of PZT Capacitors with Ir Electrodes Prepared Solely by Low-Temperature MOCVD"Journal of the Korean Physical Society. (印刷中). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Fujisawa: "Characterization of MOCVD-TiO_2 and ZrO_2 Insulating Layers in MFIS Structures by DLTS and ICTS methods"Journal of the Korean Physical Society. (印刷中). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Shimizu: "Ferroelectric Properties of Pb(Zr, Ti)O_3 Thin Films Prepared by Low-Temperature MOCVD Using PbTiO_3 Seeds"Journal of European Ceramic Society. (印刷中). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Fujisawa: "Ferroelectricity of the 1.7nm-high and 38nm-wide self-assembled PbTiO_3 island"Journal of European Ceramic Society. (印刷中). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Nonomura: "Ferroelectric Properties of 15-20nm-Thick PZT Ultra-Thin Films Prepared By MOCVD"Materials Research Society Symposium Proceedings. 748(印刷中). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] H.Fujisawa: "Investigation of Domain Wall Velocity and Nucleation Rate in Polarization Switching of Epitaxial Pb(Zr, Ti)O_3 Thin Films Using Piezoresponse Scanning Force Microscopy"Materials Research Society Symposium Proceedings. 748(印刷中). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] 藤沢 浩訓: "圧電応答顕微鏡による強誘電体Pb(Zr, Ti)O_3薄膜の分極反転過程の観察"材料. 51. 975-978 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Shimizu: "MOCVD of Ir and IrO_2 Thin Films for PZT Capacitors"Materials Research Symposium Proceedings. 655. CC1.10.1-CC1.10.6 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] H.Fujisawa: "Piezoresponse Measurements for Pb(Zr,Ti)O_3 Island Structure Using Scanning Probe Microscope"Materials Research Symposium Proceedings. 655. CC10.4.1-CC10.4.6 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] H.Fujisawa: "Low-Temperature Fabrication of Ir/Pb(Zr,Ti)O_3/Ir Capacitors Solely by Metalorganic Chemical vapor Deposition"Japanese Journal of Applied Physics. 40. 5531-5553 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] M.Shimizu: "Low Temperature Growth of Pb(Zr,Ti)O_3 Thin Films by Two Step MOCVD Using Seeds"Ferroelectrics. (印刷中)(未定). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] M.Shimizu: "Growth of Ferroelectric PbZr_xTi_<1-x>O_3 Thin Films by Metalorganic Chemical Vapor Deposition"Journal of Crystal Growth. (印刷中)(未定). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] H.Fujisawa: "Observations of Initial Growth Stage of Epitaxial Pb(Zr,Ti)O_3 Thin Films on SrTiO_3(100) Substrate by MOCVD"Journal of Crystal Growth. (印刷中)(未定). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 清水 勝(分担執筆): "誘電体材料の特性と測定・評価および応用技術"技術情報協会. 11 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] M.Shimizu et al.: "Effects of Film Thickness and Grain Size on the Electrical Properties of Pb(Zr,Ti)O_3 Thin Films Prepared by MOCVD"Ferroelectrics. 241. 183-190 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Shimizu et al.: "Thickness Dependence of Crystalline and Electrical Properties of Ultrathin PZT Films Grown on SrRuO_3/SrTiO_3 by MOCVD"Materials Research Society Symposium Proceedings. 596. 259-264 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Fujisawa et al.: "Observations of Domain Structure at Initial Growth Stage of PbTiO_3 Thin Films Grown by MOCVD"Materials Research Society Symposium Proceedings. 596. 321-326 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Fujisawa et al.: "Observations of Island Structures at the Initial Growth Stage of PbZr_xTi_<1-x>O_3 Thin Films Prepared by Metalorganic Chemical Vapor Deposition"Japanese Journal of Applied Physics. 39. 5446-5450 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Kobune et al.: "Effects of Pt/SrRuO_3 Top Electrodes on Ferroelectric Properties of Epitaxial (Pb,La)(Zr,Ti)O_3 Thin Films"Japanese Journal of Applied Physics. 39. 5451-5455 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Shimizu et al.: "Preparation of Ir-Based Thin Film Electrodes by MOCVD"Proceedings of the 12th IEEE International Symposium on the Applications of ferroelectrics. (印刷中).

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Fujisawa et al.: "Observation of Polarization Reversal Processes in Pb(Zr,Ti)O_3 Thin Films Using Atomic Force Microscopy"Proceedings of the 12th IEEE International Symposium on the Applications of Ferroelectrics. (印刷中).

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Shimizu et al.: "MOCVD of Ir and IrO_2 Thin Films for PZT Capacitors"Materials Research Society Symposium Proceedings. 655(印刷中).

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Fujisawa et al.: "Piezoresponse Measurements for Pb(Zr,Ti)O_3 Island Structure Using Scanning Probe Microscopy"Materials Research Society Symposium Proceedings. 655(印刷中).

    • Related Report
      2000 Annual Research Report
  • [Publications] 藤沢浩訓 他: "I層にMgOを用いたMIS及びMFIS構造の作製とその評価"電子情報通信学会技術研究報告書. SDM2000-233. 33-37 (2001)

    • Related Report
      2000 Annual Research Report

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Published: 2001-04-01   Modified: 2018-03-28  

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