| Project/Area Number |
12354008
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| Research Category |
Grant-in-Aid for Scientific Research (A)
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| Allocation Type | Single-year Grants |
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| Section | 展開研究 |
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| Research Field |
Inorganic chemistry
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| Research Institution | The University of Tokyo |
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Principal Investigator |
MATSUSHITA Nobuyuki The University of Tokyo, Graduate School of Arts and Science, Associate Professor, 大学院・総合文化研究科, 助教授 (80219427)
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| Co-Investigator(Kenkyū-buntansha) |
NISHIKIORI Shin-ichi The University of Tokyo, Graduate School of Arts and Science, Associate Professor, 大学院・総合文化研究科, 助教授 (70134400)
SHIMOI Mamoru The University of Tokyo, Graduate School of Arts and Science, Professor, 大学院・総合文化研究科, 教授 (30092240)
KOJIMA Norimichi The University of Tokyo, Graduate School of Arts and Science, Professor, 大学院・総合文化研究科, 教授 (60149656)
城 始勇 理学電機(株), X線研究所, 主任研究員
MOTOO Shiro RIGAKU CO., LTD., X-ray Research Laboratory, Chief Scientist
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| Project Period (FY) |
2000 – 2003
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| Project Status |
Completed (Fiscal Year 2003)
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| Budget Amount *help |
¥43,080,000 (Direct Cost: ¥40,200,000、Indirect Cost: ¥2,880,000)
Fiscal Year 2003: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Fiscal Year 2002: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2001: ¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
Fiscal Year 2000: ¥30,600,000 (Direct Cost: ¥30,600,000)
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| Keywords | high pressure / crystal structure analysis / X-ray diffraction / Imaging Plate / diamond anvil / ダイヤモンドアンビルセル |
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| Research Abstract |
A single-crystal X-ray diffractometer with Imaging Plate(IP) as a two dimensional detector was assessed suitable for structure analysis of metal complexes. X-ray diffraction data were measured for a number of single-crystals of various metal complexes using the IP X-ray diffractometer, and their structure analyses were performed To compare with these results, ten of their metal complexes were also measured by using a 4-circle X-ray diffractometer, which is a typical one for the single-crystal structure analysis. The results of the analyses from the IP X-ray diffractometer were satisfactory.
A diamond-anvil-cell (DAC) being able to be mount with the IP X-ray diffractometer was developed as a high-pressure apparatus. That is a 40 mmφ DAC, which is lather than a typical DAC for single-crystal diffraction. A goniometer-head was also developed suitable for the 40 mmφDAC and the IP X-ray diffractometer.
A high precise drilling machine for gasket hole and various jigs were manufactured to precisely manipulate very small single crystals in the DAC.
A lighting system, a beam-stopper, and collimaters around the goniometer were rebuilt to mount the DAC on the IP X-my diffractometer.
Movement of the goniometer with DAC was checked It is confirmed that the collision and any other trouble were not happened in the movement As a torsion of the goniometer-head was, however, observed due to the weight of the DAC in the check process, the goniometer-head was rebuilt to strengthen it.
Measurement procedures and technique were studied and developed for the single crystal in the DAC on the IP X-ray diffractometer.
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