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Development of System Identification Device for Control Systems Design

Research Project

Project/Area Number 12555121
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field Control engineering
Research InstitutionUtsunomiya University

Principal Investigator

ADACHI Shuichi  Utsunomiya Univ., Fac. of Engineering, Professor, 工学部, 教授 (40222624)

Co-Investigator(Kenkyū-buntansha) WAKUI Shinji  Tokyo University of Agriculture and Technology, Professor, 工学部, 教授 (70334472)
FUNATO Hirohito  Utsunomiya Univ., Fac. of Engineering, Associate Professor, 工学部, 助教授 (60272217)
Project Period (FY) 2000 – 2002
Project Status Completed (Fiscal Year 2002)
Budget Amount *help
¥8,100,000 (Direct Cost: ¥8,100,000)
Fiscal Year 2002: ¥1,300,000 (Direct Cost: ¥1,300,000)
Fiscal Year 2001: ¥2,300,000 (Direct Cost: ¥2,300,000)
Fiscal Year 2000: ¥4,500,000 (Direct Cost: ¥4,500,000)
KeywordsContorol / Modeling / System Identification
Research Abstract

This research develops a system identification device for control system's design. A prototype of the hardware has been developed and a GUI (Graphical User Interface)that supports system identification operation has been installed in the system identification device. The system identification device also includes new system identification methods such as
1) System identification method based on SVM (support vector machine),
2) System identification methods for non-uniform sampling data.
The former method that is SVM-based system identification method is proposed for linear regression models such as ARX (Auto-Regressive with eXtra input) model, and it is shown that the method is robust for input-output data with outliner.
In the latter method, non-uniform sampling data is first transformed to uniform sampling data whose sampling period is smaller than the original data. Second a system identification method with missing data estimation is applied to the data.
The effectiveness of the developed system identification device is examined using experimental apparatus such as an inverted pendulum and an active noise control svstem.

Report

(4 results)
  • 2002 Annual Research Report   Final Research Report Summary
  • 2001 Annual Research Report
  • 2000 Annual Research Report
  • Research Products

    (16 results)

All Other

All Publications (16 results)

  • [Publications] S.Adachi, T.Ogawa, R.Konno: "A system identification method for linear regression models based on support vector machine"Trans.of SICE. 37. 1189-1191 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 足立, 丹治: "欠損データ推定に基づく不等間隔サンプリングデータに対するシステム同定法"電気学会論文誌(C). 122-C. 1383-1384 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 足立, 高梨, 山口: "不完全な情報下におけるシステム同定法"電気学会論文誌(D). 123-D(発行予定). (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] S.Adachi, H.Takanashi et al.: "System identification and physical parameter estimation of anti-vibration units in semiconductor exposure apparatus"IFAC SYSID 2000. 563-568 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] S.Adachi, T.Ogawa: "A new system identification method based on support vector machines"IFAC Workshop on Adaptation and Learning in Control and Signal Processing. (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] S.Adachi, T.Ogawa and R.Konno: "A system identification method for linear regression models based on support vector machine"Transactions of the Society of Instrument and Control Engineers. 37, No. 12. 1189-1191 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] S.Adachi and M.Tanji: "A system identification method for nonuniform sampling data based on missing data estimation"Trans. of IEE Japan. 122-C, No.8. 1383-1384 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] S.Adachi, H.Takanashi and T.Yamaguchi: "System identification under imperfect information --- System identification of mobile robot by using image information---"Trans. of IEE Japan. 123-D, No.3. (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] S.Adachi, H.Takanashi, H.Kato, T.Mayama and S.Wakui: "System identification and physical parameter estimation of anti-vibration units in semiconductor exposure apparatus"IFAC SYSID2000. 563-568 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] S.Adachi and T.Ogawa: "A new system identification method based on support vector machines"IFAC Workshop on Adaptation and Learning in Control and Signal Processing, Como, Italy. (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 足立, 丹治: "欠損データ推定に基づく不等間隔サンプリングデータに対するシステム同定法"電気学会論文誌(C). 122-C. 1383-1384 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 足立, 高梨, 山口: "不完全な情報下におけるシステム同定法"電気学会論文誌(B). 123-D(発行予定). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] 高梨, 涌井, 足立 ほか: "部分空間法による除振マウント支持の半導体露光装置に対する多変数システム同定実験"システム制御情報学会論文誌. 14・7. 339-346 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 高梨, 間山, 涌井, 足立: "多変数システム同定結果に基づく除振マウント支持の半導体露光装置の物理パラメータ推定"システム制御情報学会論文誌. 14・8. 418-420 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] S. Adachi, T. Ogawa, R. Konno: "A system identification method for Linear regression models based on support vector machine"Trans. of SICE. 37・12. 1189-1191 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] S.Adachi ほか4名: "System identification and physical parameter estimation of anti-vibration units in semiconductor exposure apparatus"IFAC SYSID'01. (2000)

    • Related Report
      2000 Annual Research Report

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Published: 2000-04-01   Modified: 2016-04-21  

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