| Project/Area Number |
12555240
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 展開研究 |
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| Research Field |
工業物理化学
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| Research Institution | Utsunomiya University |
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Principal Investigator |
KATO Teiji Utsunomiya University, Faculty of Engineering, Department of Applied Chemistry, Professor, 工学部, 教授 (60008068)
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| Co-Investigator(Kenkyū-buntansha) |
IIMURA Ken-ichi Utsunomiya University, Faculty of Engineering, Department of Applied Chemistry, research associate, 工学部, 助手 (10272220)
SUZUKI Noboru Utsunomiya University, Faculty of Engineering, Department of Applied Chemistry, associate Professor, 工学部, 助教授 (40134259)
YOSHIDA Masaaki Utsunomiya University, Faculty of Engineering, Department of Applied Chemistry, associate Professor, 工学部, 助教授 (90114173)
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| Project Period (FY) |
2000 – 2001
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| Project Status |
Completed (Fiscal Year 2001)
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| Budget Amount *help |
¥12,400,000 (Direct Cost: ¥12,400,000)
Fiscal Year 2001: ¥2,700,000 (Direct Cost: ¥2,700,000)
Fiscal Year 2000: ¥9,700,000 (Direct Cost: ¥9,700,000)
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| Keywords | Second Harmonic Generation Microscopy (SHGM) / Langmuir Monolayers / Structure Observation / Gibbs Monolayers / Brewster Angle Microscopy / Pulse YAG Laser / 二次非線形光学 / YAGレーザー |
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| Research Abstract |
The first object of this project was to develop a Second Harmonic Generation Microscopy (SHGM) using a strong pulse YAG laser. This is to apply for study of monolayers at the water surface, solution surfaces or at the transparent solid surfaces. The YAG laser and an optical zooming microscope were set on the arms of a goniometer. The incident angle of the p-polarized laser light can be adjusted to the Brewster angle of the transparent medium to avoid exposure the CCD camera of higher sensitivity to the strong reflected light. We could observe SHG images from some samples on transparent supporting medium. Beside of the development of the SHGM, we proceeded studies on the structures of Langmuir and Gibbs monolayers using vibrational spectroscopy and Atomic Force Microscopy (AFM).
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