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Development of Harmless Disposal System of Fluoride and Chloride Gases by Chemical Reaction with Metal Oxide

Research Project

Project/Area Number 12555285
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field 資源開発工学
Research InstitutionKansai University

Principal Investigator

SHIBATA Junji  Kansai Univ., Faculty of Eng., Professor, 工学部, 教授 (70067742)

Co-Investigator(Kenkyū-buntansha) WAKAMATSU Takahide  Meijou Univ., Faculty of Eng., Professor, 都市情報学部, 教授 (50025897)
MURAYAMA Norihiro  Kansai Univ., Faculty of Eng., Assistant, 工学部, 助手 (90340653)
YAMAMOTO Hideki  Kansai Univ., Faculty of Eng., Associate Professor, 工学部, 助教授 (30174808)
Project Period (FY) 2000 – 2001
Project Status Completed (Fiscal Year 2001)
Budget Amount *help
¥8,800,000 (Direct Cost: ¥8,800,000)
Fiscal Year 2001: ¥3,900,000 (Direct Cost: ¥3,900,000)
Fiscal Year 2000: ¥4,900,000 (Direct Cost: ¥4,900,000)
Keywordsenvironmental protection / global warming gases / harmless disposal / semiconductor / etching gas / fluoride gas / nitrogen fluoride / metal chloride / 環境保全 / 特殊材料ガス / 半導体工業 / 3塩化ホウ素 / 金属酸化物
Research Abstract

A new technology to make fluoride and chloride gases such as NF_3 CF_4 and BC1_3 harmless has been developed and a new concept on the removing of toxic gas to be used in the advanced process of materials has been established. The fluoride gases are toxic and special type of gases to be used in the process of manufacturing semiconductors and their specific applications include the dry etching of semiconductors, cleaning of CVD systems, the oxidation agent for rocket fuel etc. As a fluoride gas like NF3 is, however, toxic and highly chemically stable, if discharged into the atmosphere, it is liable to cause far-reaching adverse influences on global warning in the same manner as carbon dioxide gas and freon gas.
The research team utilized the chemical reaction between fluoride gas and a metal chlorides and oxides, and established a new technology to make fluoride gas contained in the exhaust gas from semiconductor manufacturing plants convert directly into a harmless substance. Experimental results verify that the chemical reactions can be take place at substantially lower temperature of 80-400℃ as compared with the combustion treatment method. The other favorable characteristics are that continuous treatment is possible at a low temperature under atmospheric pressure, and that the process is compact easily controllable and safely operable at low running cost.

Report

(3 results)
  • 2001 Annual Research Report   Final Research Report Summary
  • 2000 Annual Research Report
  • Research Products

    (18 results)

All Other

All Publications (18 results)

  • [Publications] Hideki Yamamoto, Junji Shibata: "Disposal of Waste Fluoride and Chloride Gases in the Manufacturing Process of Semiconductors"Proceedings of Second International Conference on Material Processing for Properties (PMP2000). Vol.1. 685-688 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 芝田隼次, 山本秀樹: "半導体製造用特殊材料ガスの無害化処理技術の開発"エコインダストリー. 3巻. 26-33 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 芝田隼次, 山本秀樹: "フッ素系・塩素系特殊ガスの無害化技術"化学装置. 43巻,7号. 49-55 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 山本秀樹, 八橋拓也, 櫛田明広, 村山憲弘, 芝田隼次: "半導体製造工程から排出される特殊材料ガスの無害化処理"THERMOPHYSICAL PROPERTIES. 22. 64-66 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] Hideki Yamamoto, Takahiro Kawahara, Junji Shibata: "Treatment of waste Dry Etching Gas in Semiconductors Manufacturing Process"The 6th International Symposium on East Asian Resources Recycling Technology. Vol.1. 711-714 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] H. Yamamoto and J. Shibata: "Disposal of Waste Fluoride and Chloride Gases in the Manufacturing Process of Semiconductors"proceedings of Second International Conference on Material Processing for Properties (PMP2000). Vol.1. 685-688 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] J. Shibata and H. Yamamoto: "Harmless Disposal of Special Meterial Gases Used in Manufacturing Process of Semiconductors"Eco-Industry. Vol.3. 26-33 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] J. Shibata and H. Yamamoto: "Harmless Disposal of Fluoride and Chioride Material Gases"Kagakusouchi. Vol.43, No.7. 49-55 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] H. yamamoto, T. Yatsuhashi, A. Kushida N. Murayama and J.Shibata: "Harmless Treatment of Global Warming Gases Exsorsted from Manufacturing Process of Semiconductors"Thermophysical Properties. Vol.22. 64-66 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] H. Yamamoto and J. Shibata: "Treatment of Waste Dry Etching Gas in Semiconductors Manufacturing Process"The 6^<th> International Symposium on East Asian Resources Recycling Technology. Vol.1. 711-714 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] Hideki Yamamoto, Junji Shibata: "Disposal of Waste Fluoride and Chloride Gases in the Manufacturing Process of Semiconductors"Proceedings of Second International Conference on Material Processing for Properties (PMP2000). Vol.1. 685-688 (2000)

    • Related Report
      2001 Annual Research Report
  • [Publications] 芝田隼次, 山本秀樹: "半導体製造用特殊材料ガスの無害化処理技術の開発"エコインダストリー. 3巻. 26-33 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 芝田隼次, 山本秀樹: "フッ素系・塩素系特殊ガスの無害化技術"化学装置. 43巻,7号. 49-55 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 山本秀樹, 八橋拓也, 櫛田明広, 村山憲弘, 芝田隼次: "半導体製造工程から排出される特殊材料ガスの無害化処理"THERMOPHYSICAL PROPERTIES. 22. 64-66 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] Hideki Yamamoto, Takahiro Kawahara, Junji Shibata: "Treatment of Waste Dry Etching Gas in Semiconductors Manufacturing Process"The 6th international Symposium on East Asian Resources Recycling Technology. Vol.1. 711-714 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 芝田隼次,山本秀樹: "特殊材料ガスの無害化処理"ケミカルエンジニアリング. 45巻. 35-41 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] Hideki Yamamoto and Junji Shibata: "Disposal of Waste Fluoride and Chloride Gases in the Manufacturing Process of Semiconductors"Proceedings of Second International Conference on Material Processing for Properties (PMP2000). Vol.1. 685-688 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 芝田隼次,山本秀樹: "半導体製造用特殊材料ガスの無害化処理技術の開発"エコインダストリー. 3巻. 26-33 (2001)

    • Related Report
      2000 Annual Research Report

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Published: 2000-04-01   Modified: 2016-04-21  

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