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Functional Thin Film Formation with High Efficiency Microwave Plasma CVD

Research Project

Project/Area Number 12558047
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field プラズマ理工学
Research InstitutionDAIDO INSTITUTE OF TECHNOLOGY

Principal Investigator

FUJITA Junji  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (50023700)

Co-Investigator(Kenkyū-buntansha) IWAMA Saburo  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (00075904)
NAKANE Hiroyuki  Hokkai Can, Co. Ltd., 技術本部開発部員
KONDO Yoshitoka  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (20043185)
SAKA Takashi  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (20115570)
HIOKI Yoshiaki  Daido Institute of Technology, Department of Electronics and Computer Engineering, Professor, 工学部, 教授 (10075913)
岩井 啓二  ヒラノ光音株式会社, 常務取締役
Project Period (FY) 2000 – 2001
Project Status Completed (Fiscal Year 2001)
Budget Amount *help
¥13,500,000 (Direct Cost: ¥13,500,000)
Fiscal Year 2001: ¥5,100,000 (Direct Cost: ¥5,100,000)
Fiscal Year 2000: ¥8,400,000 (Direct Cost: ¥8,400,000)
KeywordsPlasma Chemical Vapor Deposition / Thin Film formation / Functional Thin Film / Microwave Discharge / Surface Wave Plasma / Plasma Spectroscopy / Plasma Production / Plasma Chemistry / プラズマ化学反応
Research Abstract

1) The purpose of this research is to develop a device for functional thin film formation such as penetration resistive film onto the inner surface of PET bottle, on the basis of research and development on microwave discharge at our laboratory.
2) A high density plasma has been produced with surface wave propagation utilizing electric field enhancement with a ridge inside the waveguide.
3) With this device, Ar plasma with CH_4 is used for carbon coating of PET bottle set at the end of the discharge tube.
4) A new device has been designed and constructed, which can produce a flat plasma suited for studying the characteristics of the film in order to obtain the optimum plasma conditions for thin film formation. The microwave power is fed to the plasma through a slot antenna at the bottom of a cavity resonator and along the surface of a quartz plate. This technique is proved to produce stable plasma in a wide range of discharge conditions.
5) Another technique has been developed to form a metal film which is difficult to produce with plasma chemical vapor deposition method, based on electromagnetic acceleration of metal plasma produced with vaporization of thin wire with a high electric current.
6) A laser scattering method is established to study the behavior of nano-particles in a plasma, by the use of argon ion laser, related with thin film formation from nano-particles, and with detection of nano-particles in a plasma. The relative sensitivity factors and the sputtering yield data have been obtained which are important to analyze the chemical processes in the plasma.
7) The completion of this thin film formation device and the establishment of related diagnostic technique allow us to obtain desirable conditions for various kinds of functional thin film formation with plasma CVD.

Report

(3 results)
  • 2001 Annual Research Report   Final Research Report Summary
  • 2000 Annual Research Report
  • Research Products

    (19 results)

All Other

All Publications (19 results)

  • [Publications] T.Saka, M.Inoue: "Correlation Between the Relative Sensitivity Factors and the Sputtering Yields in Glow Discharge Mass Spectrometry"Analytical Science. 16. 653-655 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] 坂 貴, 山口美香, 伊藤清孝: "グロー放電質量分析法による元素分析"電気製鋼. 72. 215-222 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] T.Saka, M.Yamaguchi, K.Ito: "Concentration dependence of the relative sensitivity factors of aluminum in glow discharge mass spectroscopy"J.Trace and Microprobe Techniques. 19. 533-540 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] Y.Hioki, et al.: "Laser-aided measurements of nano-particle density in an RF discharge"Proceedings of the 10th International Symposium on LASER-AIDED PLAMA DIAGNOSTICS. 496-499 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] K.Tanaka, S.Iwama: "Crystal Structure and Particle Size of Ge-Nanoparticles Depending on the Flowing Gas Evaporation Conditions"Transactions of the Materials Research Society of Japan. 72(in print). (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] T.Saka, M.Yamaguchi, K.Ito: "Concentration dependence of the relative sensitivity factors in glow discharge mass spectrometry"Analytical Science. (in print). (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] T. Saka and M. Inoue: "Correlation Between the Relative Sensitivity Factors and the Sputtering Yields in Glow Discharge Mass Spectrometry"Analytical Science. 16. 653-655 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] T. Saka, M. Yamaguchi and K. Ito: "Analysis of the Element with Glow Discharge Mass Spectrometry (in Japanese)"Denki Seikou. 72. 215-222 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] T. Saka, M. Yamaguchi and K. Ito: "Concentration dependence of the relative sensitivity factors of aluminum in glow discharge mass spectroscopy"J. Trace and Microprobe Techniques. 19. 533-540 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] Y. Hioki, T. Yamaguchi, H. Hama, H. Morioka, H. Katsuyama and J. Fujita: "Laser-aided measurements of nano-particle density in an RF discharee"Proceedings of the 10th International Symposium on Laser-Aided Plasma Diagnostics. 496 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] K. Tanaka and S. Iwama: "Crystal Structure and Particle Size of Ge-Nanoparticles Depending on the Flowing Gas Evaporation Conditions"Transactions of the Materials Research Society of Japan. 72 (in print). (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] T. Saka, M. Yamaguchi and K. Ito: "Concentration dependence of the relative sensitivity factors in glow discharge mass spectrometry"Analytical Science. (in print). (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] Ye, Hioki: "Laser-aided measurements of nano-particle density in an RF discharge"Proceedings of the 10^<th> International Symposium on LASER-AIDED PLAMA DIAGNOSTICS. 496-499 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] K.Tanaka: "Crystal Structure and Particle Size of Ge-Nanoparticles Depending on the Flowing Gas Evaporation Conditions"Transactions of the Materials Research Society of Japan. (to be printed). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Saka: "Concentration dependence of the relative sensitivity factors in glow discharge mass spectrometry"Analytical Science. (to be printed). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Saka: "Concentration dependence of the relative sensitivity factors of aluminum in glow discharge mass spectroscopy"J. Trace and Microprobe Techniques. 19・4. 533-540 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 坂 貴: "グロー放電質量分析法による元素分析"電気製鋼. 72・4. 215-222 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Saka and M.Inoue: "Correlation between the Relative Sensitivity Factors and the Sputtering Yields in Glow-Discharge Mass Spectrometry"Analytical Science. 16・6. 653-655 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 坂貴,井上美香,伊藤清孝: "グロー放電質量分析法におけるAlの相対感度係数の濃度依存性"材料とプロセス. 13・6. 739 (2001)

    • Related Report
      2000 Annual Research Report

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Published: 2000-04-01   Modified: 2016-04-21  

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