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SURFACE DIFFUSIVITY MEASUREMENTS ON SILICON SURFACES AND THEIR SIMULATION

Research Project

Project/Area Number 12650030
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field 表面界面物性
Research InstitutionKyushu University

Principal Investigator

WATANABE Fumiya  Faculty of Engineering, Kyushu University Research Associate, 工学研究院, 講師 (30264063)

Co-Investigator(Kenkyū-buntansha) MOTOOKA Teruaki  Faculty of Engineering, Kyushu University Professor, 工学研究院, 教授 (50219979)
Project Period (FY) 2000 – 2001
Project Status Completed (Fiscal Year 2001)
Budget Amount *help
¥3,600,000 (Direct Cost: ¥3,600,000)
Fiscal Year 2001: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 2000: ¥2,200,000 (Direct Cost: ¥2,200,000)
KeywordsField Emission / Silicon / Surface Diffusion / Ultar-fast Phenomena / Surface Dynamics / Ultra-fast phenomena
Research Abstract

Femtosecond Field Emission Camera (FFEC) has been built to observe field emission current from silicon tips with the fastest time resolution of 4ps/pixel. The total current density is too low for any meaningful surface dynamics measurements with this resolution. With an order of magnitude slower resolutions, oscillations in 1GHz range are observed. We have developed a new method of analysis based on random telegraph noise statistics to improve the FFEC's time resolution in some cases. The time between electron observations are collected and their distribution indeed show an oscillation of 〜 27 ps period which are impossible to be seen in regular scans. This time resolution is more than two orders of magnitudes improvement over the conventional one.
In addition, field emission current fluctuation measurements are carried out on silicon tips fabricated from single crystals with and without boron deposition. The self diffusion of silicon on a vicinal surface of (100) plane has the activation value of 〜1.8eV, while the boron covered surfaces have the activation energy of 〜0.2eV at T = 600-900 K. The activation energy of diffusion returns to the original value of 1.8 eV above 900K.

Report

(3 results)
  • 2001 Annual Research Report   Final Research Report Summary
  • 2000 Annual Research Report
  • Research Products

    (6 results)

All Other

All Publications (6 results)

  • [Publications] S.Hirayama, F.Watanabe, et al.: "Field emission current from Si tip : ultra-fast time resolved measurements"Surface Science. (To be published). (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] S.Hirayama, F.Watanabe, et al.: "Surface Diffusivity Measurements on Boron Covered Silicon Surfaces by Field E"Proc. of the 5th Symp. on Atomic-scale Surface and Interface Dynamics. 1-6 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] S. Hirayama, F. Watanahe, T. Takahashi, T. Motooka: "Surface Diffusivity Measurements on Boron Covered Silicon Surfaces by Field Emission"in Proc. of the 5th Symp. on Atomicscale Surface and Interface Dynamics. 1-6 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] S. Hirayama, F. Watanabe, T. Takahashi, T. Motooka: "Field emission current from Si tip: ultra-fast time resolved measurements"Surface Science. (To be published).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2001 Final Research Report Summary
  • [Publications] S.Hirayama, F.Watanabe, T.Takahashi, T.Motooka: "Field emission current from Si tip : ultra-fast time resolved measurements"Surface Science. (to be published). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] S.Hirayama,F.Watanabe,T.Takahashi,T.Motooka: "Surface Diffusivity Measurements on Boron Covered Silicon Surfaces by Field Emission"Proc.of the 5th Symp.on Atomic-scale Surface and Interface Dynamics. 1-6 (2001)

    • Related Report
      2000 Annual Research Report

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Published: 2000-04-01   Modified: 2016-04-21  

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