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Study on extremely thin barriers in low-resistivity against Cu interconnect on field oxide layer of SiO_2

Research Project

Project/Area Number 12650299
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionKitami Institute of Technology

Principal Investigator

NOYA Atsushi  K.I.T. Electrical and Electronic Engineering, Prof., 工学部, 教授 (60133807)

Co-Investigator(Kenkyū-buntansha) TAKEYAMA Mayumi  K.I.T. Electrical and Electronic Engineering, Assoc. Prof., 工学部, 助教授 (80236512)
Project Period (FY) 2000 – 2002
Project Status Completed (Fiscal Year 2002)
Budget Amount *help
¥3,600,000 (Direct Cost: ¥3,600,000)
Fiscal Year 2002: ¥900,000 (Direct Cost: ¥900,000)
Fiscal Year 2001: ¥900,000 (Direct Cost: ¥900,000)
Fiscal Year 2000: ¥1,800,000 (Direct Cost: ¥1,800,000)
KeywordsIntegrated Circuits / Interconnects / Barrier / nano-crystal / フィールド酸化膜 / Cu / SiO_2 / VN / Ta-W
Research Abstract

In the interconnecting technology for system-ULSI's in future, extremely thin barriers in low-resistivity acceptable to the 65nm rule were desired for reducing the RC signal delay in the system. We examined the possible barrier materials from the points of view of (1) low-resistive barrier, (2) barrier for Cu[111] preferred orientation and (3) extremely thin barrier in the model system of Cu/barrier/SiO_2/Si. We proposed the use of Ta-W alloy to avoid the high-resistive tetragonal polymorphic phase in Ta, and confirmed the low-resistive barrier on which Cu[111] texture was formed. From this result, Nb as a bcc metal was examined as the barrier on which Cu[111] texture was obtained, and the successful formation of preferentially oriented Cu[111]/Nb[110]/SiO_2/Si system was confirmed. We also applied a nano-crystalline VN film to a barrier as thin as 〜10nm against Cu on SiO_2. The excellent barrier performance without any diffusion of Cu through the thin VN barrier due to annealing at 600℃ for 1h was obtained. Furthermore, the high performance of 〜5nm thick VN barrier was also suggested.

Report

(4 results)
  • 2002 Annual Research Report   Final Research Report Summary
  • 2001 Annual Research Report
  • 2000 Annual Research Report
  • Research Products

    (25 results)

All Other

All Publications (25 results)

  • [Publications] 榊, 武山, 野矢: "Cu/SiO_2間に介在させたTa-W合金膜のバリヤ特性"電子情報通信学会技術研究報告. CPM2000-84. 1-6 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 佐藤, 武山, 野矢: "Cu/SiO_2間におけるVN膜のバリヤ特性"電子情報通信学会技術研究報告. CPM2000-85. 7-12 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 武山, 佐藤, 糸井, 坂上, 野矢: "Cu/VN/SiO_2/Si構造におけるナノクリスタルVNバリヤの有用性"電子情報通信学会技術研究報告. ED2002-185. 1-6 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 武山, 糸井, 梁田, 佐藤, 野矢: "Cu/SiO_2間の極薄VNバリヤの劣化メカニズム"電子情報通信学会技術研究報告. CPM2003(発表予定). (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Md.Maniruzzamann et al.: "Formation of [111] preferentially oriented Cu layer on [110] Nb barrier on SiO_2"Asia-Pacific workshop on Fundamental and Application of Advanced Semiconductor Devices. 111-114 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] M.B.Takeyama et al.: "Application of thin nano-crystalline VN barrier in Cu/VN/SiO_2/Si system"Solid State Devices and Matericals International Conference. 494-495 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Md.Maviruzzamann et al.: "Structural Analyses of Cu[111] layer on Nb[110] barrier formed on SiO_2"Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices. (発表予定). (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] T.Itoi et al.: "Failure mechanism of nano-crystalline VN barrier in Cu/VN/SiO_2/Si system"International Conference on Solid State Devices and Materials. (発表予定). (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] M.B.Takeyama et al.: "Application of thin VN diffection barrier for Cu in ta conveets on field Oxide of SiO_2"International Conference on Solid State Devices and Materials. (発表予定). (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] H. Sasaki, M.B. Takeyama, A. Noya: "Barrier properties of Ta-W alloy films interposed between Cu and SiO_2"Technical Report of IEICE. CPM2000-84. (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] K. Satoh, M.B. Takeyama, A. Noya: "Barrier properties of VN thin films interposed between Cu and SiO_2"Technical Report of IEICE. CPM2000-85. (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] M.B. Takeyama, K. Satoh, T. Itoi, M. Sakagami, A. Noya: "Development of Cu/VN/SiO_2/Si systems with thin nano-crystalline VN barrier"Technical Report of IEICE. ED2002-185. (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] M.B. Takeyama, K. Satoh, T. Itoi, M. Sakagami, A. Noya: "Failure mechanism of thin VN barrier between Cu and SiO_2"Technical Report of IEICE. CPM2003-00 to be presented. (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Md. Maniruzzaman, M.B. Takeyama, A. Noya: "Formation of [111] preferentially oriented Cu layer on [110] Nb barrier on SiO_2"2002 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, Sapporo. 111-114 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] M.B. Takeyama, K. Satoh, T. Itoi, M. Sakagami, A. Noya: "Application of thin nano-crystalline VN barrier in Cu/VN/SiO_2/Si system"2002 International Conference on Solid State Devices and Materials, Nagoya. 494-495 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Md. Maniruzzaman, M.B. Takeyama, Y. Hayasaka, E. Aoyagi, T. Ohsuna, A. Noya: "Structural Analyses of Cu[111] layer on Nb[110] barrier formed on SiO_2"2003 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, Busan. (to be presented). (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] T. Itoi, O. Yanada, K. Satoh, M.B. Takeyama, A. Noya: "Failure mechanism of nano-crystalline VN barrier in Cu/VN/SiO_2/Si system"2003 International Conference on Solid State Devices and Materials, Tokyo. (to be presented). (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] M.B. Takeyama, T. Itoi, A. Noya: "Application of thin VN diffusion barrier for Cu interconnects on field oxide of SiO_2"2003 International Conference on Solid State Devices and Materials, Tokyo. (to be presented). (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Md.Maminuzzamon, M.B.Takeyama, A.Noya: "Formation of [111] Preferentially Oriented Cu Layer on [110] Nb Barrier on SiO_2"Proc.2002 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices. 111-114 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 武山, 佐藤, 糸井, 野矢: "Cu配線への極薄ナノクリスタルVNバリヤの適用"第49回応用物理学関係連合講演会講演論文集. (発表予定). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 糸井, 梁田, 佐藤, 武山, 野矢: "Cu/VN/SiO_2/Si系におけるVN極薄バリヤの組織変化"第49回応用物理学関係連合講演会講演論文集. (発表予定). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 糸井, 梁田, 佐藤, 武山, 野矢: "Cu/SiO_2間におけるナノ結晶VN拡散バリヤの熱的安定性"日本金属学会2002春季大会講演論文集. (発表予定). (2002)

    • Related Report
      2001 Annual Research Report
  • [Publications] 榊,武山,野矢: "Cu/SiO_2間に介在させたTa-W合金薄膜のバリヤ特性"電子情報通信学会技術研究報告. CPM2000-84. 1-6 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 佐藤,武山,野矢: "Cu/SiO_2間におけるVN膜のバリヤ特性"電子情報通信学会技術研究報告. CPM2000-85. 7-12 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 佐藤,武山,野矢: "SiO_2上のCuに対する低温作製されたVN薄膜のバリヤ特性"第61回応用物理学会学術講演会講演予稿集. 735-735 (2000)

    • Related Report
      2000 Annual Research Report

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Published: 2000-04-01   Modified: 2021-12-06  

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