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Development of Scanning Thermal Microscope with Microscale Quantitative Temperature Measurement Function.

Research Project

Project/Area Number 13555051
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field Thermal engineering
Research InstitutionTokyo Institute of Technology

Principal Investigator

NAKABEPPU Osamu  Tokyo Institute of Technology, Graduate School of Science and Engineering, Associate Professor, 大学院・理工学研究科, 助教授 (50227873)

Co-Investigator(Kenkyū-buntansha) SHIRAKAWABE Yoshiharu  Seiko Instrument Inc. , Scientific Instruments Division, Section Chief, 科学機器事業部, 係長(研究職)
白川辺 喜春  セイコーインスツルメンツ株式会社, 科学機器事業部, 係長(研究職)
Project Period (FY) 2001 – 2002
Project Status Completed (Fiscal Year 2002)
Budget Amount *help
¥7,400,000 (Direct Cost: ¥7,400,000)
Fiscal Year 2002: ¥3,000,000 (Direct Cost: ¥3,000,000)
Fiscal Year 2001: ¥4,400,000 (Direct Cost: ¥4,400,000)
KeywordsAFM / SThM / Microscale / MEMS / Temperature Measurement / Feed Back / 微細センサー
Research Abstract

Scanning Thermal Microscope (SThM) provides topological and thermal images by a temperature sensing cantilever probe. Usually, the SThM passively measures temperature or thermal properties by detecting thermal information through a contact point on a sample and converting it with a calibration curve. However, the passive method can't take quantitative temperature image because measured values are influenced by various factors such as surface temperature, thermal properties, unevenness of sample surface, adsorption layer, and so on. Therefore, we have developed a novel active method for quantitative temperature imaging regardless of variations in thermal conductance at the contact point. In the active method, a thermal feedback control step maintains the cantilever at the same temperature as the sample surface by detecting heat flow along the cantilever and feeding power proportional to it to the cantilever, then cantilever temperature is measured by another sensor on it. We experimentally examined the active method by producing multi-function cantilevers with a heat flow sensor, electric heater and a temperature sensor and a feedback circuit. The active system demonstrated good performance in real temperature measurement regardless of thermal

Report

(3 results)
  • 2002 Annual Research Report   Final Research Report Summary
  • 2001 Annual Research Report
  • Research Products

    (17 results)

All Other

All Publications (17 results)

  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Microscale temperature measurement by scanning thermal microscopy"J.Thermal Analysis and Calorimetry. 169. 727-737 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Development of Scanning Thermal Microscopy for Nano-scale Real Temperaure Measurement"Heat Transfer 2002,Proceedings of the Twelfth International Heat Transfer Conference. 1. 447-452 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 中別府修, 鈴木孝充: "走査型熱顕微鏡による微小スケール実温度計測"可視化情報,第30回可視化情報シンポジウム講演論文集. 22-1. 171-172 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Active and Passive Thermal Imaging in Scanning Thermal Microscopy"Proc.6th ASME-JSME Thermal Engineering Joint Conference. (CD-ROM). A1-304 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 中別府 修: "走査型熱顕微鏡による定量温度画像計測"可視化情報. 23-90. 3-8 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Takamitsu Suzuki, Osamu Nakabeppu, Takayoshi Inoue: "Development of Thermal Microcantilever for Scanning Thermal Microscope"Proc. 38^<th> National Heat Transfer Conference in Japan. 1. 325-326 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki, Takayoshi Inoue: "Development of real temperature measurement system on SThM"Proc. 39^<th> National Heat Transfer Conference in Japan. 2. 387-388 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Microscale temperature measurement by scanning thermal microscopy"J. Thermal Analysis and Calorimetry. 69. 727-737 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Development of Scanning Thermal Microscopy for Nano-scale Real Temperature Measurement"Heat Transfer 2002, Proceedings of the Twelfth International Heat Transfer Conference. 1. 447-452 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Active and Passive Thermal Imaging in Scanning Thermal Microscopy"Proc. 6th ASME-JSME Thermal Engineering Joint Conference(CD-ROM). Al-304. (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Microscale temperature measurement by scanning thermal microscopy"J. Thermal Analysis and Calorimetry. 169. 727-737 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Development of Scanning Thermal Microscopy for Nano-scale Real Temperaure Measurement"Heat Transfer 2002, Proceedings of the Twelfth International Heat Transfer Conference. 1. 447-452 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 中別府修, 鈴木孝充: "走査型熱顕微鏡による微小スケール実温度計測"可視化情報,第30回可視化情報シンポジウム講演論文集. 22-1. 171-172 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Osamu Nakabeppu, Takamitsu Suzuki: "Active and Passive Thermal Imaging in Scanning Thermal Microscopy"Proc. 6th ASME-JSME Thermal Engineering Joint Conference. (CD-ROM). A1-304 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] 鈴木孝充, 中別府修, 井上剛良: "SThM用サーマルカンチレバーの実温度計測特性"日本機械学会熱工学講演会講演論文集. No.01-9. 387-388 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 鈴木孝充, 中別府修, 井上剛良: "走査型熱顕微鏡のための温度計測用マイクロカンチレバーの開発"第38回日本伝熱シンポジウム講演論文集. 1. 325-326 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 中別府修: "走査型熱顕微鏡による微小スケール熱計測"熱測定. Vol.28, No.1. 18-28 (2001)

    • Related Report
      2001 Annual Research Report

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Published: 2001-04-01   Modified: 2016-04-21  

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