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Research on Millimeter-Wave and Submillimeter-Wave Scanning Near-Field Microscopy

Research Project

Project/Area Number 13650365
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field 電子デバイス・機器工学
Research InstitutionTohoku University

Principal Investigator

NOZOKIDO Tatsuo  Tohoku University Research Institute of Electrical Communication Associate Professor, 電気通信研究所, 助教授 (00261149)

Co-Investigator(Kenkyū-buntansha) MIZUNO Koji  Tohoku University Research Institute of Electrical Communication Professor, 電気通信研究所, 教授 (30005326)
KUDO Hiroyuki  University of Tsukuba Institute of Information Sciences and Electronics Associate Professor, 電子・情報工学系, 助教授 (60221933)
BAE Jongsuck  Tohoku University Research Institute of Electrical Communication Associate Professor, 電気通信研究所, 助教授 (20165525)
Project Period (FY) 2001 – 2002
Project Status Completed (Fiscal Year 2002)
Budget Amount *help
¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 2002: ¥1,700,000 (Direct Cost: ¥1,700,000)
Fiscal Year 2001: ¥1,800,000 (Direct Cost: ¥1,800,000)
KeywordsScanning Near-Field Microscopy / Millimeter-Wave / Submillimeter-Wave / Slit-Type Probe / Quantification / Equivalent Circuit / Anisotropy / Image Reconstruction / スリット型プローブ / 定量測定 / 複屈折 / 偏波特性
Research Abstract

The objective of this research project is to demonstrate the new type of scanning near-field microscopy, i.e. scanning near-field anisotropy microscopy (SNAM) and to quantify images obtained from the scanning near-field microscope system using a metal slit-type probe which we have proposed and developed, in order to visualize physical parameters of objects such as refractive index and refractive index anisotropy, in the millimeter-wave and submillimeter-wave regions. The results obtained in the term of the project follow.
In order to quantify images more precisely in the millimeter- and submillimeter-wave regions, we have proposed, designed, and made a new type of sample base to reduce needless signal fluctuations originated from surface modes. We have successfully demonstrated the effectiveness of this new hardware and found that the signal fluctuation reduces to less than 10% of the previous one. This result means that the microscope system we have developed have a potential to give a limiting refractive index sensitivity of better than Δn/n〜0.1. Furthermore, in order to visualize physical parameters of objects, we have proposed an equivalent circuit to describe the interaction between the probe and object, and succeeded to demonstrate the validity of the circuit by computer simulation using a finite element method and by experiments in the millimeter-wave region.
We have tried to visualize anisotropy of objects by including an anisotropy model derived from two-dimensional refractive idex ellipsoid in the image reconstruction process using a block-gradient method, which is a kind of iterative reconstruction technique. An isotropic metal patch, a wire gird with large anisotropy, and a LiNbO_3 crystal which is a typical anisotropic dielectric, were experimentally tested in the millimeter-wave region and the images were reconstructed. We have found that anisotropy of these objects are clearly imaged with a resolution of less than 1/10 of the radiation wavelength used.

Report

(3 results)
  • 2002 Annual Research Report   Final Research Report Summary
  • 2001 Annual Research Report
  • Research Products

    (24 results)

All Other

All Publications (24 results)

  • [Publications] T.Nozokido(荏戸立夫): "Improvement in Image Reconstruction of Scanning Near-Field Millimeter-Wave Microscopy Using a Metal Slit-Type Probe"Jpn.J.Appl.Phys.. 41. 4252-4253 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 荏戸立夫: "マイクロ波・ミリ波帯走査型近接場顕微鏡技術"電子情報通信学会誌. 85. 272-274 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] ぺい鐘石: "ミリ波・サブミリ波帯の計測・回路技術"計測と制御. 41. 275-280 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Y.Itoh(伊藤吉紀): "Generation of Short Millimeter-Wave Radiation Using a Dot-Matrix Uni-Traveling-Carrier Photodiode"Electronics Letters. 39. 65-67 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] A.Kishigami(岸上明生): "Difference Spectra Measurement of Squid Rhodopsin in the Submillimeter Wave Region"Photochemical & Photobiological Sciences. (印刷中). (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 荏戸立夫: "高周波帯走査型近接場顕微鏡技術"日本赤外線学会誌. (印刷中). (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] T. Nozokido: "Improvement in Image Reconstruction of Scanning Near-Field Millimeter-Wave Microscopy Using a Metal Slit-Type Probe"Jpn. J. Appl. Phys.. 41. 4252-4253 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] T. Nozokido: "Scanning Near-Field Microwave and Millimeter-Wave Microscopy"Journal of the Institute of Electronics, Information and Communication Engineers. 85. 272-274 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] J. Bae: "Measurement and Circuit Technologies in the Millimeter- and Submillimeter-Wave Regions"Journal of the Society of Instrument and Control Engineers. 41. 275-280 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] Y. Itoh: "Generation of Short Millimeter-Wave Radiation Using a Dot-Matrix Uni-Traveling-Carrier Photodiode"Electronics Letters. 39. 65-67 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] A. Kishigami: "Difference Spectra Measurement of Squid Rhodopsin in the Submillimeter Wave Region"To be published in the Photochemical & Photobiological Sciences. (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] T. Nozokido: "High-Frequency Scanning Near-Field Microscopy"To be published in the Journal of the Japan Society of Infrared Science and Technology. (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] 莅戸立夫: "マイクロ波・ミリ波帯走査型近接場顕微鏡技術"電子情報通信学会誌. 85・4. 272-274 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] ぺい鐘石: "ミリ波・サブミリ波帯の計測・回路技術"計測と制御. 41・4. 275-280 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Nozokido(莅戸立夫): "Scanning Near-Field Millimeter-Wave Microscopy"Technical Digest of the Forth Topical Symposium on Millimeter Waves (TSMMW2002) (Invited). 65-75 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Nose(能勢敏明): "Determination of Complex Refractive Index of the Nematic Liquid Crystal Materials in the Millimeter Wave Region"Conference Digest of the 19th International Liquid Crystal Conference (ILCC2002). 0333 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] Y.Itoh(伊藤吉紀): "Generation of Short Millimeter-Wave Radiation Using a Dot-Matrix Uni-Traveling-Carrier Photodiode"Electronics Letters. 39・1. 65-67 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] 莅戸立夫: "高周波帯走査型近接場顕微鏡技術"日本赤外線学会誌. 13・1(発表予定). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Nozokido(莅戸立夫): "Scanning near-field millimeter-wave microscopy using a metal slit as a scanning probe"IEEE Transactions on Microwave Theory and Techniques. 47・3. 491-499 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Nozokido(莅戸立夫): "Improvement in image reconstruction of scanning near-field millimeter-wave microscopy using a metal slit-type probe"Japanese Journal of Applied Physics. 40・6A. 4252-4253 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] T.Hamano(濱野哲子): "An equivalent circuit for the slit probe of a millimeter-wave near-field microscope"Technical Digest of the Third Topical Symposium on Millimeter Waves (TSMMW2001). 159-162 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 能勢敏明: "ミリ波帯ネットワークアナライザーによる液晶材料の測定"電子情報通信学会技術研究報告. EMCJ2001-78, MW2001-96. 169-174 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 縫村修次: "スリット型プローブを用いたミリ波帯近接場顕微鏡による定量測定"第56回応用物理学会東北支部学術講演会論文集. 175-176 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 裴 鐘石: "ミリ波・サブミリ波帯の計測・回路技術"計測と制御. 41・4(未定). (2002)

    • Related Report
      2001 Annual Research Report

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Published: 2001-04-01   Modified: 2016-04-21  

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