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Fabrication of highly oriented carbon-nanotube films and its application to an emitter with high efficiency

Research Project

Project/Area Number 13650737
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Inorganic materials/Physical properties
Research InstitutionShizuoka University

Principal Investigator

MATSUMOTO Koichi  Research Institute of Electronics, Associate Professor, 電子工学研究所, 助教授 (10022138)

Co-Investigator(Kenkyū-buntansha) MURAKAMI Kenji  Research Institute of Electronics, Associate Professor, 電子工学研究所, 助教授 (30182091)
YAMAGUCHI Tomuo  Research Institute of Electronics, Professor, 電子工学研究所, 教授 (40010938)
Project Period (FY) 2001 – 2002
Project Status Completed (Fiscal Year 2002)
Budget Amount *help
¥3,100,000 (Direct Cost: ¥3,100,000)
Fiscal Year 2002: ¥600,000 (Direct Cost: ¥600,000)
Fiscal Year 2001: ¥2,500,000 (Direct Cost: ¥2,500,000)
Keywordscarbon nanotube / carbon / nanotube / silicon carbide / SiC / surface / ellipsometry / 電界放出 / 気体吸蔵
Research Abstract

In order to investigate the initial stage of carbon-nanotube(CNT) formation at the surface decomposition of SiC, we heated the SiC single-crystal substrates (6H-type, C-face polished) in vacuum using an infrared mirror furnace and a turbo-molecular pump, and we analyzed the structure change at the surfaces by means of spectro-ellipsometric measurements.
Up to 1100℃, the change in spectra could be interpreted as the decrease of thickness of SiO_2 layer (〜4 nm) on the SiC substrate. At 1150℃ and above, however, spectra were distinctly different from those of the samples heated up to 1100℃, and could be interpreted with a three-phase model, in which the surface layer consists of graphite including X% of voids, where the surface layer thickness t = 10〜50 nm and X = 50〜70%. This indicates that the surface decomposition of SiC is initiated at this temperature and that the spectro-ellipsometric measurements can detect small changes of optical properties of surface due to the initiation of decomposition.
When the substrates were heated for a longer time (80〜640 min) at 1300℃, the spectra were essentially different again, and they could be interpreted with a four-phase model, in which the surface layer consists of two graphite layers including different percentages of voids, where the thickness of surface layers t_1 = 20〜50 nm, t_2 = 20〜60 nm and the percentages of voids X = 〜90%, Y = 〜50%. This implied that formation of CNT would start at this temperature. This formation was also detected by FE-SEM observation.

Report

(3 results)
  • 2002 Annual Research Report   Final Research Report Summary
  • 2001 Annual Research Report
  • Research Products

    (3 results)

All Other

All Publications (3 results)

  • [Publications] K.Matsumoto: "Spectro-ellipsometric Characterization and Gaseous Occlusion of Fullerene C_60 Crystals"Fullerenes, Nanotubes, and Carbon Nanostructures. 11. 15-23 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] K.Matsumoto: "Spectro-ellipsometric Characterization and Gaseous Occlusion of FullereneC_<60> Crystals"Fullerenes, Nanotubes, and Carbon Nanostructures. Vol.11, No.1. 15-13 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2002 Final Research Report Summary
  • [Publications] K.Matsumoto: "Spectro-ellipsometric Characterization and Gaseous Occlusion of Fullerene C_<60> Crystals"Fullerenes, Nanotubes, and Carbon Nanostructures. Vol.11,No.1. 15-23 (2003)

    • Related Report
      2002 Annual Research Report

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Published: 2001-04-01   Modified: 2016-04-21  

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