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STUDY ON EVALUATION METHOD OF RESIDUAL STRESS AND JOINT RELIABILITY OF SEMICONDUCTOR DEVICE BASED ON ULTLASONIC MEUREMENT TECHNOLOGY

Research Project

Project/Area Number 13650783
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Material processing/treatments
Research InstitutionHIMEJI INSTITUTE OFTECHNOLOGY

Principal Investigator

KUSAKA Masahiro  HIMEJI INTITUTE OF TECHNOLOGY, GRADUATE SCHOOL OF ENGINEERING, ASSOCIATE PROFESSOR, 大学院・工学研究科, 助教授 (40244686)

Co-Investigator(Kenkyū-buntansha) KSEO Kenji  HIMEJI INSTITUTE OF TECHNOLOGY, GRADUATE SCHOOL OF ENGINEERING, PROFESSOR, 大学院・工学研究科, 教授 (70047603)
Project Period (FY) 2001 – 2003
Project Status Completed (Fiscal Year 2003)
Budget Amount *help
¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 2003: ¥700,000 (Direct Cost: ¥700,000)
Fiscal Year 2002: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 2001: ¥1,800,000 (Direct Cost: ¥1,800,000)
KeywordsACOUSTIC MICROSCOPE / SURFACE ACOUSTIC WAVE VELOCITY / RESIN MATERIAL / THIN FILM / ELASTIC MODULUS / ACOUSTROELASTIC COEFFICIENT / ENERGY RELEASE RATE / THRMAL STRESS ANALYSIS / 異方性材料 / 弾性定数 / 樹脂封止 / はんだバンプ工法 / はく離強度 / 異方導電性接着剤 / 応力測定 / 表面粗さ / 漏洩クリーピング波速度 / 応力緩和 / 表面性状
Research Abstract

The purpose of this study is to establish the technique for the evaluation of the residual stress and the reliability of the microjoints of the semiconductor device by using the surface acoustic wave velocity measured by the acoustic microscope. First, the method of the stress evaluation of the resin packaged device by the surface acoustic wave velocity was examined. Next, we proposed the method of measuring the elastic modulus of the TiN thin film used as a barrier metal of the semiconductor. Finally, the characteristic on thermal stress and the reliability of the microjoints of the semiconductor device were examined based on the numerical analysis results. The main results obtained are as follows:
(1)The surface acoustic wave velocity is measured in high accuracy under the tensile and the compressive load. As a result, the acoustoelasticity coefficient of the resin material was calculated. Moreover, it is clear that the stress of the test specimen with stress distribution could be mea … More sured. And, we proposed the residual stress evaluation method by the surface acoustic wave velocity measured by the acoustic microscope.
(2)The surface acoustic wave velocity of the test specimen which deposits the TiN thin film on the substrate depends on the surface acoustic wave velocity of the substrate. Therefore, the surface acoustic wave velocity only of thin film cannot be measured. Therefore, the surface acoustic wave velocity only of thin film could be calculated by arranging the experimental result by the simple equation calculated from the elasticity theory. Moreover, we proposed the technique for reversely analyzing the elastic modulus of thin film.
(3)To clarify the property of the thermal stress generated by mounting, the influence of various parameters on the thermal stress was examined by the elasticity theory and the numerical analysis. A basic knowledge to improve the joint stability further was obtained from the result of the above. Moreover, the peel strength of the adhesive was calculated by using a critical energy release rate. From result of the above, it become clear that the joint stability is secured when peel length is short. Less

Report

(4 results)
  • 2003 Annual Research Report   Final Research Report Summary
  • 2002 Annual Research Report
  • 2001 Annual Research Report
  • Research Products

    (18 results)

All Other

All Publications (18 results)

  • [Publications] M.KUSAKA, K.SEO, M.KIMURA, S.AKAMATSU: "Stress Evaluation of Resin Material by Acoustic Microscope"Proc.of APCFS & ATEM '01. Vol.1. 183-188 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 日下正広, 瀬尾健二, 木村真晃, 大坪健二: "超音波顕微鏡による電子デバイスの応力評価のための基礎的研究"Proc.of 8th Symposium on "Microjoining and Assembly Technology in Electronics". Vol.8. 515-520 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 瀬尾健二, 日下正広, 木村真晃, 安圭栢: "異方導電性接着剤を用いた素子接合部の接合安定性"溶接学会全国大会講演概要. 71. 108-109 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 藤田和也, 瀬尾健二, 日下正広, 木村真晃, 安圭栢: "超音波顕微鏡を用いたTiN薄膜の弾性表面波速度測定に関する基礎的研究"日本機械学会講演論文集. 034-2. 6-31-6-32 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 日下正広, 瀬尾健二, 木村真晃, 安圭栢, 藤田和也: "イオンミキシング薄膜の弾性表面波速度測定法の検討"Proc.of 10th Symposium on "Microjoining and Assembly Tecnology in Electronics". Vol.10. 421-424 (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 和田知也, 瀬尾健二, 日下正広: "樹脂封止LSI素子に生じる熱応力に及ぼす樹脂特性の影響"日本機械学会関西学生会卒業研究発表講演会 講演前刷集. 6-17 (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.KUSAKA, K.SEO, M.KIMURA, S.AKAMATSU: "Stress Evaluation of Resin Material by Acoustic Microscope"Proc.of APCFS & ATEM '01. Vol.1. 183-88 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.KUSAKA, K.SEO, M.KIMRA, K.OHTHUBO: "Basic Research on Stress Evaluation of Resin Packaged Device by Acoustic Microscope"Proc.of 8th Symposium on "Microjoining and Assembly Technology in electronics". Vol.8. 515-520 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] K.SEO, M.KUSAKA, M.KIMURA, AN GYU-BEAK: "Reliability of Microjoints with Anisotropic Conductive Adhesive"Abst.of JWS Fall Annual Meeting '2002. Vol.71. 108-109 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] K.FUJITA, K.SEO, M.KUSAKA, M.KIMURA, AN GYU-BEAK: "Basic Study of Surface Wave Velocity Measurement of TiN Thin Film by Acoustic Microscope"Proc.of The 78th JSME Kansai Spring Meeting. No.032-2. 6-31-6-32 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.KUSAKA, K.SEO, M.KIMURA, AN GYU-BEAK, K.FUJITA: "Measurement Method of Surface Acoustic Wave Velocity for Ion Mixing Thin Film"Proc.of 10th Symposium on "Microjoining and Assembly Technology in electronics". Vol.10. 421-424 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] T.WADA, K.SEO, M.KUSAKA: "Influence of resin property on thermal stress in resin-sealed LSI device"Abst of Student Association of JSME Kansai Spring Meeting '2004. 6-17 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 藤田和也, 瀬尾健二, 日下正広, 木村真晃, 安圭栢: "超音波顕微鏡を用いたTiN薄膜の弾性表面波速度測定に関する基礎的研究"日本機械学会講演論文集. 034-2. 6-31-6-32 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 日下正広, 瀬尾健二, 木村真晃, 安圭栢, 藤田和也: "イオンミキシング薄膜の弾性表面波速度測定法の検討"Proc.of 10th Symposium on "Microjoining and Assembly Tecnology in Electronics". 10. 421-424 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] 和田知也, 瀬尾健二, 日下正広: "樹脂封止LSI素子に生じる熱応力に及ぼす樹脂特性の影響"日本機械学会関西学生会卒業研究発表講演会講演前刷集. 6-17 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] 瀬尾健二, 日下正広, 木村真晃, 安圭栢: "異方導電性接着剤を用いた素子接合部の接合安定性"溶接学会全国大会講演概要. 第71集. 108-109 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.KUSAKA, K.SEO, M.KIMURA, S.AKAMATSU: "Stress Evaluation of Resin Material by Acoustic Microscope"Proc. of APCFS & ATEM'01. Vol.1. 183-188 (2001)

    • Related Report
      2001 Annual Research Report
  • [Publications] 日下正宏, 瀬尾健二, 木村真晃, 大坪健二: "超音波顕微鏡による電子デバイスの応力評価のための基礎的研究"Proc. of 8th Symposium on Microjoining and Assembly Technology in Electronics. Vol.8. 515-520 (2002)

    • Related Report
      2001 Annual Research Report

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Published: 2001-04-01   Modified: 2016-04-21  

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