• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Reliability Design and Multi-mode Fracture Control of Micro Joint Structure in Advanced Electronics Packaging

Research Project

Project/Area Number 14350052
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Materials/Mechanics of materials
Research InstitutionYokohama National University

Principal Investigator

SHIRATORI Masaki  Yokohama National University, Faculty of Engineering, Professor, 大学院・工学研究院, 教授 (60017986)

Co-Investigator(Kenkyū-buntansha) SHIBUTANI Tadahiro  Yokohama National University, Faculty of Engineering, Research Associate, 大学院・工学研究院, 助手 (10332644)
YU Qiang  Yokohama National University, Faculty of Engineering, Assistant Professor, 大学院・工学研究院, 助教授 (80242379)
Project Period (FY) 2002 – 2003
Project Status Completed (Fiscal Year 2003)
Budget Amount *help
¥16,900,000 (Direct Cost: ¥16,900,000)
Fiscal Year 2003: ¥4,300,000 (Direct Cost: ¥4,300,000)
Fiscal Year 2002: ¥12,600,000 (Direct Cost: ¥12,600,000)
KeywordsElectronics packaging / Multilayer structure / Fracture control / Interfacial fracture / Thermal fatigue / Lead-free solder / Intermetallic compound / Reliability design
Research Abstract

In this report, mechanical reliability problems, which must be solved before lead-free solder can be used in practical applications, are examined using analytical and experimental methods. This report consists of seven chapters. The contents of each chapter are as follows. Chapter 1 describes the current surface mount technology of electron devices, the reliability assessment method of surface mounted components, and the necessity and problems of lead-free solder applications. Chapter 2 shows the relationship between reflow condition and the fatigue strength of a solder joint. In Chapter 3, the difference of fracture modes in each lead-free solder joint is noted. Also, the effect of the growth of the intermetallic compound layer and the material properties of solder on the fracture mode of a solder joint are shown using analytical and experimental methods. In Chapter 4, the interface strength of the Sn-Zn system solder joint, which is attracting attention as a low-temperature lead-free … More solder, is analyzed and a technique to improve reliability is proposed. Chapter 5 shows the relationship between the formation of voids and fatigue strength of solder joints using FEM analysis and mechanical shear fatigue tests of CSP joints.
In Chapter 6, the hardening characteristics of lead-free solder are examined using mechanical shear fatigue testing. Also, the effect of the hardening rule and creep law on the estimation of stress and nonlinear strain for lead-free solder joints is examined and an elastic-plastic-creep analysis method is proposed, which shows good convergence and high precision. Finally, Chapter 7 presents the conclusions gained from the preceding chapters.
Through this study, mechanical reliability problems such as the decrease of interface strength, formation of voids, and the application of a constitutive equation, all of which have become very important in practical applications of lead-free solder, are shown and solutions for these problems are proposed. As the results of this study, it is possible to improve the reliability of lead-free solder joints and the efficiency of reliability evaluations as well as to reduce production costs. Less

Report

(3 results)
  • 2003 Annual Research Report   Final Research Report Summary
  • 2002 Annual Research Report
  • Research Products

    (24 results)

All Other

All Publications (24 results)

  • [Publications] 白鳥正樹: "Some Recent Topics on the Strength Reliability of Solder Joints in Electronics Packaging"Proceeding of International Conference of ITHERM 2002. 1-10 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 于強他: "Sn-Zn系低温鉛フリーはんだ接合部の機械的疲労寿命評価"エレクトロニクス実装学会. 6. 406-413 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 澁谷忠弘, 于強, 白鳥正樹他: "LSI用サブミクロン薄膜のモード別界面はく離強度評価"日本機械学会論文集A編. 69. 1368-1373 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 于強: "Reliability Study on Sn-Ag-Cu and Sn-Zn-Bi Lead-Free Solder Joints and Their Intermetallic Compounds"ATEM'03. (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 于強, 白鳥正樹他: "Impact Reliability of BGA Solder Joints and Dropping Test Method"Proceeding of International Conference on Inter PACK 2003. 1-7 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 金道燮, 澁谷忠弘, 于強, 白鳥正樹: "鉛フリーはんだ接合部の応力・非線形ひずみ振幅評価に及ぼす硬化則の影響"エレクトロニクス実装学会誌. 7. 161-169 (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Masaki Shiratori: "Some Recent Topics on the Strength Reliability of Solder Joints in Electronics Packaging"Proc.of ITHERM2002. 1-10 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Qiang Yu, Do-Seop Kim, Jae-Chul Jin: "Mechanical Fatigue Strength Assesment for Sn-Zn Lead-Free Solder Joint"Journal of Japan institute of Electronics Packaging. Vol.6 No.5. 406-413 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Tadahiro Shibutani, Tetsu Tsuruga, Qiang Yu, Masaki Shiratori: "Criteria of Crack Initiation at Edge of Interface between Thin Films in Opening and Sliding Modes for an Advanced LSI"Trans.of the JSME A. vol.69, No.685. 1368-1373

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Qiang Yu: "Reliability Study on Sn-Ag-Cu and Sn-Zn-Bi Lead-Free Solder Joints and Their Intermetallic Compounds"Proc.of ATEM2003. OS10W0109(CD-ROM). (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Qiang Yu, Masaki Shiratori, et al.: "Impacy Reliability of BGA Solder Joints and Dropping test Method"Proc.Of International Conference on InterPACK 2003. 1-7 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Do-Seop Kim, Tadahiro Shibutani, Qiang Yu, Masaki Shiratori: "Nonlinear behavior Study on Effect of Hardening Rule of Lead Free Solder Joint"Journal of Japan institute of Electronics Packaging. vol.7 No.2. 161-169 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Q.Yu, M.Shiratori, et al.: "Impact Reliability Study of BGA Solder Joints and Dropping Test Method"Proceeding of International Conference on InterPACK2003. (CD : No.35139). 1-7 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] D.S.Kim, T.Shibutani, Q.Yu, M.Shiratori: "Nonlinear Behavior Study on Effect of Hardening Rule of Lead Free Solder Joint"Proceeding of International Conference on Interpack'03. (CD : No.35262). 1-7 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 于強, 金道燮, 陳在哲: "Sn-Zn系低温鉛フリーはんだ接合部の機械的疲労寿命評価"エレクトロニクス実装学会. 6・5. 406-413 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] J.C.Jin, Q.Yu, D.S.Kim, M.Shiratori: "Fatigue strength evaluation for Sn-Zn-Bi and Sn-Zn lead-free solder joints"ATEM'03. 1-7 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 于強, 澁谷忠弘他: "チップ実装プロセスにおける積層基板の反りの評価"Mate2003. 477-480 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 金道燮, 于強, 澁谷忠弘, 白鳥正樹: "鉛フリーはんだ接合部の応力・非線形ひずみ振幅評価に及ぼす硬化則の影響"第17回エレクトロニクス実装学術講演大会. 71-72 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 白鳥正樹: "Some Recent Topics on the Strength Reliability of Solder Joints in Electronics Packaging"Proceeding of International Conference on ITherm 2002. 1-10 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 白鳥正樹, 于強他: "Dynamic behavior of electronics package and impact reliability of BGA solder joints"Damage and Fracture Mechanics. 7. 55-64 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 白鳥正樹, 于強, 澁谷忠弘他: "Interface Strength of Thin Films on Substrate for an LSI on the basis of Fracture Mechanics Concept"JSSUME2002. 61-64 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 白鳥正樹, 于強他: "Fatigue Strength Evaluation for Sn-Zn-Bi Lead-Free Solder Joints"ASME International Mechanical Engineering Congress & Exposition. 2(CD-ROM). 39686 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 白鳥正樹, 于強他: "Effect of Voids on Thermal Fatigue Reliability of Lead-Free Solder Joints"ASME International Mechanical Engineering Congress & Exposition. 2(CD-ROM). 33076 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 白鳥正樹, 于強, 澁谷忠弘他: "鉛フリーはんだ接合部におけるボイドの影響"日本機械学会材料力学部門講演会講演論文集. 2・5. 223-224 (2002)

    • Related Report
      2002 Annual Research Report

URL: 

Published: 2002-04-01   Modified: 2016-04-21  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi