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Research on inspection technique of printed circuit board using the probe composed of GMR sensor and planar coil

Research Project

Project/Area Number 14350218
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Measurement engineering
Research InstitutionKanazawa University

Principal Investigator

YAMADA Sotoshi  Kanazawa University, Institute of Nature and Environmental Technology, professor, 自然計測応用研究センター, 教授 (80019786)

Co-Investigator(Kenkyū-buntansha) IWAHARA Masayoshi  Kanazawa University, Graduate School of Nature and Environmental Technology, professor, 自然科学研究科, 教授 (80020212)
WAKIWAKA Hiroyuki  Shinsyu University, Faculty of Engineering, professor, 工学部, 教授 (50240461)
TANIGUCHI Tetuki  The University of Electro-Communications, Faculty of Electro-Communication, associate, 電気通信学部, 助手 (50283099)
AZUMA Takehito  Kanazawa University, Graduate School of Natural Science and Technology, associate, 自然科学研究科, 助手 (60308179)
Project Period (FY) 2002 – 2004
Project Status Completed (Fiscal Year 2004)
Budget Amount *help
¥13,800,000 (Direct Cost: ¥13,800,000)
Fiscal Year 2004: ¥1,200,000 (Direct Cost: ¥1,200,000)
Fiscal Year 2003: ¥3,400,000 (Direct Cost: ¥3,400,000)
Fiscal Year 2002: ¥9,200,000 (Direct Cost: ¥9,200,000)
Keywordsprinted circuit board / non-destructive testing / eddy-current testing / giant magneto-resistance / non-contacting test / resistance test / property inspection / image processing
Research Abstract

The purpose of this study is to contribute to the progress of the high density mounting of electronic equipment by the nature inspection method of the high-density printed wiring based on the compound eddy current testing (ECT) probe by supersensitive magneto-resistance element (GMR). In the features, the testing equipment using eddy-current technology in the printed wiring inspection directly examines electro-conductivity of the printed wiring conductor by eddy currents in comparison with the method by image inspection which is the mainstream.
[1]Development of multi-GMR sensor and examination of characteristics
We developed the multi-GMR sensor for eddy-current probe. There are two type GMR of 50 and 100 mm length which has the sensitivity of 0.2 mV/μT at 1.0 MHz. It is clarified that the sensitivity of the GMR is about 40 dB higher than inductive coil at the same size.
[2]Inspection of printed circuit board by eddy-current probe with GMR sensor.
The characteristic for the printed circuit board inspection was measured by the production of GMR+ planar coil compound probe which made high frequency exciting coil and SV-GMR to be the detection sensor. For printed circuit testing with 70-100 μm width, the disconnection, 20 % chipping defect, 50 % depth imperfection can be detected from the experimental result.
[3]Software for recognizing defect
The signal processing software that extracts the defect portion from two-dimensional detection signal image was developed.
[4]Technology exchange with inspection equipment manufacturing company.
With the aim of the construction of high-density printed wiring testing system using the eddy current testing probe, the exchange and transfer of technology were tried for GMR element manufacturer, ECT technology manufacturer, and testing equipment manufacturer.

Report

(4 results)
  • 2004 Annual Research Report   Final Research Report Summary
  • 2003 Annual Research Report
  • 2002 Annual Research Report
  • Research Products

    (47 results)

All 2005 2004 2003 2002 2001 Other

All Journal Article (34 results) Patent(Industrial Property Rights) (1 results) Publications (12 results)

  • [Journal Article] Eddy-Current Model and Detection in a Thick Stainless Steel Plate2005

    • Author(s)
      H.Tian
    • Journal Title

      Transaction on Magnetics Society of Japan 5

      Pages: 39-42

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] PCB Conductor Dimension and Alignment Inspection by using ECT Probe with SV-GMR Sensor2005

    • Author(s)
      K.Chomsuwan
    • Journal Title

      Transaction on Magnetics Society of Japan 5(印刷中)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Metallic Bead Detection by Using Eddy-Current Probe with SV-GMR Sensor2005

    • Author(s)
      S.Yamada
    • Journal Title

      Review of Quantitative Nondestructive Evaluation 39(印刷中)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Bare PCB Inspection by Mean of ECT Technique with Spin-Valve GMR2005

    • Author(s)
      K.Chomsuwan
    • Journal Title

      Proceeding of World Conference on Nondestructive Testing (印刷中)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Eddy-Current Model and Detection in a Thick Stainless Steel Plate2005

    • Author(s)
      H.Tian, S.Yamada, M.Iwahara, H.Tooyama, K.Miya
    • Journal Title

      Transaction on Magnetics Society of Japan 5

      Pages: 39-42

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] PCB Conductor Dimension and Alignment Inspection by using ECT Probe with SV-GMR Sensor2005

    • Author(s)
      K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
    • Journal Title

      Transaction on Magnetics Society of Japan 5 (to be published)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] PCB Conductor Inspection with GMR Based ECT Probe2005

    • Author(s)
      S.Yamada, K.Chomsuwan, M.Iwahara, H.Wakiwaka, T.Taniguchi, S.Shoji
    • Journal Title

      Review of Quantitative Nondestructive Evaluation 24 (to be published)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Bare PCB Inspection by Mean of ECT Technique with Spin-Valve GMR2005

    • Author(s)
      K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, T.Taniguchi, S.Shoji
    • Journal Title

      Proceeding of World Conference on Nondestructive Testing (to be published)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] PCB Conductor Dimension and Alignment Inspection by Using ECT Probe with SV-GMR sensor2005

    • Author(s)
      K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
    • Journal Title

      日本応用磁器学会誌 (印刷中)

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Application of the Repulsive Type Magnetic Bearing for Manufacturing Micromass Measurement Balance Equipment2005

    • Author(s)
      K.Chomsuwan, S.Yamada, M.Iwahara H.Wakiwaka, S.Shoji
    • Journal Title

      International Magnetic Conference (発表確定)

    • NAID

      120006656565

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Conductive Micro-Bead Array Detection By High-Frequency Eddy-Current Testing Technique with SV-GMR Sensor2005

    • Author(s)
      S.Yamada, K.Chomsuwan, T.Hagino, H.Tian, M.Iwahara
    • Journal Title

      International Magnetic Conference (発表確定)

    • Related Report
      2004 Annual Research Report
  • [Journal Article] ECT応用を目指したSV-GMRセンサの高周波数微小磁界振幅特性2004

    • Author(s)
      福田 祐三
    • Journal Title

      日本応用磁気学会論文誌 28

      Pages: 405-408

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Application of ECT Technique for Inspection of Bare PCB2004

    • Author(s)
      S.Yamada
    • Journal Title

      IEEE Transactions on Magnetics 39

      Pages: 3325-3327

    • NAID

      120006323943

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] GMR Sensor Utilization for PCB Inspection Based on the Eddy-Current Testing Technique2004

    • Author(s)
      K.Chomsuwan
    • Journal Title

      Transaction on Magnetics Society of Japan 4

      Pages: 39-42

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Inspection of Bare Printed Circuit Board Using Planar Type ECT Probe2004

    • Author(s)
      S.Yamada
    • Journal Title

      Review of Quantitative Nondestructive Evaluation 23

      Pages: 374-381

    • NAID

      120006345319

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection2004

    • Author(s)
      S.Yamada
    • Journal Title

      IEEE Transactions on Magnetics 40

      Pages: 2676-2678

    • NAID

      120001137838

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] High-Freqency, Low-Amplitude Magnetic Field Characteristics of SV-GMR Sensor for ECT Technique2004

    • Author(s)
      Y.Fukuda, K.Chomsuwan, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
    • Journal Title

      Transaction on Magnetics Society of Japan (in Japanese) 28, 3

      Pages: 405-408

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] GMR Sensor Utilization for PCB Inspection Based on the Eddy-Current Testing Technique2004

    • Author(s)
      K.Chomsuwan, Y.Fukuda, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
    • Journal Title

      Transaction on Magnetics Society of Japan 4, 1

      Pages: 39-42

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Inspection of Bare Printed Circuit Board Using Planar Type ECT Probe2004

    • Author(s)
      S.Yamada, M.Iwahara, Y.Fukuda, T.Taniguchi, H.Wakiwaka
    • Journal Title

      Review of Quantitative Nondestructive Evaluation 23

      Pages: 374-381

    • NAID

      120006345319

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection2004

    • Author(s)
      S.Yamada, K.Chomsuwan, Y.Fukuda, M.Iwahara, H.Wakiwaka, S.Shoji
    • Journal Title

      IEEE Transactions on Magnetics 40, 4

      Pages: 2676-2678

    • NAID

      120001137838

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] GMR Sensor Utilization for PCB Inspection Based on the Eddy-Current Testing Technique2004

    • Author(s)
      K.Chomsuwan, Y.Fukuda, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji
    • Journal Title

      Trans.Magn.Soc.Japan 4・1

      Pages: 39-42

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Inspection of bare printed circuit board using planar type ECT probe2004

    • Author(s)
      S.Yamada, M.Iwahara, Y.Fukuda, T.Taniguchi, H.Wakiwaka
    • Journal Title

      Review of Quantitative Nondestructive Evaluation 23

      Pages: 374-381

    • NAID

      120006345319

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection2004

    • Author(s)
      S.Yamada, K.Chomsuwan, Y.Fukuda, M.Iwahara, H.Wakiwaka, S.Shoji
    • Journal Title

      IEEE Transactions on Magnetics 40・4

      Pages: 2676-2678

    • NAID

      120001137838

    • Related Report
      2004 Annual Research Report
  • [Journal Article] プリント基板検査におけるマルチECTプローブの感度向上への検討2003

    • Author(s)
      中村 和倫
    • Journal Title

      日本応用磁気学会論文誌 27

      Pages: 405-408

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] ミアンダコイルを用いた渦電流探傷プローブの配管溶接部への適用2003

    • Author(s)
      水野 覚
    • Journal Title

      日本応用磁気学会論文誌 27

      Pages: 397-401

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Enhancing the Sensitivity and Resolution of Multi-ECT Probe for Inspection of Printed Circuit Board2003

    • Author(s)
      K.Nakamura, S.Yamada, M.Iwahara, T.Taniguchi
    • Journal Title

      Transaction on Magnetics Society of Japan (in Japanese) 27, 4

      Pages: 393-396

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Eddy Current Testing of Weld Zone Defects Using a Meander Probe2003

    • Author(s)
      T.Maeda, S.Mizuno, S.Yamada, M.Iwahara
    • Journal Title

      Transaction on Magnetics Society of Japan (in Japanese) 27, 4

      Pages: 397-401

    • NAID

      10007795353

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Application of ECT Technique for Inspection of Bare PCB2003

    • Author(s)
      S.Yamada, K.Nakamura, M.Iwahara, T.Taniguchi, H.Wakiwak
    • Journal Title

      IEEE Transactions on Magnetics 39, 5

      Pages: 3325-3327

    • NAID

      120006323943

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Simulation of Amplitude and Phase Characteristics during Inspection of Printed Circuit Board by Eddy-Current Testing Probe2002

    • Author(s)
      D.Kacprzak
    • Journal Title

      International Journal of Applied Electromagnetics and Mechanics 15

      Pages: 15-20

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Image Processing in Eddy-Current Testing for Extraction of Orientations of Defects2002

    • Author(s)
      T.Taniguchi
    • Journal Title

      International Journal of Applied Electromagnetics and Mechanics, 14, 1-4, 503-506, 2001/2002. 15

      Pages: 503-506

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Simulation of Amplitude and Phase Characteristics during Inspection of Printed Circuit Board by Eddy-Current Testing Probe2002

    • Author(s)
      D.Kacprzak, S.Yamada, M.Iwahara
    • Journal Title

      International Journal of Applied Electromagnetics and Mechanics 15

      Pages: 15-20

    • NAID

      120006368375

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Image Processing in Eddy-Current Testing for Extraction of Orientations of Defects2002

    • Author(s)
      T.Taniguchi, K.Nakamura, S.Yamada, M.Iwahara
    • Journal Title

      International Journal of Applied Electromagnetics and Mechanics 14

      Pages: 503-506

    • NAID

      120006368371

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Simulation of Amplitude and Phase Characteristics during Inspection of Printed Circuit Board by Eddy-Current Testing Probe2001

    • Author(s)
      D.Kacprzak, S.Yamada, M.Iwahara
    • Journal Title

      International Journal of Applied Electromagnetics and Mechanics 15

      Pages: 1-4

    • NAID

      120006368375

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Image Processing in Eddy-Current Testing for Extraction of Orientations of Defects2001

    • Author(s)
      T.Taniguchi, K.Nakamura, S.Yamada, M.Iwahara
    • Journal Title

      International Journal of Applied Electromagnetics and Mechanics 14

      Pages: 1-4

    • NAID

      120006368371

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Patent(Industrial Property Rights)] 非破壊検査用渦電流センサ2003

    • Inventor(s)
      山田 外史
    • Industrial Property Rights Holder
      金沢大学
    • Industrial Property Number
      2003-277355
    • Filing Date
      2003-07-22
    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Publications] 山田外史, 福田祐三, C.コムクリット, 岩原正吉: "プリント基板検査のためのGMR付ECTプローブ"電気学会マグティックス研究会資料. MAG-03-162. 11-14 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] 福田祐三, C.コムクリット, 山田外史, 岩原正吉, 脇若弘之, 庄司茂: "ECT応用を目指したSV-GMRセンサの高周波数微小磁界振幅特性"日本応用磁気学会論文誌. 28・4(印刷中). (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] K.Chomusuwan, Y.Fukuda, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji: "GMR Sensor Utilization for PCB Inspection based on the Eddy-Current Testing Technique"日本応用磁気学会論文誌. 28・4(印刷中). (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] S.Yamada, K.Chomusuwan, Y.Fukuda, M.Iwahara, H.Wakiwaka, S.Shoji: "Eddy-Current Testing Probe with Spin-valve GMR Sensor for Printed Circuit Board Inspection"IEEE Transaction on Magnetics. 40・5(掲載確定). (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] T.Taniguchi, Y.Fukuda, S.Yamada, M.Iwahara: "Signal Processing for Image Data of PCB Inspection by GMR Based Eddy-Current Probe"IEEE Transaction on Magnetics. 40・5(掲載確定). (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] K.Chomusuwan, Y.Fukuda, S.Yamada, M.Iwahara, H.Wakiwaka, S.Shoji: "Inspection of PCB Defects by Using ECT Technique with GMR Sensor"Proceeding of Japan-Australia-New Zealand Joint Seminar on Application of Electromagnetic Phenomena in Electrical and Mechanical System. (掲載確定). (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] T.Taniguchi, K.Nakamura, S.Yamada, M.Iwahara: "Image Processing in Eddy-Current Testing for Extraction of Orientations of Defects"International Journal of Applied Electromagnetics and Mechanics. 14・1-4. 503-506 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] D.Kacprzak, S.Yamada, M.Iwahara: "Simulation of Amplitude and Phase Characteristics during Inspection of Printed Circuit Board by Eddy-Current Testing Probe"International Journal of Applied Electromagnetics and Mechanics. 15・1-4. 15-20 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 片岡康浩, 脇若弘之, 小松大祐, 篠浦 治, 山田外史: "GMRラインセンサによる渦電流分布の検出"電気学会マグネティックス・リニアドライブ合同研究会資料. MAG-02-131〜136. 11-16 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] S.C.Mukhopadhyay, S.Yamada, M.Iwahara: "Optimum Coil Pitch Selection for Planar Mesh Type Micro-Magnetic Sensor for the Estimation of Near-Surface Material Properties"Applications of Electromagnetic Phenomena in Electrical and Mechanical Systems (II). 14. 1-9 (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] 水野 覚, 山田外史, 岩原正吉: "ミアンダコイルを用いた渦電流探傷プローブの配管溶接部への適用"日本応用磁気学会誌. 27・4(印刷中). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] 中村和倫, 山田外史, 岩原正吉, 谷口哲樹: "プリント基板検査におけるマルチECTプローブの感度向上への検討"日本応用磁気学会誌. 27・4(印刷中). (2003)

    • Related Report
      2002 Annual Research Report

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Published: 2002-04-01   Modified: 2016-04-21  

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