• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Development of near field laser induced ablation spectroscopy

Research Project

Project/Area Number 14350443
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field 工業分析化学
Research InstitutionThe University of Tokyo

Principal Investigator

FUJINAMI Masanori  The University of Tokyo, Graduate School of Frontier Sciences, Associate Professor, 大学院・新領域創成科学研究科, 助教授 (50311436)

Co-Investigator(Kenkyū-buntansha) IKEZOE Yasuhiro  The University of Tokyo, Graduate School of Engineering, Research Associate, 大学院・工学系研究科, 教務職員(研究職) (70334315)
KATAYAMA Kenji  The University of Tokyo, Graduate School of Frontier Sciences, Research Associate, 大学院・新領域創成科学研究科, 助手 (00313007)
SAWADA Tsuguo  The University of Tokyo, Graduate School of Frontier Sciences, Professor, 大学院・新領域創成科学研究科, 教授 (90011105)
Project Period (FY) 2002 – 2003
Project Status Completed (Fiscal Year 2003)
Budget Amount *help
¥14,900,000 (Direct Cost: ¥14,900,000)
Fiscal Year 2003: ¥3,900,000 (Direct Cost: ¥3,900,000)
Fiscal Year 2002: ¥11,000,000 (Direct Cost: ¥11,000,000)
KeywordsNear field optics / Mass spectrometry / Nano technology / Emission spectroscopy / Time of flight / Metal tip / Ablation / Light ionization / 飛行時間型質量分析
Research Abstract

The aim of the research project is to develop the near-field laser induced ablation spectroscopy and to analyze the chemical composition to detect the atomic emission within 100 nmφ area. The problem is to overcome the diffraction limit of light and confine the ablation area induced by laser beam. Our idea is to utilize the tip enhanced field with femtosecond pulse laser beam and such a enhanced field is effective within several tens nanometer. We expect that the excited atoms and ions emit characteristic light after ablation and information on chemical composition is obtained.
Near-filed optical scanning microscope has been installed by ourselves. Pulsed femtosecond light with 800 nm and 150 fs pulse width is used as an excitation light, and irradiates the W. tip. It has been found that irradiation with 13 mJ/cm^2 induces the ablation area with 50 nm width and 10 nm depth for Au and Al thin films on a glass. Without W tip in irradiation, no ablation takes place. This ablation area is beyond the diffraction limit and a combination with femtosecond pulse laser and tip-enhanced field is effective to induce nano-area ablation. On the other hand, no light emission has been observed. It is considered for the reason that pulse light is too. short to excite the ablated atoms and ions. Further, optimization of optical geometry is needed.
In this research, we have also developed the photothermal scanning near field optical microscope (PT-SNOM). The lateral resolution is enhanced to 200 nm. PT-SNOM can be applied to detect the non-fluorescent molecules, which are inactive to biomaterials. Further, tip enhanced photothermal effect can be found out and the apertureless PT-SNOM can be installed.

Report

(3 results)
  • 2003 Annual Research Report   Final Research Report Summary
  • 2002 Annual Research Report
  • Research Products

    (16 results)

All Other

All Publications (16 results)

  • [Publications] M.Fujinami, K.Toya, T.Sawada: "Development of photothermal near-field scanning optical microscope"Review of Scientific Instruments. 74. 621-623 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, H.Murakawa, T.Sawada: "Highly sensitive detection of molecules at the liquid/liquid interface using total internal reflection-optical beam deflection based on photothermal spectroscopy"Review of Scientific Instruments. 74. 352-354 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawada, T.Akahane: "Improved depth profiling with slow positrons of ion implanted-induced damage in silicon"Journal of Applied Physics. 94. 4382-4388 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawada, R.Suzuki, T.Ohdaira, T.Akahane: "Helium ion implantation-induced defects in silicon proved with variable-energy positrons"Physical Review B. 68. 165332-1-165332-5 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawada, R.Suzuki, T.Ohdaira, T.Akahane: "A positron beam study of vacancy-impurity complexes in inert gas ion-implanted silicon"Physica B. 340-342. 724-728 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, K.Toya, T.Sawada: "Development of photothermal near-field scanning optical micrgscope"Review of Scientific Instruments. 74. 621-623 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, H.Murakawa, T.Sawada: "Higyly sensitive detgetion of molecules at the liquid/liquid interface using total internal refletion-optical beam deflection based on photothermal spectropy"Review of Scientific Instruments. 74. 352-354 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawada, T.Akahane: "Improved depth profiling with slow positrons of ion implanted-induced damage jn silicon"Journal of Applied Physics. 94. 4382-4388 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawada, R.Suzuki, T.Ohdaira, T.Akahane: "Helium onimplaptation-induced defects in pilicon proved with variable-energy positrons"Physical Review B. 68. 165332-1-165332-5 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawada, R.Suzuki, T.Ohdaira, T.Akahane: "A positron beam study of vacacy-impurity complexes in inert gas ion-implanted silicon"Physica B. 340-342. 724-728 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] M.Fujinami, K.Toya, T.Sawada: "Development of photothermal near-field scanning optical microscope"Review of Scientific Instruments. 74. 621-623 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Fujinami, H.Murakawa, T.Sawada: "Highly sensitive detection of molecules at the liquid/liquid interface using total internal reflection-optical beam deflection based on photothermal spectroscopy"Review of Scientific Instruments. 74. 352-354 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawsda, T.Akahane: "Improved depth profiling with slow positrons of ion implanted-induced damage in silicon"Journal of Applied Physics. 94. 4382-4388 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Fujinami, T.Miyagoe, T.Sawada, R.Suzuki, T.Ohdaira, T.Akahane: "Helium ion implantation-induced defects in silicon proved with variable-energy positrons"Physical Review B. 68. 165332-1-16532-5 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] Fujinami, T.Miyagoe, T.Sawada, R.Suzuki, T.Ohdaira, T.Akahane: "A positron beam study of vacancy-impurity complexes in inert gas ion-implanted silicon"Physica B. 340-342. 724-728 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] M.Fujinarni, K.Toya, T.Sawada: "Development of photothermal near-field scanning optical microscope"Review of Scientific Instruments. 74. 621-623 (2003)

    • Related Report
      2002 Annual Research Report

URL: 

Published: 2002-04-01   Modified: 2016-04-21  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi