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Research on programmable logic elements using the virtual wiring and their logic synthesis method

Research Project

Project/Area Number 14380146
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field 計算機科学
Research InstitutionKyusyu Institute of Technology

Principal Investigator

SASAO Tsutomu  Kyusyu Institute of Technology, Faculty of Computer Science and Systems Engineering, Professor, 情報工学部, 教授 (20112013)

Co-Investigator(Kenkyū-buntansha) KAJIHARA Seiji  Kyusyu Institute of Technology, Faculty of Computer Science and Systems Engineering, Professor, 情報工学部, 教授 (80252592)
IGUCHI Yukihiro  Meiji University, School of Science and Technology, Associate Professor, 理工学部, 助教授 (60201307)
Project Period (FY) 2002 – 2004
Project Status Completed (Fiscal Year 2004)
Budget Amount *help
¥8,700,000 (Direct Cost: ¥8,700,000)
Fiscal Year 2004: ¥2,200,000 (Direct Cost: ¥2,200,000)
Fiscal Year 2003: ¥2,200,000 (Direct Cost: ¥2,200,000)
Fiscal Year 2002: ¥4,300,000 (Direct Cost: ¥4,300,000)
KeywordsFPGA / Memory / Reconfigurable logic / Binary decision diagram / functional decomposition / Logic design / 再構成可能論理 / 再構成可能倫理
Research Abstract

RAMs(Random Access Memory) and PLAs(Programmable-Logic-Array) are popular PLDs(programmable logic devices) that realize multiple-output combinational logic functions. However, when the number of inputs and/or outputs for the target function is large, these devices often require excessive amount of hardware. The main results of the research are as follows :
1.Development of architecture.
We developed two types of architecture that realizes multiple-output functions. An LUT cascade is a serial connection of LUTs(Look-up tables), and realize a combinational circuit. It is easy to design and layout. An LUT ring emulates an LUT cascade, and realize both a combinational and a sequential circuit. It consists of the memory for logic, the programmable interconnection network, and the control circuit. The LUT cascade is faster, but has alimited logic capability. The LUT cascade uses relatively large LUTs (10 to 15 inputs), and the interconnections between LUTs are limited to the adjacent cells in … More the cascade. On the other hand, the LUT ring is slower, but has a higher logic capability. LUT cascades and LUT rings can be directly generated from the BDDs for the target functions. Their performance is easy to estimate.
2.Development of synthesis method for multiple-output logic functions.
We developed a decomposition method for incompletely specified multiple-output function using BDD(binary decision diagram).With this method, we can design a LUT cascade with intermediate outputs. We designed radix converters and arithmetic circuits, and showed that our method reduced the amount of hardware by 20 to 30 percents, compared with the methods that do not consider don't cares.
3.Development of method to reduce the number of rail outputs.
We developed a method to reduce the number of rail outputs for an LUT cascade with intermediate outputs by considering encoding. Reduction of the number of outputs of LUTs reduces the amount of memory. Experimental results show that our approach reduces the number of outputs of LUTs by 10%.
4.Development of memory packing algorithm.
In LUT ring, we can reduce the size of memory by using memory packing. We applied this method to various functions, and confirmed that we can reduce the amount of memory by 40 percents. Less

Report

(4 results)
  • 2004 Annual Research Report   Final Research Report Summary
  • 2003 Annual Research Report
  • 2002 Annual Research Report
  • Research Products

    (36 results)

All 2004 2003 2002 Other

All Journal Article (28 results) Publications (8 results)

  • [Journal Article] Fault diagnosis for RAMs using Walsh spectrum2004

    • Author(s)
      A.Iseno, Y.Iguchi, T.Sasao
    • Journal Title

      IEICE Trans.Information and Systems Vol.E87-D, No.3

      Pages: 592-600

    • NAID

      110003213916

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Annual Research Report 2004 Final Research Report Summary
  • [Journal Article] Area-time complexities of multi-valued decision diagrams2004

    • Author(s)
      S.Nagayama, T.Sasao, Y.Iguchi, M.Matsuura
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics Vol.e87-A, No.5

      Pages: 1020-1028

    • NAID

      110003212997

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] A realization of multiple-output functions by a look-up table ring2004

    • Author(s)
      H.Qin, T.Sasao, M.Matsuura, K.Nakamura, S.Nagayama, Y.Iguchi
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics Vol.e87-A

      Pages: 3141-3150

    • NAID

      110003212851

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Annual Research Report 2004 Final Research Report Summary
  • [Journal Article] Fast Boolean matching under permutation by efficient computation of canonical form2004

    • Author(s)
      D.Debnath, T.Sasao
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics Vol.e87-A

      Pages: 3134-3140

    • NAID

      110003212850

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Annual Research Report 2004 Final Research Report Summary
  • [Journal Article] XID : Don't care identification of test patterns for combinational circuits2004

    • Author(s)
      K.Miyase, S.Kajihara
    • Journal Title

      IEEE Trans.Computer-Aided Design of Integrated Circuits and Systems Vol.23, No.2

      Pages: 321-326

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Annual Research Report 2004 Final Research Report Summary
  • [Journal Article] 論理回路に対するテストコスト削減法-テストデータ量およびテスト実行時間の削減-(サーベイ論文)2004

    • Author(s)
      樋上喜信, 梶原誠司, 市原英行, 高松雄三
    • Journal Title

      電子情報通信学会論文誌D-I Vol.J87-D-I, No.3

      Pages: 291-307

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Test data compression using don't-care identification and statistical encoding2004

    • Author(s)
      S.Kajihara, K.Taniguchi, K.Miyase, I.Pomeranz, S.M.Reddy
    • Journal Title

      IEICE Trans.Info.and Syst. Vol.E87-D, No.3

      Pages: 544-550

    • NAID

      110003317948

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Scan tree design : test compression with test vector modification2004

    • Author(s)
      K.Miyase, S.Kajihara
    • Journal Title

      情報処理学会論文誌 Vol.44, No.5

      Pages: 1270-1278

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] A realization of multiple-output functions by a look-up table ring2004

    • Author(s)
      H.Qin, T.Sasao, M.Matsuura, K.Nakamura S.Nagayama, Y.Iguchi
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics Vol.e87-A

      Pages: 3141-3150

    • NAID

      110003212851

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Test cost reduction for logic circuits-Reduction of test data volume and test application time-2004

    • Author(s)
      Y.Higami, S.Kajihara, H.Ichihara, Y.Takamatsu
    • Journal Title

      IEICE Trans.Info.and Sys. Vol.E87-D-I, No.3

      Pages: 291-307

    • NAID

      110003171307

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Test data compression using don't-care identification and statistical encoding2004

    • Author(s)
      S.Kajihara, K.Taniguchi, K.Miyase, I.Pomeranz, S.M.Reddy
    • Journal Title

      IEICE Trans.Info.and Sys. Vol.87-D, No.3

      Pages: 544-550

    • NAID

      110003317948

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Scan tree design : test compression with test vector modification2004

    • Author(s)
      K.Miyase, S.Kajihara
    • Journal Title

      IPSJ Trans. Vol.44, No.5

      Pages: 1270-1278

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Area-time complexities of multi-valued decision diagrams2004

    • Author(s)
      S.Nagayama, T.Sasao, Y.Iguchi, M.Matsuura
    • Journal Title

      EICE Transactions on Fundamentals of Electronics Vol.e87-A, No.5

      Pages: 1020-1028

    • NAID

      110003212997

    • Related Report
      2004 Annual Research Report
  • [Journal Article] 論理回路に対するテストコスト削減法-テストデータ量およびテスト実行時間の削減-(サーベイ論文)2004

    • Author(s)
      樋上喜信, 梶原誠司, 市原英行, 高松雄三
    • Journal Title

      電子情報通信学会論文誌D-I Vol.J87-D-I No.3

      Pages: 291-307

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Compact representations of logic functions using heterogeneous MDDs2003

    • Author(s)
      S.Nagayama, T.Sasao
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics Vol.E86-A, No.12

      Pages: 3168-3175

    • NAID

      110003173551

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] On selecting testable paths in scan designs2003

    • Author(s)
      Y.Shao, S.M.Reddy, I.Pomeranz, S.Kajihara
    • Journal Title

      Journal of Electronic Testing Theory and Applications (Kluwer Academic Publishers) Vol.19, Issue 4

      Pages: 447-456

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] On test data volume reduction for multiple scan chain designs2003

    • Author(s)
      S.M.Reddy, K.Miyase, S.Kajihara, I.Pomeranz
    • Journal Title

      ACM Transactions on Design Automation of Electronic Systems Vol.8, No.4

      Pages: 460-469

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Evaluation of delay testing based on path selection2003

    • Author(s)
      M.Fukunaga, S.Kajihara, S.Takeoka, S.Yoshimura
    • Journal Title

      IEICE Trans.Fundamentals. E86-A, No.12

      Pages: 3208-3210

    • NAID

      110003212604

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] On selecting testable paths in scan designs2003

    • Author(s)
      Y.Shao, S.M.Reddy, I.Pomeranz, S.Kajihara
    • Journal Title

      Journal of Electronic Testing Theory and Applications(Kluwer Academic Publishers) Vol.19, Issue 4

      Pages: 447-456

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Evaluation of delay testing based on path selection2003

    • Author(s)
      M.Fukunaga, S.Kajihara, S.Takeoka, S.Yoshimura
    • Journal Title

      IEICE Trans.Fundamentals E86-A, No.12

      Pages: 3208-3210

    • NAID

      110003212604

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Bi-partition of shared binary decision diagrams2002

    • Author(s)
      M.Matsuura, T.Sasao, J.T.Butler, Y.Iguchi
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics Vol.E85-A, No.12

      Pages: 2693-2700

    • NAID

      110003212440

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] A Method of static test compaction based on don't care identification2002

    • Author(s)
      K.Miyase, S.Kajihara, S.M.Reddy
    • Journal Title

      情報処理学会論文誌 Vol.43, No.5

      Pages: 1290-1293

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] テストパターン中の特定ビットにおけるドントケア判定法について2002

    • Author(s)
      宮瀬紘平, 梶原誠司, イリス ポメランツ, スダーカ レディ
    • Journal Title

      FIT2002 情報科学技術フォーラム 情報技術レターズ 第1巻2002年, LC-3

      Pages: 47-48

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Average power reduction in scan testing by test vector Modification2002

    • Author(s)
      S.Kajihara, K.Ishida, K.Miyase
    • Journal Title

      IEICE Trans.Info.and Syst. Vol.E85-D, No.10

      Pages: 1483-1489

    • NAID

      110006376577

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Hybrid BIST design for n-detection test using partially rotational scan2002

    • Author(s)
      K.Ichino, T.Asakawa, S.Fukumoto, K.Iawasaki, S.Kajihara
    • Journal Title

      IEICE Trans.Info.and Syst. Vol.E85-D, No.10

      Pages: 1490-1497

    • NAID

      110006376578

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] A Method of static test compaction based on don't care identification2002

    • Author(s)
      K.Miyase, S.Kajihara, S.M.Reddy
    • Journal Title

      IPSJ Trans. Vol.43, No.5

      Pages: 1290-1293

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Don't-C are Identification on Specific Bits of Test Patterns2002

    • Author(s)
      K.Miyase, S.Kajihara, I.Pomeranz, S.M.Reddy
    • Journal Title

      FIT2002, Information Technology Letters Vol.1, LC-3

      Pages: 47-48

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Average power reduction in scan testing by test vector modification2002

    • Author(s)
      S.Kajihara, K.Ishida, K.Miyase
    • Journal Title

      IEICE Trans.Info.and Syst. Vol.E85-D, No.10

      Pages: 1483-1489

    • NAID

      110006376577

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Publications] S.Nagayama, T.Sasao, Y.Iguchi, M.Matsuura: "Aea-time complexities of multi-valued decision diagrams"IEICE Transactions on Fundamentals of Electronics. Vol.E87-A. 1020-1028 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] S.Nagayama, T.Sasao: "Compact representations of logic functions using heterogeneous MDDs"IEICE Transactions on Fundamentals of Electronics. Vol.E86-A. 3168-3175 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] A.Iseno, Y.Iguchi, T.Sasao: "Fault diagnosis for RAMs using Walsh spectrum"IEICE Trans.Information and Systems. Vol.E87-A. 592-600 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] Kohei Miyase: "A method of static test compaction based on don't care identification"情報処理学会論文誌. 43・5. 1290-1293 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 宮瀬紘平: "テストパターン中の特定ビットにおけるドントケア判定法について"FIT2002情報科学技術フォーラム情報技術レターズ. 1・LC-3. 47-48 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Seiji Kajihara: "Average power reduction in scan testing by test vector modification"IEICE Trans. Info. and Syst.. E85-D・10. 1483-1489 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] Kenichi Ichino: "Hybrid BIST design for n-detection test using partially rotational scan"IEICE Trans. Info. and Syst.. E85-D・10. 1490-1497 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] M.Matsuura: "Bi-partition of shared binary decision diagrams"IEICE Transactions on Fundamentals of Electronics. E85-A・12. 2693-1700 (2002)

    • Related Report
      2002 Annual Research Report

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Published: 2002-04-01   Modified: 2016-04-21  

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