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Brightness and coherence of electron beam emitted from a multi-wall carbon nanotube

Research Project

Project/Area Number 14550024
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field 表面界面物性
Research InstitutionMie University

Principal Investigator

OHSHITA Akinori  Mie University, Faculty of Engineering, Professor, 工学部, 教授 (80023240)

Co-Investigator(Kenkyū-buntansha) HATA Koichi  Mie University, Faculty of Engineering, Assistant Professor, 工学部, 講師 (30228465)
Project Period (FY) 2002 – 2003
Project Status Completed (Fiscal Year 2003)
Budget Amount *help
¥3,300,000 (Direct Cost: ¥3,300,000)
Fiscal Year 2003: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 2002: ¥2,300,000 (Direct Cost: ¥2,300,000)
Keywordscarbon nanotube / field emission / coherence / electron optical brightness / pentagon / angular current density / interference fringe / electromagnetic field / 電子ビーム / 電界放出パターン / ヤングの干渉稿
Research Abstract

1. A capped multiwall carbon nanotube with a clean surface gives filed emission patterns consisting of six pentagonal rings corresponding to pentagons located at the tip. To evaluate the optical properties of a single pentagon as an electron source, the I-V characteristics and angular current densities for a single clean pentagon have been measured, by probe-hole-type field emission microscopy. Reduced brightness estimated from the angular current density and the geometrical size of the pentagon reached 〜5.6×109 Am-2sr-1 V-1 at an emission current of 53nA. This value is one order of magnitude or more higher than that of an individual multiwall carbon nanotube field emitter reported by Jonge et al.
2. A capped multiwall carbon nanotube with clean surface gives field emission patterns consisting six pentagonal rings which correspond to pentagons located at the tip end. One or a few bright streaks are also observed at the boundaries of neighboring pentagons. The spacing of streaks is inversely proportional to the square root of the accelerating voltage. Namely, the spacing changes with the wave length of emitted electrons according to Young's interference equation. The visibility of streaks increased with the accelerating voltage, which can be explained successfully in terms of a concept of a virtual source size. These experimental results suggest that the streaks are no more than Young's interference fringes for which the adjacent pentagons behave as double slits.
3. The direct observation method of electromagnetic micro-fields with an electron biprism is developed. This interference method is simpler and more effective than the three-wave interference one.

Report

(3 results)
  • 2003 Annual Research Report   Final Research Report Summary
  • 2002 Annual Research Report
  • Research Products

    (17 results)

All Other

All Publications (17 results)

  • [Publications] A.Ohdhita: "Influence of operating conditions of electron biprisms cf three-electron-wave interference pattern"Proc.of the 15th International Congress on Electron Microscopy. 3. 315-316 (2002)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] akinori Ohsita: "Direct visualization of electromagnetic microfields by new double-exposure electron holography"Electron Microscopy and Analysis 2003. 215-218 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] K.Hata: "Brightness of Electron Beam Emitted from a single pentagon on a Multiwall Carbon Nanotube"Surface and Interface Analysis. 36(in press). (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] K.Hata: "Interference Fringes Observed in Electron Emission Patterns of a Multi-wall Carbon Nanotube"J.Vac.Sci.Technol.. (in press). (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Akinori Ohshita: "Influence of operating conditions of electron biprisms of three-electron-wave interference pattern"Proc. of the 15th International Congress on Electron Microscopy. 3. 315 (2002)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Akinori Ohshita: "Direct visualization of electromagnetic microfields by new double-exposure electron holography"Electron Microscopy and Analysis 2003. 215 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Koichi Hata: "Brightness of electron beam emitted from a single pentagon on a multiwall carbon nanotube"Surface and Interface Analysis. 36(in print). (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Koichi Hata: "Interference Fringes Observed in Electron Emission Patterns of a Multi-wall Carbon Nanotube"J. Vac. Sci. Technol. (in print). (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Masaaki Okuhara: "Direct visualization of electromagnetic micro-field by superposition of three types of electron holograms"Proc.of 8th Asia-Pacific Electron Microscopy Conference. (受理、発表予定). (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] Akinori Ohshita: "Direct visualization of magnetic micro-field around a Barium ferrite particle by modified double-exposure electron holography"13th European Microscopy Congress. (受理、発表予定). (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] K.Hata: "Brightness of Electron Beam Emitted from a Single Pentagon on a Multi Carbon Nanotube"Surface and Interface Analysis. 36. (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] K.Hata: "Interference Fringes Observed in Electron Emission Patterns of a multi-wall Carbon Nanotube"J.Vac.Sci.Technol.. (accepted).

    • Related Report
      2003 Annual Research Report
  • [Publications] A.Ohshita: "Direct visualization of electromagnetic microfields by new double-exposure electron holography"Proc.of Electron Microscopy and Analysis Group Conference 2003. (in print).

    • Related Report
      2003 Annual Research Report
  • [Publications] Koichi Hata: "BRIGHTNESS OF ELECTRON BEAM EMITTED FROM A SINGLE PENTAGON ON A MULTIWALL CARBON NANOTUBE TIP"Ultramicroscopy. 95(in press). (2003)

    • Related Report
      2002 Annual Research Report
  • [Publications] 畑 浩一: "多層カーボンナノチューブから電界放出される電子のYoung干渉"日本物理学会講演概要集. 第4分冊 57巻・2号. 762 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 三浦 健治: "多層カーボンナノチューブで観察される電子線干渉縞"第63回応用物理学関係連合講演会講演予稿集. 第2分冊. 674 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] 畑 浩一: "多層カーボンナノチューブの電界放出で観測される電子線干渉縞"第50回応用物理学関係連合講演会. 第2分冊. 1024 (2003)

    • Related Report
      2002 Annual Research Report

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Published: 2002-04-01   Modified: 2016-04-21  

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