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Modeling of GaN-based Electron Devices

Research Project

Project/Area Number 14550329
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field 電子デバイス・機器工学
Research InstitutionShibaura Institute of Technology

Principal Investigator

HORIO Kazushi  Shibaura Institute of Technology, Faculty of Systems Engineering, Professor, システム工学部, 教授 (10165590)

Project Period (FY) 2002 – 2004
Project Status Completed (Fiscal Year 2004)
Budget Amount *help
¥2,800,000 (Direct Cost: ¥2,800,000)
Fiscal Year 2004: ¥700,000 (Direct Cost: ¥700,000)
Fiscal Year 2003: ¥800,000 (Direct Cost: ¥800,000)
Fiscal Year 2002: ¥1,300,000 (Direct Cost: ¥1,300,000)
KeywordsGaN / FET / current collapse / drain lag / gate lag / trap / buffer layer / device simulation / MESFET / HEMT
Research Abstract

Recently, GaN-based FETs have received great interest because of their potential applications to high power and high temperature microwave devices. However, slow current transients are often observed even if the drain voltage or the gate voltage is changed abruptly. This is called drain lag or gate lag, and is problematic in circuit applications. The slow transients mean that the dc I-V curves and the ac I-V curves become quite different, resulting in lower ac power available than that expected from the dc operation. This is called power slump or current collapse in the GaN-device field. These are regarded as trap-related, and there are many experimental works reported on these phenomena. But, few theoretical works have been reported for GaN-based FETs
Therefore, in this work, two-dimensional transient simulations of GaN MESFETs have been performed in which a three level compensation model is adopted for the semi-insulating buffer layer where a shallow donor a deep donor, and a deep acc … More eptor are considered. Quasi-pulsed I-V curves have been derived from the transient characteristics. It has been shown that when the drain voltage is raised, the drain current overshoots the steady-state value, and when it is lowered, the drain current remains at a low value, showing drain-lag behavior. These are explained by the deep donor's electron capturing and electron emission processes. The drain lag has been shown to become a cause of current collapse, although some gate lag is also seen due to deep levels in the buffer layer. The current collapse has been shown to be more pronounced when the deep-acceptor density in the buffer layer is higher and when the off-state drain voltage is higher, because the trapping effects become more significant. These buffer-trapping effects may be similar to trapping effects in an undoped GaN layer in AlGaN/GaN HEMTs. It is concluded that to minimize the current collapse in GaN FETs, the (deep) acceptor density in the buffer layer should be made low. Less

Report

(4 results)
  • 2004 Annual Research Report   Final Research Report Summary
  • 2003 Annual Research Report
  • 2002 Annual Research Report
  • Research Products

    (16 results)

All 2005 2004 Other

All Journal Article (14 results) Publications (2 results)

  • [Journal Article] Deep-level effects on slow current transients and current collapse in GaN MESFETs2005

    • Author(s)
      K.Yonemoto, K.Horio
    • Journal Title

      Proceedings of the 13th Semi-conducting and Insulating Materials Conference (IEEE SIMX-XIII)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Buffer-trapping effects on drain lag and power compression in GaN FET2005

    • Author(s)
      K.Horio, K.Yonemoto
    • Journal Title

      phys.stat.sol.(c) 2

      Pages: 2635-2638

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Deep-level effects on slow current transients and current collapse in GaN MESFETs2005

    • Author(s)
      K.Yonemoto, K.Horio
    • Journal Title

      Proceedings of the 13^<th> Semi-conducting and Insulating Materials Conference(IEEE SIMC-XIII)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Buffer-trapping effects on drain lag and power compression in GaN FET2005

    • Author(s)
      K.Horio, K.Yonemoto
    • Journal Title

      phys.stat.sol.(c) vol.2,no.7

      Pages: 2635-2638

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Buffer-trapping effects on drain lag and power compression in GaN FET2005

    • Author(s)
      K.Horio, K.Yonemoto
    • Journal Title

      phys.stat.sol.(c) Vol.2(印刷中)

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Deep-level effects on slow current transients and current collapse in GaN MESFETs2005

    • Author(s)
      K.Yonemoto, K.Horio
    • Journal Title

      Proceedings of IEEE SIMC-XIII (印刷中)

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Simulation of power compression in GaAs and GaN MESFETs2004

    • Author(s)
      K.Horio, Y.Kazami, D.Kasai
    • Journal Title

      Proceedings of 2004 International Symposium of Signals, Systems and Electronics

      Pages: 116-119

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Analysis of drain lag and power compression in GaN MESFET2004

    • Author(s)
      K.Horio, K.Yonemoto
    • Journal Title

      Proceedings of the 12th European Gallium Arsenide & Other Semiconductor Application Symposium (GAAS 2004)

      Pages: 567-569

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Numerical analysis of current transients and power slump in GaAs and GaN FETs2004

    • Author(s)
      K.Horio, Y.Kazami, D.Kasai, K.Yonemoto
    • Journal Title

      Proceedings of 2004 Asia-Pacific Microwave Conference (APMC'04)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Simulation of power compression in GaAs and GaN MESFETs2004

    • Author(s)
      K.Horio, Y.Kazami, D.Kasai
    • Journal Title

      Proceedings of 2004 International Symposium on Signals, Systems and Electronics(ISSSE'04)

      Pages: 116-119

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Analysis of drain lag and power compression in GaN MESFET2004

    • Author(s)
      K.Horio, K.Yonemoto
    • Journal Title

      Proceedings of 12^<th> European Gallium Arsenide and Other Semiconductor Application Symposium(GAAS 2004)

      Pages: 567-569

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Numerical analysis of current transients and power slump in GaAs and GaN FETs2004

    • Author(s)
      K.Horio, Y Kazami, D.Kasai, K.Yonemoto
    • Journal Title

      Proceedings of 2004 Asia-Pacific Microwave Conference(APMC'04)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Simulation of power compression in GaAs and GaN MESFETs2004

    • Author(s)
      K.Horio, Y.Kazami, D.Kasai
    • Journal Title

      Proceedings of ISSSE'04

      Pages: 116-119

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Analysis of drain lag and power compression in GaN MESFET2004

    • Author(s)
      K.Horio, K.Yonemoto
    • Journal Title

      Proceedings of GAAS2004

      Pages: 567-569

    • Related Report
      2004 Annual Research Report
  • [Publications] Y.Kazami, D.Kasai, Y.Mitani, K.Horio: "Simulation of Lag Phenomena and Pulsed I-V Curves of Compound Semiconductor FETs as Affected by Impact Ionization"Journal of Computational Electronics. Vol.2. 203-206 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] K.Horio, Y.Kazami, D.Kasai: "Simulation of Power Compression in GaAs and GaN MESFETs"Proceeding of ISSSE'04. (2004)

    • Related Report
      2003 Annual Research Report

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Published: 2002-04-01   Modified: 2016-04-21  

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