| Project/Area Number |
14550408
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Measurement engineering
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| Research Institution | Tohoku University |
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Principal Investigator |
SAWAYA Kunio Tohoku University, Graduate School of Engineering, Professor, 大学院・工学研究科, 教授 (60108470)
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| Co-Investigator(Kenkyū-buntansha) |
SATO Hiroyasu Tohoku University, Graduate School of Engineering, Research Associate, 大学院・工学研究科, 助手 (20302234)
CHEN Qiang Tohoku University, Graduate School of Engineering, Associate Professor, 大学院・工学研究科, 助教授 (30261580)
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| Project Period (FY) |
2002 – 2003
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| Project Status |
Completed (Fiscal Year 2003)
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| Budget Amount *help |
¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 2003: ¥1,100,000 (Direct Cost: ¥1,100,000)
Fiscal Year 2002: ¥2,400,000 (Direct Cost: ¥2,400,000)
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| Keywords | Electromagnetic wave / Estimation of EM Source / EMC / Antenna / Modulated scattering element / Noise / 変調散乱素子 / 不要放射 / 電波ホログラフィ / 平面走査 / 球面走査 / 分解能 / 環境電磁工学 / モーメント法 |
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| Research Abstract |
In this research, methods to estimate the location of the source with high resolution have been established to find the undesired radiation sources in the electrical and electronic devices which affect the performance of the other devices and cause the serious interference problem.
First, a method to determine the coefficient of power series of the spherical expansion modes has been investigated to obtain a high resolution especially at low frequency. The effect of the mutual coupling between the array elements on the resolution has also been studied to obtain the information on source location with high resolution by using the MUSIC algorithm.
Next, the sources of undesired radiation from a printed circuit board have been estimated by using the improved planar scanning technique.
Then, a method of measuring the radiation pattern of the electromagnetic source has been proposed by using the modulated scattering elements. The measurement system has been established which can be used to measure the amplitude of the electromagnetic wave in several points simultaneously.
Moreover, the near field measurement without disturbing the current distribution on the electromagnetic source has been developed. The amplitude of the undesired electromagnetic wave from the noise sources can be accurately measured by using this method. The experiment has been performed to show the effectiveness of the method.
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