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Study of the Microstructure of iViaterials by Synchrotron Radiation Wavelength-Modulated Diffraction Method

Research Project

Project/Area Number 14550659
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Physical properties of metals
Research InstitutionRitsumeikan University

Principal Investigator

IWASAKI Hiroshi  Ritsumeikan Univ., Fac Science and Engineering, Professor, 理工学部, 教授 (50005857)

Co-Investigator(Kenkyū-buntansha) NAKAMURA Naotake  Ritsumeikan Univ., Fac Science and Engineering, Professor, 理工学部, 教授 (10066722)
Project Period (FY) 2002 – 2003
Project Status Completed (Fiscal Year 2003)
Budget Amount *help
¥3,200,000 (Direct Cost: ¥3,200,000)
Fiscal Year 2003: ¥700,000 (Direct Cost: ¥700,000)
Fiscal Year 2002: ¥2,500,000 (Direct Cost: ¥2,500,000)
KeywordsSynchrotron Radiation / X-ray Diffraction / Crystal Structure Analysis / Anomalous Scattering / Multilayer Monochromator / X線回析
Research Abstract

We established utilizing the continuous nature of spectrum and the high brightness of synchrotron radiation a new diffraction method "wavelength-modulated diffraction" and showed that it is possible to derive information on the microstructure of materials that is not obtainable by other methods. From the intensity profile of Bragg reflections recorded using radiation of a band of wavelength in the vicinity of the absorption edge of an atom in organic crystal, phases of the structure factors were derived.
In the present research, the method has been extended so that parallel radiation beam of a band of wavelength isproduced by reflection by a depth'graded multilayer at the X-ray diffraction beamline at the Ritsumeikan Synchrotron Radiation Center and used to record intensity profiles of Bragg reflections. With a single crystal of a ferrocene derivative known to have an enantiomorphous structure as a sample and the wavelength band set so as to include the absorption edge of the iron atom, clear contrast has been observed at the edge between the Friedel pairs of reflections and the chirality of the structure has been unequivocally determined. It has also been shown that the method has a wide range of application in diffraction crystallography.

Report

(3 results)
  • 2003 Annual Research Report   Final Research Report Summary
  • 2002 Annual Research Report
  • Research Products

    (11 results)

All Other

All Publications (11 results)

  • [Publications] T.Koganezawa: "A Wide-Bandpass Monochromator and Its Application to the Determination of Absolute Structure"J.Appl.Cryst.. 37. 136-142 (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] T.Koganezawa: "A Diffraction System with an X-ray Beam of a Band of Wavelength"Proc. 8th Intern. Conf. Synchrotron Radiation Instrumentation. (印刷中). (2004)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] 小金沢智之: "放射光波長変調回折法とその最近の発展"理学電機ジャーナル. 34. 4-14 (2003)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] T.Koganezawa, H.Iwasaki, N.Nakamura, Y.Yoshimura, T.Shoji: "A Wide-B andp ass Monochromator and Jts Application to the Determination of Absolute Structure"J.Appl.Cryst.. 37. 136-142 (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] T.Koganezawa, H.Iwasaki, N.Nakamura, Y.Yoshimura, T.Shoji: "A Diffraction System with an X-ray Beam of a Band of Wavelength"Proc. 8th Intern. Conf. Synchrotron Radiation Instrurnentatior. (in press). (2004)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] T.Koganezawa, H.Iwasaki, N.Nakamura, Y.Yoshimura: "Synchrotron Radiation Wavelength-Modulated Diffraction Method and Its Recent Developments"Rigaku Denki Journal. 34. 4-14 (2003)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2003 Final Research Report Summary
  • [Publications] T.Koganezawa: "A Wide-Bandpass Monochromator and Its Application to the Determination of Absolute Structure"J.Appl.Cryst.. 37. 136-142 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] T.Koganezawa: "A Diffraction System with an X-ray Beam of a Band of Wavelength"Proc.Intern.Conf.Synchrotron Radiation Instrumentation. (印刷中). (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] 小金沢智之: "放射光波長変調回折法とその最近の発展"理学電機ジャーナル. 34. 4-14 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] T.Koganezawa: "Phase Determination by Wavelength-Modulated Diffraction. II."Acta Cryst.. A58(Suppl). C84 (2002)

    • Related Report
      2002 Annual Research Report
  • [Publications] T.Koganezawa: "Phase Determination by Wavelength-Modulated Diffraction"Mem. SR Center Ritsumeikan University. 5(in press). (2003)

    • Related Report
      2002 Annual Research Report

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Published: 2002-04-01   Modified: 2016-04-21  

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