| Budget Amount *help |
¥40,560,000 (Direct Cost: ¥31,200,000、Indirect Cost: ¥9,360,000)
Fiscal Year 2005: ¥7,800,000 (Direct Cost: ¥6,000,000、Indirect Cost: ¥1,800,000)
Fiscal Year 2004: ¥15,340,000 (Direct Cost: ¥11,800,000、Indirect Cost: ¥3,540,000)
Fiscal Year 2003: ¥17,420,000 (Direct Cost: ¥13,400,000、Indirect Cost: ¥4,020,000)
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| Research Abstract |
The objective of the present research is to develop the atomic and molecular manipulation method using atomic force microscopy. There are mainly two problems in this research ; (1)High sensitive force detection, (2)Investigation of the mechanism and condition on atomic and molecular manipulation using the atomic force acting between tip and surface.
The main results of this research are as follows :
(1)Mechanism and condition of vertical atomic manipulation
We clarified the mechanism and condition of vertical atomic and molecular manipulation to mechanically remove and deposit the atom and molecule on the surface. Here, we used the Si(111) surface as a sample surface. The measurement parameters were vibration amplitude of the oscillating cantilever, frequency shift and temperature of the sample.
(2)Controllable factors of vertical atomic manipulation using modified tip
The electronic state of the tip apex was easily changed by modifying the tip apex. By using the modified tip, we further investigated the mechanism of vertical atomic manipulation to mechanically remove and deposit the atom on the surface.
(3)Mechanism and condition of lateral atomic manipulation
We further investigated the mechanism and condition of lateral atomic manipulation to mechanically slide the atom on the surface. Here, we used the ionic crystal CaF_2 surface with small surface energy.
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