Ultra high-resolution scanning near-field optical microscope for direct gene reading
| Project/Area Number |
15360132
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Intelligent mechanics/Mechanical systems
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| Research Institution | The University of Tokyo |
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Principal Investigator |
HAMAGUCHI Tetsuya The University of Tokyo, Graduate School of Engineering, Associate Professor, 大学院・工学系研究科, 助教授 (90345083)
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| Co-Investigator(Kenkyū-buntansha) |
NAKAO Masayuki The University of Tokyo, Graduate School of Engineering, Professor, 大学院・工学系研究科, 教授 (90242007)
WASHIZU Masao The University of Tokyo, Graduate School of Engineering, Professor, 大学院・工学系研究科, 教授 (10201162)
FUKUI Kiichi The University of Osaka, Graduate School of Engineering, Professor, 大学院・工学研究科, 教授 (00311770)
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| Project Period (FY) |
2003 – 2004
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| Project Status |
Completed (Fiscal Year 2004)
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| Budget Amount *help |
¥15,400,000 (Direct Cost: ¥15,400,000)
Fiscal Year 2004: ¥4,600,000 (Direct Cost: ¥4,600,000)
Fiscal Year 2003: ¥10,800,000 (Direct Cost: ¥10,800,000)
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| Keywords | scanning near-field optical microscope / scattering probe / focused ion beam / electron beam deposition / fluorescent observation / crystalline carbon |
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| Research Abstract |
The objective of this research is developing a scanning near-field optical microscope (SNOM), to realize ultra high-resolution observation of fluorescent molecules on a specific gene of a DNA. The outline of the results is shown below.
(1)Fundamental fabrication technique which produces micro SNOM probe for scattering near-field light around a specimen. Electron beam deposition method has been newly developed for fabricate a micro SNOM probe with a high aspect ratio tip end with 1 micrometer length and 20 nanometer diameter. And we have prototyped a micro SNOM probe with 500 nanometer square aperture, fabricating an AFM cantilever using focused ion beam.
(2)For further miniaturization of the SNOM probe tip, we develop a new electron beam deposition method that produces not only amorphous carbon but also crystalline carbon. A examination result shows the optimum condition for producing crystalline carbon was 900 degrees temperature and 1 torr pressure. To realize the optimum condition in a scanning electron microscope (SEM) chamber, we developed a local heating and compression equipment, and confirmed that crystalline carbon was produced in the SEM camber. And it was proposed to control the direction and length of the crystalline carbon by applying magnetic field, to produce crystalline carbon with a desired shape at a desired position.
(3)Through a fluorescent observation using prototyped SNOM probe, the optimum probe shape to get the highest S/N ratio and resolution at each wavelength. We optimized the parameters of excitation light strength, irradiation area, transmissivity of the filter, and reduce the noise. As the result, it was confirmed that reducing excitation light strength improved the S/N ratio, and reduced excitation light made a fluorescent image. These results showed feasibility of the observation of only fluorescent particle.
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Report
(3 results)
Research Products
(25 results)
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[Journal Article] Fabrication of Atom Trap Chip for Quantum Information Processing2004
Author(s)
Nagato, K., Ohsige, K., Ooi, T., Tsuchiya, K., Hamaguchi, T., Nakao, M.
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Journal Title
Proc.ASPE Annual meeting 2004 34
Pages: 121-124
Related Report
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