• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Low-temperature orientation-control of SiGe quasi-single crystal on glass and its device application

Research Project

Project/Area Number 15360169
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionKyushu University

Principal Investigator

MIYAO Masanobu  Kyushu University, Department of Electronics, Professor, 大学院・システム情報科学研究院, 教授 (60315132)

Co-Investigator(Kenkyū-buntansha) SADOH Taizoh  Kyushu University, Department of Electronics, Associate Professor, 大学院・システム情報科学研究院, 助教授 (20274491)
KENJO Atsushi  Kyushu University, Department of Electronics, Research Associate, 大学院・システム情報科学研究院, 助手 (20037899)
Project Period (FY) 2003 – 2005
Project Status Completed (Fiscal Year 2005)
Budget Amount *help
¥12,800,000 (Direct Cost: ¥12,800,000)
Fiscal Year 2005: ¥4,500,000 (Direct Cost: ¥4,500,000)
Fiscal Year 2004: ¥4,200,000 (Direct Cost: ¥4,200,000)
Fiscal Year 2003: ¥4,100,000 (Direct Cost: ¥4,100,000)
Keywordselectron device / large-scale integrated circuit / display / silicon / crystal growth
Research Abstract

Low temperature orientation control of SiGe quasi-single crystals and its device application have been investigated.
The solid-phase crystallization of a-Si/a-Ge/glass and a-Si/a-Ge/a-Si/glass stacked structures was studied systematically. It was found that two-dimensional nucleation was selectively induced by inserting Ge layers thicker than the critical thickness at the interface between the a-Si layer and the glass substrate. This is an important finding for orientation control of SiGe quasi-single crystals.
In addition, a novel device structure, suitable for low-temperature processing, was studied, and the fabrication process of the Schottky source/drain structure transistor was established at a low-temperature (≦450℃). Moreover, a good transistor operation of transistors fabricated on the glass substrate was demonstrated.

Report

(4 results)
  • 2005 Annual Research Report   Final Research Report Summary
  • 2004 Annual Research Report
  • 2003 Annual Research Report
  • Research Products

    (26 results)

All 2005 2004 2003 Other

All Journal Article (20 results) Publications (6 results)

  • [Journal Article] Recent Progress in Low-Temperature Growth of SiGe/SiO_2 for Future TFT (invited)2005

    • Author(s)
      M.Miyao 他
    • Journal Title

      Proc. of 1st Int. TFT Conference, Seoul

      Pages: 32-35

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Ge fraction dependent improved thermal stability of in-situ doped boron in polycrystalline Si_1-XGe_X (0≦X≦0.5) films on SiON2005

    • Author(s)
      M.Miyao 他
    • Journal Title

      Journal Applied Physics 97(5)

      Pages: 4909-4915

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Recent Progress in Low-Temperature Growth of SiGe/SiO2 for Future TFT (invited)2005

    • Author(s)
      M.Miyao et al.
    • Journal Title

      Proc.of 1st Int.TFT Conferecne, Seoul

      Pages: 32-35

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Ge fraction dependent improved thermal stability of in-situ doped boron in polycrystalline Si1-XGeX (0≦x≦0.5) films on SiON2005

    • Author(s)
      M.miyao et al.
    • Journal Title

      Journal Applied Physics Vol.97

      Pages: 4909-4915

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Recent Progress in Low-Temperature Growth of SiGe/SiO_2 for Future TFT (invited)2005

    • Author(s)
      M.Miyao 他
    • Journal Title

      Proc.of 1st Int.TFT Conference, Seoul

      Pages: 32-35

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Ge fraction dependent improved thermal stability of in-situ doped boron in polycrystalline Si_<1-X>Ge_X (0≦X≦0.5) films on SiON2005

    • Author(s)
      M.Miyao 他
    • Journal Title

      Journal Applied Physics 97(5)

      Pages: 4909-4915

    • Related Report
      2005 Annual Research Report
  • [Journal Article] Solid-Phase crystallization of high-quality Si films on SiO_2 by local Ge-Insertion2004

    • Author(s)
      I.Tsunoda 他
    • Journal Title

      Thin Solid Films 451-452C

      Pages: 489-492

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Nucleation Control in Solid-Phase Crystallization of a-Si/SiO_2 by Local Ge Insertion2004

    • Author(s)
      I.Tsunoda 他
    • Journal Title

      Jpn. J. Appl. phys. 43(4B)

      Pages: 1901-1904

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] 絶縁膜状におけるSiGe結晶成長とデバイス応用2004

    • Author(s)
      宮尾 正信 他
    • Journal Title

      日本結晶成長学会誌 31(1)

      Pages: 23-38

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Solid-phase crystallization of high-quality Si films on SiO2 by local Ge-Insertion2004

    • Author(s)
      I.Tsunoda et al.
    • Journal Title

      Thin Solid Films Vol.451-452C

      Pages: 489-492

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Nucleation Control in Solid-Phase Crystallization of a-Si/SiO2 by Local Ge Insertion2004

    • Author(s)
      I.Tsunoda et al.
    • Journal Title

      Jpn.J.Appl.Phys. Vol.43

      Pages: 1901-1904

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Positon control of Nucleation in Solid-Phase Crystallization of a-Si/SiO2 by Ge Layer Insertion2004

    • Author(s)
      T.Sadoh et al.
    • Journal Title

      MRS Symp.Proc. Vol.796

      Pages: 39-43

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Enhanced Crystal nucleation in a-SiGe/SiO_2 by Ion-irradiation Assisted Annealing2004

    • Author(s)
      I.Tsunoda 他
    • Journal Title

      Applied Surface Science 224

      Pages: 231-234

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Solid-phase crystallization of high-quality Si films on SiO_2 by local Ge-Insertion2004

    • Author(s)
      I.Tsunoda 他
    • Journal Title

      Thin Solid Films 451-452C

      Pages: 489-492

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Nucleation Control in Solid-Phase Crystallization of a-Si/SiO_2 by Local Ge Insertion2004

    • Author(s)
      I.Tsunoda 他
    • Journal Title

      Jpn.J.Appl.Phys. 43(4B)

      Pages: 1901-1904

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Positon Control of Nucleation in Solid-Phase Crystallization of a-Si/SiO_2 by Ge Layer Insertion2004

    • Author(s)
      T.Sadoh 他
    • Journal Title

      MRS Symp.Proc. 796

      Pages: 39-43

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Enhanced crystal nucleation in a-Si on SiO_2 by local Ge doping2004

    • Author(s)
      T.Sadoh 他
    • Journal Title

      Thin Solid Films 464-465

      Pages: 99-102

    • Related Report
      2004 Annual Research Report
  • [Journal Article] 絶縁膜上におけるSiGe結晶成長とデバイス応用2004

    • Author(s)
      宮尾 正信 他
    • Journal Title

      日本結晶成長学会誌 31(1)

      Pages: 23-38

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Ge-fraction-dependent metal-induced lateral crystallization of amorphous-Si_1-xGe_x (0≦x≦1) on SiO_22003

    • Author(s)
      H.Kanno 他
    • Journal Title

      Appl. Phys. Lett. 82(13)

      Pages: 2148-2150

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Journal Article] Ge-fraction-dependent metal-induced lateral crystallization of amorphous-Si1-xGex (0≦x≦1) on SiO22003

    • Author(s)
      H.Kanno et al.
    • Journal Title

      Appl.Phys.Lett. Vol.82

      Pages: 2148-2150

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2005 Final Research Report Summary
  • [Publications] H.kanno 他: "Ge-fraction-dependent metal-induced lateral crystallization of amorphous-Si_<1-x>Ge_x(0≦x≦1)on SiO_2"Appl.Phys.Lett.. 82(13). 2148-2150 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] H.kanno 他: "Metal-Induced Solid-Phase Crystallization of Amorphous SiGe Films on Insulator"Jpn.J.Appl.Phys.. 42(4B). 1933-1936 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] H.kanno 他: "Metal-Induced Low-Temperature Crystallization of Amorphous SiGe on Insulating Films"Mat.Res.Soc.Symp.Proc.. 744. 55-60 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] I.Tsunoda 他: "Low-temperature Formation of Poly-SiGe on SiO_2 by Ion-Beam Stimulated Solid-Phase Crystallization"Digest of Technical Papers AM-LCD.. 29-32 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] T.Sadoh 他: "Ge-dependent Morphological Change in Poly-SiGe Formed by Ni-mediated Crystallization"Applied Surface Science. 224(1-4). 227-230 (2004)

    • Related Report
      2003 Annual Research Report
  • [Publications] I.Tsunoda 他: "Enhanced Crystal nucleation in a-SiGe/SiO_2 by Ion-irradiation Assisted Annealing"Applied Surface Science. 224(1-4). 231-234 (2004)

    • Related Report
      2003 Annual Research Report

URL: 

Published: 2003-04-01   Modified: 2016-04-21  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi