| Project/Area Number |
15560045
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied physics, general
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| Research Institution | Osaka Electro-Communication University |
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Principal Investigator |
IKUTA Takashi Osaka Electro-Communication University, Faculty of Engineering, Professor, 工学部, 教授 (20103343)
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| Project Period (FY) |
2003 – 2004
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| Project Status |
Completed (Fiscal Year 2004)
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| Budget Amount *help |
¥3,100,000 (Direct Cost: ¥3,100,000)
Fiscal Year 2004: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 2003: ¥2,100,000 (Direct Cost: ¥2,100,000)
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| Keywords | Imaging system / Wave aberration / Spherical aberration / Aberration-free observation / Linear imaging / Non-linear imaging / Aberration correction / Transmission electron microscope |
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| Research Abstract |
In microscopes, it is known that the cross talk of non-linear image components makes difficult to achieve valid image interpretation for the sample complex scattering function. The primary aim of this study is the complete rejection of these non-linear image components in the aberration-free phase microscopy recently proposed by the author.
According to this aims, the generalized imaging theory for the optical imaging system with an annular pupil was developed in the first stage (2003). This theory is the extension of the tree dimensional (3D) imaging theory. Under the basis of this extended imaging theory, image simulation programs were coded to evaluate the cross talk of non-linear image components in the aberration-free phase microscopy. The results of this simulation shown that these non-linear image components can be almost rejected by the annular pupil in the imaging system.
In the next stage (2004) of the present study, an optical microscope equipped an objective lens with an annular pupil and a dynamic hollow-cone illuminator was constructed as a test bench of the proposed aberration-free linear-imaging phase microscopy. Using this test bench, the reduction of the cross talk of non-linear image components was confirmed without any problem for original operations in the aberration-free phase microscopy. The present aberration-free linear-imaging phase microscopy using the annular pupil is, therefore, expected as a new and valuable imaging technique for both optical microscope and the transmission electron microscope.
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