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Fabrication of Bismuth Thin Films Nano-Hall Sensors for Room Temperature Scanning Micro-Hall Probe Microscope Imaging of Ferromagnetic Microstructures

Research Project

Project/Area Number 15560271
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionTOKYO INSTITUTE OF TECHNOLOGY

Principal Investigator

SANDHU Adarsh  Tokyo Institute of Technology, Quantum Nanoelectronics Research Center, Associate Professor, 量子ナノエレクトロニクス研究センター, 助教授 (80276774)

Project Period (FY) 2003 – 2004
Project Status Completed (Fiscal Year 2004)
Budget Amount *help
¥3,700,000 (Direct Cost: ¥3,700,000)
Fiscal Year 2004: ¥800,000 (Direct Cost: ¥800,000)
Fiscal Year 2003: ¥2,900,000 (Direct Cost: ¥2,900,000)
KeywordsHall Effect Devices / Magnetic domains / SHPM / bismuth / nanotechnology / focused ion beams / ferromagnetic materials / magnetic recording media / 班金属材料
Research Abstract

A fundamental understanding of the behavior of magnetic domains in external magnetic fields is important for the development of information technology such as ultra-high density magnetic recording media, high coercivity permanent magnets and multilayered ferromagnetic structures used for fabricating novel ‘spintronic'' devices. We have developed a room temperature scanning Hall probe microscopy (RT-SHPM) for the non-invasive and quantitative imaging of localized stray fields at the surfaces of ferromagnetic magnetic microstructures in the presence of pulsed external magnetic fields of 3 T Oe. However, advances in magnetic recording media have led to increasing demands for improvements in the spatial resolution of SHPM which using semiconducting GaAs/AlGaAs micro-Hall sensors is limited to 1.0 x 1.0μm due to surface depletion effects.
The use of bismuth (Bi)(a semimetal, which exhibits a large Hall coefficient and negligible surface depletion) for fabrication of submicron Hall sensors sh … More ows promise as a means of improving the spatial resolution of RT-SHPM technology. Conventional MFM systems have a spatial resolution of 〜100nm, a figure which serves as a benchmark and target for studies on spatial resolution.
In this research we succeeded in fabricating 50nm x 50nm Hall sensors using Bi thin films deposited by thermal evaporation. The electrical properties of the films were improved by post-deposition annealing in vacuum. The nano-Hall sensors were successfully used for magnetic imaging the surface of crystalline garnet thin films.
This report describes the research carried out on "Fabrication of Bismuth Thin Films Nano-Hall Sensors for Room Temperature Scanning Micro-Hall Probe Microscope Imaging of Ferromagnetic Microstructures" as part of the Grant-in-Aid for Scientific Research (c)(2)for two years between 2003 and 2004. The fabrication and electrical characteristics of the Bi nano-Hall sensors are described. Also, the use of the Bi-nanosensors for imaging garnet thin films is demonstrated. Less

Report

(3 results)
  • 2004 Annual Research Report   Final Research Report Summary
  • 2003 Annual Research Report
  • Research Products

    (18 results)

All 2004 2003 Other

All Journal Article (16 results) Publications (2 results)

  • [Journal Article] Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy2004

    • Author(s)
      A.Sandhu, et al.
    • Journal Title

      Microelectronic Engineering 73

      Pages: 524-528

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] High Sensitivity InSb Ultra-Thin Film Micro-Hall Sensors for Bioscreening Applications2004

    • Author(s)
      Sandhu, et al.
    • Journal Title

      Japanese Journal of Applied Physics 43

      Pages: 868-870

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Novel variable temperature nano-SHPM for large area magnetic imaging incorporating piezoelectric actuators maintaned at room temperature.2004

    • Author(s)
      A.Sandhu, et al.
    • Journal Title

      Nanotechnology 15

      Pages: 410-413

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] 50 nm Hall Sensors for Room Temperature Scanning Hall Probe Microscopy2004

    • Author(s)
      A.Sandhu, et al.
    • Journal Title

      Japanese Journal of Applied Physics 43

      Pages: 777-778

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Micro-Hall Devices for Scanning Hall Probe Microscopy2004

    • Author(s)
      Adarsh Sandhu
    • Journal Title

      IEEJ Transactions on Sensors and Micromachines 124

      Pages: 233-237

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Annual Research Report 2004 Final Research Report Summary
  • [Journal Article] Micro-Hall Devices for Scanning Hall Probe Microscopy2004

    • Author(s)
      A.SANDHU
    • Journal Title

      IEEJ Transactions on Sensors and Micromachines 124

      Pages: 233-237

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy.2004

    • Author(s)
      A.SANDHU.A.Okamoto, I.Shibasaki, A.Oral
    • Journal Title

      Microelectronic Engineering Volumes 73-74

      Pages: 524-528

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Novel variable temperature scanning nano-hall probe microscope system for large area magnetic imaging incorporating piezoelectric actuators maintained at room temperature.2004

    • Author(s)
      A.SANDHU.H.Masuda, H.Senoguchi, K.Togawa
    • Journal Title

      Nanotechnology 15

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] 50 nm Hall Sensors for Room Temperature Scanning Hall Probe Microscopy.2004

    • Author(s)
      A.SANDHU.K.Kurosawa, M.Dede, A.Oral
    • Journal Title

      Japanese Journal of Applied Physics 43

      Pages: 777-778

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy2004

    • Author(s)
      A.Sandhu et al.
    • Journal Title

      Microelectronic Engineering 73

      Pages: 524-528

    • Related Report
      2004 Annual Research Report
  • [Journal Article] High Sensitivity InSb Ultra-Thin Film Micro-Hall Sensors for Bioscreening Applications2004

    • Author(s)
      Sandhu et al.
    • Journal Title

      Japanese Journal of Applied Physics 43

      Pages: 868-870

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Novel variable temperature nano-SHPM for large area magnetic imaging incorporating piezoelectric actuators maintained at room temperature.2004

    • Author(s)
      Sandhu et al.
    • Journal Title

      Nanotechnology 15

      Pages: 410-413

    • Related Report
      2004 Annual Research Report
  • [Journal Article] 50 nm Hall Sensors for Room Temperature Scanning Hall Probe Microscopy2004

    • Author(s)
      A.Sandhu et al.
    • Journal Title

      Japanese Journal of Applied Physics 43

      Pages: 777-778

    • Related Report
      2004 Annual Research Report
  • [Journal Article] Room Temperature Scanning Micro-Hall Probe Microscopy under Extremely Large Pulsed Magnetic Fields2003

    • Author(s)
      A.Sandhu, et al.
    • Journal Title

      IEEE Transactions on Magnetics 39

      Pages: 213-215

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Room Temperature Scanning Micro-Hall Probe Microscopy Under Extremely Large Pulsed Magnetic Fields.2003

    • Author(s)
      A.SANDHU.H.Masuda, A.Oral
    • Journal Title

      IEEE Trans. on Magnetics 38

      Pages: 1462-1466

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2004 Final Research Report Summary
  • [Journal Article] Room Temperature Scanning Micro-Hall Probe Microscopy under Extremely Large Pulsed Magnetic Fields2003

    • Author(s)
      A.Sandhu et al.
    • Journal Title

      IEEE Transactions on Magnetics 39

      Pages: 213-215

    • Related Report
      2004 Annual Research Report
  • [Publications] A.Sandhu et al.: "Room Temperature Scanning Micro-Hall Probe Microscopy under Extremely Large Pulsed Magnetic Fields"IEEE Transactions on Magnetics. 39. 213-215 (2003)

    • Related Report
      2003 Annual Research Report
  • [Publications] A.Sandhu et al.: "Nano and micro Hall-effect sensors for room-temperature scanning hall probe microscopy"Microelectronic Engineering. (accepted for publication). (2004)

    • Related Report
      2003 Annual Research Report

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Published: 2003-04-01   Modified: 2021-04-07  

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