| Budget Amount *help |
¥24,180,000 (Direct Cost: ¥18,600,000、Indirect Cost: ¥5,580,000)
Fiscal Year 2017: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2016: ¥7,280,000 (Direct Cost: ¥5,600,000、Indirect Cost: ¥1,680,000)
Fiscal Year 2015: ¥13,130,000 (Direct Cost: ¥10,100,000、Indirect Cost: ¥3,030,000)
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| Outline of Final Research Achievements |
In this project, we have developed atomic resolution electrical biasing in-situ electron microscopy, which allows us to observe atomistic structure of material under external electric field and determine the atomic position precisely. Also, we have applied this method to characterize ferroelectric materials. We have demonstrated that in a prototypical dielectric crystal, strontium titanate, precision below 10 pm in the atomic position determination can be achieved. (Sato et al., Appl. Phys. Lett., 2017.) We are characterizing other ferroelectric materials using this method and we will publish the results in near future.
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