| Budget Amount *help |
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2017: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2016: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2015: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
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| Outline of Final Research Achievements |
We developed a novel scanning probe microscopy method called scanning nonlinear dielectric potentiometry (SNDP). This microscopy method is a potentiometric extension of scanning nonlinear dielectric microscopy and allows the nano- to atomic-scale quantitative measurement of electric potentials induced by spontaneous polarization on surfaces and interfaces. In this project, we developed an apparatus for SNDP measurement, experimentally validated some theoretical aspects, and also made a further extension of SNDP. In addition, we explored the new application areas of SNDP and demonstrated that this microscopy method will useful for the nano-scale evaluation of emerging atomic-layer materials and devices such as graphene and related electronic devices.
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