| Budget Amount *help |
¥5,070,000 (Direct Cost: ¥3,900,000、Indirect Cost: ¥1,170,000)
Fiscal Year 2017: ¥520,000 (Direct Cost: ¥400,000、Indirect Cost: ¥120,000)
Fiscal Year 2016: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2015: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
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| Outline of Final Research Achievements |
The purpose of this study is to develop a time-resolved ellipsometry technique using laser-driven plasma X-ray laser (XRL). It is necessary to measure accurately the beam intensity of the XRL beam with a large intensity fluctuation and then to analyze precisely the polarization state. In this study, the following has been developed: (1) two types of beam intensity monitors working at a wavelength of 13.9 nm based on a Mo/Si multilayer-coated photodiode and a molybdenum-overcoated diffraction grating; (2) soft X-ray ellipsometry with multilayer polarizing elements based on absolute reflectometry. The above is a basic technique for time-resolved ellipsometry that contributes to understand ultrashort pulse laser-materials interaction, such as laser-abration.
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