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Proposal of "pore engineering" as a device designing method for conducting-bridge memory

Research Project

Project/Area Number 15K06017
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionTokyo University of Science (2017)
Tottori University (2015-2016)

Principal Investigator

Kinoshita Kentaro  東京理科大学, 理学部第一部応用物理学科, 准教授 (60418118)

Co-Investigator(Kenkyū-buntansha) 伊藤 敏幸  鳥取大学, 工学研究科, 教授 (50193503)
Project Period (FY) 2015-04-01 – 2018-03-31
Project Status Completed (Fiscal Year 2017)
Budget Amount *help
¥4,940,000 (Direct Cost: ¥3,800,000、Indirect Cost: ¥1,140,000)
Fiscal Year 2017: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2016: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2015: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
KeywordsCBRAM / 細孔 / 溶媒添加 / イオン液体 / 溶媒和イオン液体 / 金属イオン / 導電性ブリッジメモリ / 多結晶薄膜 / 溶媒 / 溶媒添加効果 / 金属イオン含有イオン液体 / ナノ多孔体 / 抵抗変化メモリ / 動作電圧 / データ保持
Outline of Final Research Achievements

This research aims to demonstrate the effectiveness of "pore engineering." The present technique controls memory characteristics through (i) kind of added solvent, (ii) pore size, (iii) properties of the pore surface. In particular, in the metal oxide porous body CBRAM, our research revealed that the polarity and pH of the added solvent have a notable influence on the memory effect. In this study, many solvents for improving CBRAM performance were successfully developed. A significant improvement in the write/erase cycling endurance (SE) was realized, for example, by adding an ionic liquid containing Cu2+ or Ag+. The addition of a solvated ionic liquid makes it easy to approach Cu2+ to the cathode and the reduction of switching voltage as well as the improvement of SE was realized.

Report

(4 results)
  • 2017 Annual Research Report   Final Research Report ( PDF )
  • 2016 Research-status Report
  • 2015 Research-status Report
  • Research Products

    (15 results)

All 2018 2017 2016 2015

All Journal Article (8 results) (of which Peer Reviewed: 7 results,  Open Access: 2 results,  Acknowledgement Compliant: 4 results) Presentation (6 results) (of which Int'l Joint Research: 1 results,  Invited: 1 results) Book (1 results)

  • [Journal Article] Realization of High Performance and Very High Density by Introducing Porous Bodies into Conducting-Bridge Random Access Memory (CB-RAM)2017

    • Author(s)
      木下健太郎
    • Journal Title

      ゼオライト

      Volume: 34 Issue: 1 Pages: 10-18

    • DOI

      10.20731/zeoraito.34.1.10

    • NAID

      40021079224

    • ISSN
      0918-7774
    • Year and Date
      2017-01-31
    • Related Report
      2016 Research-status Report
    • Acknowledgement Compliant
  • [Journal Article] Significantly Improved Performance of a Conducting-bridge Random Access Memory (CB-RAM) Device Using Copper-containing Glyme Salt,2017

    • Author(s)
      Yamaoka, H.; Yamashita, T.; Harada, A.; Sakaguchi, A.; Kinoshita, K.; Kishida, S.; Hayase, S.; Nokami, T.; Itoh, T.
    • Journal Title

      Chem. Lett.

      Volume: 46 Issue: 12 Pages: 1832-1835

    • DOI

      10.1246/cl.170854

    • NAID

      130006243157

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed / Open Access
  • [Journal Article] Improvement of Switching Endurance of Conducting-Bridge Random Access Memory by Addition of Metal Ion-Containing Ionic Liquid2017

    • Author(s)
      Kentaro Kinoshita, Atsushi Sakaguchi, Akinori Harada, Hiroki Yamaoka, Satoru Kishida, Yukinobu Fukaya, Toshiki Nokami, Toshiyuki Itoh
    • Journal Title

      Jpn. J. Appl. Phys.

      Volume: 56 Issue: 4S Pages: 04CE13-04CE13

    • DOI

      10.7567/jjap.56.04ce13

    • NAID

      210000147592

    • Related Report
      2016 Research-status Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Improved Performance of a Conducting-Bridge Random Access Memory using Ionic Liquids2016

    • Author(s)
      Harada, A.; Yamaoka, H.; Tojo, S.; Watanabe, K.; Sakaguchi, A.; Kinoshita, K.; Kishida, S.; Fukaya, Y.; Matsumoto, K.; Hagiwara,R.; Sakaguchi, H.; Nokami, T.; Itoh, T.
    • Journal Title

      Journal of Materials Chemistry

      Volume: 4 Issue: 30 Pages: 7215-7222

    • DOI

      10.1039/c6tc01486k

    • Related Report
      2016 Research-status Report
    • Peer Reviewed
  • [Journal Article] Influence of ultraviolet irradiation on data retention characteristics in resistive random access memory2016

    • Author(s)
      Kouhei Kimura, Kouotoku Ohmi, Satoru Kishida, and Kentaro Kinoshita
    • Journal Title

      Appl. Phys. Lett.

      Volume: 108 Issue: 12

    • DOI

      10.1063/1.4944413

    • Related Report
      2015 Research-status Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Copper Ion Containing Ionic Liquids Provides Improved Endurance and Switching Voltage Distributions of Conducting-Bridge Random Access Memory2015

    • Author(s)
      Akinori Harada, Hiroki Yamaoka, Kouhei Watanabe, Kentaro Kinoshita, Satoru Kishida, Yukinobu Fukaya, Toshiki Nokami, Toshiyuki Itoh
    • Journal Title

      Chemistry Letter

      Volume: 44 Issue: 11 Pages: 1578-1580

    • DOI

      10.1246/cl.150773

    • NAID

      130005108105

    • Related Report
      2015 Research-status Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Improving Memory Performance of Cu/HfO2/Pt Conducting-Bridge RAM by Solvent Substitution2015

    • Author(s)
      K. Kinoshita
    • Journal Title

      ECS Transactions

      Volume: 69 Pages: 11-17

    • Related Report
      2015 Research-status Report
    • Peer Reviewed
  • [Journal Article] Enhanced stability of the HfO2 electrolyte and reduced working voltage of a CB-RAM by an ionic liquid2015

    • Author(s)
      A. Harada, H. Yamaoka, R. Ogata, K. Watanabe, K. Kinoshita, S. Kishida, T. Nokami and T. Itoh
    • Journal Title

      Journal of Materials Chemistry C

      Volume: 3 Issue: 27 Pages: 6966-6969

    • DOI

      10.1039/c5tc01127b

    • Related Report
      2015 Research-status Report
    • Peer Reviewed
  • [Presentation] イオン液体で実現する高性能抵抗可変型メモリ(CB-RAM)2018

    • Author(s)
      伊藤敏幸, 野上敏材, 早瀬修一, 木下健太郎
    • Organizer
      日本化学会第98春季年会
    • Related Report
      2017 Annual Research Report
  • [Presentation] CB-RAM用イオン液体の開発2017

    • Author(s)
      山岡弘貴、阪口敦、山下拓哉、木下健太郎、岸田悟、伊藤敏幸
    • Organizer
      日本化学会第97春季年会 講演番号3E4-46
    • Place of Presentation
      神奈川県横浜市慶應義塾大学日吉キャンパス
    • Year and Date
      2017-03-16
    • Related Report
      2016 Research-status Report
  • [Presentation] Cu含有PEGイオン液体による抵抗可変型メモリの機能向上2017

    • Author(s)
      山下拓哉, 山岡弘貴, 原田晃典, 阪口敦, 木下健太郎, 岸田悟, 早瀬修一, 野上敏材, 伊藤敏幸
    • Organizer
      第44回有機典型元素化学討論会
    • Related Report
      2017 Annual Research Report
  • [Presentation] 導電性ブリッジメモリにおける金属イオン添加イオン液体供給の影響2016

    • Author(s)
      阪口 敦, 山岡 弘貴, 伊藤 敏幸, 岸田 悟, 木下 健太郎
    • Organizer
      第77回応用物理学会秋季学術講演会 講演番号13a-A31-11
    • Place of Presentation
      新潟県新潟市朱鷺メッセ
    • Year and Date
      2016-09-13
    • Related Report
      2016 Research-status Report
  • [Presentation] イオン液体添加による導電性ブリッジメモリの性能と信頼性の向上2015

    • Author(s)
      阪口敦,渡邉浩平,原田晃典, 山岡弘貴, 伊藤敏幸, 岸田悟, 木下健太郎
    • Organizer
      2015年真空・表面科学合同講演会
    • Place of Presentation
      つくば国際会議場, つくば, 日本
    • Year and Date
      2015-11-30
    • Related Report
      2015 Research-status Report
  • [Presentation] Improving Memory Performance of Cu/HfO2/Pt Conducting-Bridge RAM by Solvent Substitution2015

    • Author(s)
      Kentaro Kinoshita
    • Organizer
      The 228th ECS meeting
    • Place of Presentation
      Phoenix Convention Center, Phoenix, Arizona, USA
    • Year and Date
      2015-10-11
    • Related Report
      2015 Research-status Report
    • Int'l Joint Research / Invited
  • [Book] 「応用物理」学会誌第85巻第2号2016

    • Author(s)
      木下健太郎
    • Total Pages
      5
    • Publisher
      応用物理学会
    • Related Report
      2015 Research-status Report

URL: 

Published: 2015-04-16   Modified: 2019-12-27  

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