| Project/Area Number |
15K13340
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Applied materials
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| Research Institution | Hiroshima University |
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Principal Investigator |
Sawada Masahiro 広島大学, 放射光科学研究センター, 准教授 (00335697)
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| Research Collaborator |
SOKOLOV Nikolai Ioffe Physical Technical Institute, Russian Academy of Sciences
SUTURIN Sergey Ioffe Physical Technical Institute, Russian Academy of Sciences
KAVEEV Andrey Ioffe Physical Technical Institute, Russian Academy of Sciences
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| Project Period (FY) |
2015-04-01 – 2018-03-31
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| Project Status |
Completed (Fiscal Year 2017)
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| Budget Amount *help |
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2017: ¥390,000 (Direct Cost: ¥300,000、Indirect Cost: ¥90,000)
Fiscal Year 2016: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2015: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
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| Keywords | 軟X線 / 吸収分光 / 反射率測定 / 軟X線分光 / 軟X線吸収磁気円二色性 |
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| Outline of Final Research Achievements |
In this project, we have developed a breakthrough instrument for soft X-ray spectroscopies under an ambient environment and low-vacuum condition. Concurrently with the development, practical-oriented types of magnetic thin films and nanostructures have been fabricated and investigated, whose structures are promising candidates for novel devices. The final goal of the project is to achieve operando spectroscopies in an ambient environment for the device-related magnetic nanostructures at a soft X-ray synchrotron beamline. Firstly, we established methodology to introduce soft X-ray beams into low-vacuum or atmospheric pressure environment from a ultra-high vacuum chamber of the beamline. Consecutively, we designed and manufactured a prototype of reflectometer for a measurement of soft X-ray resonant reflectivity, based on a preliminary optical simulation to realize the spectroscopic measurements by means of photon detection method in a low-vacuum chamber at the end of beamline.
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