Real time measurements of atomic insulator surface structure using low energy atom scattering spectroscopy
| Project/Area Number |
15K13365
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Osaka Prefecture University |
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Principal Investigator |
Umezawa Kenji 大阪府立大学, 公私立大学の部局等, 教授 (80213487)
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| Project Period (FY) |
2015-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2016: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2015: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
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| Keywords | 低速原子散乱 / 絶縁体 / 表面構造 / 原子散乱 / 表面 |
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| Outline of Final Research Achievements |
We thus have been developed low energy atom scattering spectroscopy (less than 5 keV) for the analysis of insulator surfaces. Low energy atom particle beams were projected onto the sample surfaces to avoid charging effects. In this research, we have been developed the manipulator for insulator samples. The developed one can be rotated for 360 degree in the azimuth angles. Thus, data can be collected for any particular angle to see "atomic structure" of insulator surfaces. So far it takes about 30 min. or more to see the image of insulator surfaces.
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Report
(3 results)
Research Products
(6 results)
