Surface melting of solid hydrogen studied by cryo-TOF-SIMS
| Project/Area Number |
15K13366
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | National Institute for Materials Science |
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Principal Investigator |
SUZUKI Taku 国立研究開発法人物質・材料研究機構, 光・電子材料ユニット, 主幹研究員 (60354354)
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| Project Period (FY) |
2015-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2015: ¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
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| Keywords | 表面相転移 / ２次イオン質量分析 / 水素 / 表面融解 |
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| Outline of Final Research Achievements |
The cryostat was developed on the basis of a GM refrigerator to investigate the surface melting of a solid hydrogen (H2) film by time-of-flight secondary ion mass spectrometry (TOF-SIMS). As a result of those development, a new sample cooling manipulator was successfully developed, by which a sample can be flashed for surface cleaning in UHV. The newly developed sample manipulator was used in temperature programmed TOF-SIMS measurements on a solid hydrogen film. We found that the remarkable variation of the secondary ion emission occurs due to the re-crystallization and the melting on the topmost surface. Thus, TOF-SIMS may be applied to analyze the phase transition on solid surfaces.
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Report
(2 results)
Research Products
(25 results)
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[Journal Article] Depth profiling analysis of solar wind helium collected in diamond-like carbon film from <i>Genesis</i>2015
Author(s)
Bajo, K., Olinger, C. T., Jurewicz, A. J. G., Burnett, D. S., Sakaguchi, I., Suzuki, T., Itose, S., Ishihara, M., Uchino, K., Wieler, R. and Yurimoto, H.
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Journal Title
GEOCHEMICAL JOURNAL
Volume: 49
Issue: 5
Pages: 559-566
DOI
NAID
ISSN
0016-7002, 1880-5973
Year and Date
2015-09-30
Related Report
Peer Reviewed / Open Access / Int'l Joint Research / Acknowledgement Compliant
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[Presentation] 二次元光電子分光による，WドープZnO半導体の表面構造解析2016
Author(s)
深見駿, 鈴木拓, 安達裕, 渡邉賢, 坂口勲, 田口宗孝, 辻川大地, 吉田泰輔, 橋本雄介, 李美希, 室隆桂之, 松下智裕, 松井文彦, 大門寛
Organizer
日本物理学会 第71回年次大会
Place of Presentation
東北学院大学
Year and Date
2016-03-19
Related Report
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[Presentation] 二次元光電子回折法によるWドープZnO単結晶薄膜の表面終端構造解明2016
Author(s)
深見駿, 鈴木拓, 安達裕, 坂口勲, 渡邉賢, 橋本由介, 岡本隆志, 田中一光, 米田允俊, 太田紘志, 嶽太輔, 吉田喜紀, 室隆桂之, 松下智裕, 田口宗孝, 松井文彦, 大門寛
Organizer
3D活性サイト科学成果報告会
Place of Presentation
名古屋工業大学
Year and Date
2016-03-07
Related Report
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[Presentation] 酸化亜鉛薄膜のガスセンサ特性2015
Author(s)
安達裕, 渡邉賢, 齋藤紀子, 鈴木拓, 坂口勲, 大橋直樹
Organizer
第76回応用物理学会秋季学術講演会
Place of Presentation
名古屋国際会議場
Year and Date
2015-09-13
Related Report
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[Presentation] Measurement for a regolith particle recovered from asteroid Itokawa by Sputtered Neutral Mass Spectrometry with tunneling ionization2015
Author(s)
K. Bajo, I. Sakaguchi, T. Suzuki, S. Itose, M. Mtsuya, M. Ishihara, K. Uchino, M. Kudo, K. Nagao, Y. Seto, H. Yurimoto
Organizer
SISS-17
Place of Presentation
成蹊大学
Year and Date
2015-06-25
Related Report
Int'l Joint Research
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