| Project/Area Number |
15K13382
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Optical engineering, Photon science
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| Research Institution | Osaka University |
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Principal Investigator |
Li Yanjun 大阪大学, 工学研究科, 准教授 (50379137)
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| Project Period (FY) |
2015-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2016: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2015: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
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| Keywords | near-field / optical microscopy / imaging / AFM / 近接場光学顕微鏡 / 超高感度化 / 超高分解能化 |
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| Outline of Final Research Achievements |
In this study, our purpose is to realize the high sensitive and high resolution optical imaging with near-field scanning optical microscopy using photon-induced force detection, and to elucidate mechanism of the imaging with atomic resolution. As a result, we demonstrated atomic resolution imaging of the near-field on the α-Al2O3 (0001) surface of a prism. The surface aluminum atoms were imaged as bright spots. We investigated the spatial distribution of the near-field by scanning at different tip-sample distances and found that the atomic corrugation of the near-field signal was observed at greater distances than that of the atomic force microscopy signal. This result suggests that the optical image is imaged by a change of the polarizability for the electric field of the surface atom.
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