| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2017: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2016: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2015: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
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| Outline of Final Research Achievements |
By virtue of its potential energy, the implantation event of single ion can be detected with 100% probability if a highly charged ion (HCI) is injected into a surface. In the present study, utilizing the unique property of HCI for single ion implantation technique (SII), we set the objective for realization of technique to inject single ion with high reliability and accuracy, and to produce quantum bit using ion beam technology. As the first step of the research, we developed a new positioning system of HCI injection on a surface, which makes it possible to perform ion injection and observation of scanning tunneling microscopy in an identical vacuum system.
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