Development of flat panel detector for next-generation double beta decay experiment
| Project/Area Number |
15K13484
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Particle/Nuclear/Cosmic ray/Astro physics
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| Research Institution | Osaka University |
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Principal Investigator |
Shima Tatsushi 大阪大学, 核物理研究センター, 准教授 (10222035)
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| Co-Investigator(Renkei-kenkyūsha) |
HOTTA Tomoaki 大阪大学, 核物理研究センター, 助教 (30332745)
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| Research Collaborator |
SATO Kenji 株式会社島津製作所, 基盤技術研究所, 主任研究員(課長)
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| Project Period (FY) |
2015-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥3,640,000 (Direct Cost: ¥2,800,000、Indirect Cost: ¥840,000)
Fiscal Year 2016: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2015: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
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| Keywords | 二重ベータ崩壊 / フラットパネルディテクタ / アモルファスセレン / ニュートリノ |
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| Outline of Final Research Achievements |
Flat panel detectors (FPDs) for the digital X-ray radiography contain amorphous selenium (A-Se) as active layers, and therefore they will be useful to perform next-generation experiments on the double-beta decay of 82Se.
In usual FPDs, a glass layer for supporting an A-Se layer is insensitive to radiations, and is not useful to measure the total electron energy in the double beta decay events. We are planning to replace a glass layer with a silicon solid state detector (SSD). To avoid the damage to SSD, we developed a method for A-Se production by low-temperature chemical processing instead of the evaporation method. It was found the A-Se layer produced via this method has a better purity and a lower leak current than the one used in commercially available FPDs. The present result confirmed the feasibility of FPD as a main component of the next-generation double beta decay detectors.
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Report
(3 results)
Research Products
(6 results)
