Study of field emission under extremely low bias
| Project/Area Number |
15K13504
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Condensed matter physics I
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| Research Institution | Kyushu University |
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Principal Investigator |
Mizuno Seigi 九州大学, 総合理工学研究院, 教授 (60229705)
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| Co-Investigator(Kenkyū-buntansha) |
六田 英治 名城大学, 理工学部, 教授 (80298166)
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| Project Period (FY) |
2015-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2016: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2015: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
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| Keywords | 電界電子放出 / タングステン針 / 電界誘起ガスエッチング / 電界イオン顕微鏡 / 表面構造解析 / 低速電子回折 / 電界放出 |
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| Outline of Final Research Achievements |
Extremely low-bias field emissions were studied using a <110>-oriented tungsten tip. The tip apex was sharpened using field-assisted oxygen etching. The emission pattern shows a sharp spot at the liquid N2 temperature, which changes to a ring shape at room temperature. This is a reversible change based on the temperature. It is difficult to explain such a phenomenon through simple field emissions; however, exoelectron emission or charging of ceramic parts may be able to explain it. Besides the extremely low-bias field emissions, the method of producing low-bias field emissions with a small opening angle (less than 5°) have been established reproducibly.
The surface structure of the LaB6(100) single crystal was determined using low-energy electron diffraction analysis. The distance between the topmost La atom and second layer B atom was contracted by 30 pm. The surface structures of the SiC and Cu substrates were also investigated.
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Report
(3 results)
Research Products
(27 results)
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[Presentation] 六ホウ化ランタン(100)面の原子構造解析2016
Author(s)
高村 優, 倉地 由季, 久保 直也、浅井 泰尊, 村田 英一, 六田 英治, 中川 剛志, 水野 清義, 大谷 茂樹
Organizer
第77回応用物理学会秋季学術講演会
Place of Presentation
新潟市朱鷺メッセ
Year and Date
2016-09-13
Related Report
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