First sharp diffraction mapping for oxide glasses
| Project/Area Number |
15K14116
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Inorganic materials/Physical properties
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| Research Institution | Tohoku University |
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Principal Investigator |
Hirata Akihiko 東北大学, 原子分子材料科学高等研究機構, 准教授 (90350488)
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| Project Period (FY) |
2015-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2016: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2015: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
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| Keywords | ガラス / 局所構造 / 電子顕微鏡 / 電子回折 / 解析・評価 / 回折 |
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| Outline of Final Research Achievements |
We applied our angstrom-beam electron diffraction technique to oxide glasses or amorphous oxides and then characterized medium-range order structures based on so-called first sharp diffraction peaks. Consequently, we successfully obtained spatially-separated local structural information from the glassy samples. For amorphous SiO, we unveiled details of the disproportionated structure by constructing a model based on local structural information.
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Report
(3 results)
Research Products
(4 results)
